Arama Sonu&ccedil;lar&#305; Statistische methoden. - Daralt&#305;lm&#305;&#351;: &Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dStatistische$002bmethoden.$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253AONLINE$002509$0025C3$002587evrimi$0025C3$0025A7i$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-28T17:18:19Z Kreditrisikomessung Statistische Grundlagen, Methoden und Modellierung ent://SD_ILS/0/SD_ILS:183197 2024-11-28T17:18:19Z 2024-11-28T17:18:19Z Yazar&#160;Henking, Andreas. author.&#160;Bluhm, Christian. author.&#160;Fahrmeir, Ludwig. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-32146-2">http://dx.doi.org/10.1007/3-540-32146-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Beschreibung und Analyse unscharfer Information Statistische Methoden f&uuml;r unscharfe Daten ent://SD_ILS/0/SD_ILS:176901 2024-11-28T17:18:19Z 2024-11-28T17:18:19Z Yazar&#160;Viertl, Reinhard K. W. author.&#160;Hareter, Dietmar. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-211-32347-3">http://dx.doi.org/10.1007/3-211-32347-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistische Methoden zur Qualit&auml;tssicherung und -optimierung in der Industrie ent://SD_ILS/0/SD_ILS:300627 2024-11-28T17:18:19Z 2024-11-28T17:18:19Z Yazar&#160;Weihs, Claus.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527611287">http://dx.doi.org/10.1002/9783527611287</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Learning from data concepts, theory, and methods ent://SD_ILS/0/SD_ILS:249774 2024-11-28T17:18:19Z 2024-11-28T17:18:19Z Yazar&#160;Cherkassky, Vladimir S.&#160;Mulier, Filip.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201503">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201503</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survey measurement and process quality ent://SD_ILS/0/SD_ILS:300371 2024-11-28T17:18:19Z 2024-11-28T17:18:19Z Yazar&#160;Lyberg, Lars.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ebrary <a href="http://site.ebrary.com/id/10595389">http://site.ebrary.com/id/10595389</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118490013">http://dx.doi.org/10.1002/9781118490013</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/35627703.html">http://catalog.hathitrust.org/api/volumes/oclc/35627703.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>