Arama Sonuçları Surfaces - Daraltılmış: Particles (Nuclear physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSurfaces$0026qf$003dSUBJECT$002509Konu$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026ps$003d300?
2024-11-17T04:39:33Z
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:188564
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. author. Fuchs, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-ray and Neutron Reflectivity Principles and Applications
ent://SD_ILS/0/SD_ILS:189083
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Daillant, Jean. editor. Gibaud, Alain. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-88588-7">http://dx.doi.org/10.1007/978-3-540-88588-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mikro- und Nanoskopie der Werkstoffe
ent://SD_ILS/0/SD_ILS:189368
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hornbogen, Erhard. author. Skrotzki, Birgit. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-89946-4">http://dx.doi.org/10.1007/978-3-540-89946-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface and Interface Analysis An Electrochemists Toolbox
ent://SD_ILS/0/SD_ILS:185266
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Holze, Rudolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:186997
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods X Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:187052
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Tomitori, Masahiko. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Laser Spectroscopy Vol. 1 Basic Principles
ent://SD_ILS/0/SD_ILS:186844
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Demtröder, Wolfgang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73418-5">http://dx.doi.org/10.1007/978-3-540-73418-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:187050
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. Tomitori, Masahiko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IX Characterization
ent://SD_ILS/0/SD_ILS:187051
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Tomitori, Masahiko. editor. Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Laser Spectroscopy Vol. 2 Experimental Techniques
ent://SD_ILS/0/SD_ILS:187317
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Demtröder, Wolfgang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-74954-7">http://dx.doi.org/10.1007/978-3-540-74954-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
ent://SD_ILS/0/SD_ILS:165900
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Light Scattering in Solid IX
ent://SD_ILS/0/SD_ILS:184056
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Cardona, Manuel. editor. Merlin, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b14231">http://dx.doi.org/10.1007/b14231</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of Nanoscale Film Analysis
ent://SD_ILS/0/SD_ILS:165623
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VI Characterization
ent://SD_ILS/0/SD_ILS:184524
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11776314">http://dx.doi.org/10.1007/11776314</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Very High Resolution Photoelectron Spectroscopy
ent://SD_ILS/0/SD_ILS:185367
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hüfner, Stefan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-68133-7">http://dx.doi.org/10.1007/3-540-68133-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Planewaves, Pseudopotentials and the LAPW Method
ent://SD_ILS/0/SD_ILS:165667
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Singh, David J. author. Nordström, Lars. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Applied Solid State Spectroscopy
ent://SD_ILS/0/SD_ILS:166204
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Vij, D. R. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37590-2">http://dx.doi.org/10.1007/0-387-37590-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Neutron and X-ray Spectroscopy
ent://SD_ILS/0/SD_ILS:168875
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hippert, Françoise. editor. Geissler, Erik. editor. Hodeau, Jean Louis. editor. Lelièvre-Berna, Eddy. editor. Regnard, Jean-René. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3337-0">http://dx.doi.org/10.1007/1-4020-3337-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration
ent://SD_ILS/0/SD_ILS:165572
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Laconte, J. author. Flandre, D. author. Raskin, J. -P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid State NMR Spectroscopy for Biopolymers Principles and Applications
ent://SD_ILS/0/SD_ILS:169139
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Saitô, Hazime. author. Ando, Isao. author. Naito, Akira. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-4303-1">http://dx.doi.org/10.1007/1-4020-4303-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface-Enhanced Raman Scattering Physics and Applications
ent://SD_ILS/0/SD_ILS:183772
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Kneipp, Katrin. editor. Moskovits, Martin. editor. Kneipp, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metalle Struktur und Eigenschaften der Metalle und Legierungen
ent://SD_ILS/0/SD_ILS:183904
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hornbogen, Erhard. author. Warlimont, Hans. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-34011-4">http://dx.doi.org/10.1007/3-540-34011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Practical X-Ray Fluorescence Analysis
ent://SD_ILS/0/SD_ILS:184419
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Beckhoff, Burkhard. editor. Kanngießer, habil. Birgit. editor. Langhoff, Norbert. editor. Wedell, Reiner. editor. Wolff, Helmut. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Materials for Information Technology Devices, Interconnects and Packaging
ent://SD_ILS/0/SD_ILS:175333
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Zschech, Ehrenfried. editor. Whelan, Caroline. editor. Mikolajick, Thomas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Spectroscopic Properties of Rare Earths in Optical Materials
ent://SD_ILS/0/SD_ILS:181676
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Hull, Robert. editor. Parisi, Jürgen. editor. Osgood, R. M. editor. Warlimont, Hans. editor. Liu, Guokui. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-28209-2">http://dx.doi.org/10.1007/3-540-28209-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice
ent://SD_ILS/0/SD_ILS:164892
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Giannuzzi, Lucille A. editor. Stevie, Fred A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b101190">http://dx.doi.org/10.1007/b101190</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Thin Films and Heterostructures for Oxide Electronics
ent://SD_ILS/0/SD_ILS:165225
2024-11-17T04:39:33Z
2024-11-17T04:39:33Z
Yazar Ogale, Satischandra B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>