Arama Sonuçları Surfaces (Physics). - Daraltılmış: Microscopy.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSurfaces$002b$002528Physics$002529.$0026qf$003dSUBJECT$002509Konu$002509Microscopy.$002509Microscopy.$0026ps$003d300?
2024-11-02T09:28:52Z
Radiometry in Modern Scientific Experiments
ent://SD_ILS/0/SD_ILS:197693
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2024-11-02T09:28:52Z
Yazar Pravilov, A. M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pharmaceutical Microscopy
ent://SD_ILS/0/SD_ILS:173165
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Carlton, Robert Allen. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Coherent Light Microscopy Imaging and Quantitative Phase Analysis
ent://SD_ILS/0/SD_ILS:193093
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Techniques
ent://SD_ILS/0/SD_ILS:172475
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Methodology
ent://SD_ILS/0/SD_ILS:168096
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ent://SD_ILS/0/SD_ILS:167790
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
ent://SD_ILS/0/SD_ILS:165534
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Science of Microscopy
ent://SD_ILS/0/SD_ILS:166500
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
ent://SD_ILS/0/SD_ILS:166196
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electron Tomography Methods for Three-Dimensional Visualization of Structures in the Cell
ent://SD_ILS/0/SD_ILS:166679
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Frank, Joachim. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-69008-7">http://dx.doi.org/10.1007/978-0-387-69008-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
ent://SD_ILS/0/SD_ILS:165220
2024-11-02T09:28:52Z
2024-11-02T09:28:52Z
Yazar Egerton, Ray F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>