Arama Sonuçları Surfaces. - Daraltılmış: Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSurfaces.$0026qf$003dSUBJECT$002509Konu$002509Microscopy.$002509Microscopy.$0026ps$003d300?2024-12-02T02:09:54ZRadiometry in Modern Scientific Experimentsent://SD_ILS/0/SD_ILS:1976932024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Pravilov, A. M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-7091-0104-9">http://dx.doi.org/10.1007/978-3-7091-0104-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The image processing handbookent://SD_ILS/0/SD_ILS:2915562024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Russ, John C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439840634">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pharmaceutical Microscopyent://SD_ILS/0/SD_ILS:1731652024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Carlton, Robert Allen. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8831-7">http://dx.doi.org/10.1007/978-1-4419-8831-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coherent Light Microscopy Imaging and Quantitative Phase Analysisent://SD_ILS/0/SD_ILS:1930932024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Ferraro, Pietro. editor. Wax, Adam. editor. Zalevsky, Zeev. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15813-1">http://dx.doi.org/10.1007/978-3-642-15813-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Methodologyent://SD_ILS/0/SD_ILS:1680962024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Techniquesent://SD_ILS/0/SD_ILS:1724752024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisent://SD_ILS/0/SD_ILS:1677902024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:1665002024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscaleent://SD_ILS/0/SD_ILS:1655342024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Kalinin, Sergei. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currentsent://SD_ILS/0/SD_ILS:1661962024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electron Tomography Methods for Three-Dimensional Visualization of Structures in the Cellent://SD_ILS/0/SD_ILS:1666792024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Frank, Joachim. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-69008-7">http://dx.doi.org/10.1007/978-0-387-69008-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-12-02T02:09:54Z2024-12-02T02:09:54ZYazar Egerton, Ray F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>