Arama Sonuçları System engineering. - Daraltılmış: System failures (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem$002bengineering.$0026qf$003dSUBJECT$002509Konu$002509System$002bfailures$002b$002528Engineering$002529$002509System$002bfailures$002b$002528Engineering$002529$0026ps$003d300?2025-12-25T15:25:21ZThe Field Guide to Understanding 'Human Error'ent://SD_ILS/0/SD_ILS:5405172025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Dekker, Sidney.<br/>Yer Numarası TA169.5 .D45 2014<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781317031840">https://www.taylorfrancis.com/books/e/9781317031840</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781315558172">https://www.taylorfrancis.com/books/e/9781315558172</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315558172">https://www.taylorfrancis.com/books/9781315558172</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Yer Numarası ONLINE(355485.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>PEM fuel cell failure mode analysisent://SD_ILS/0/SD_ILS:5427762025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Wang, Haijiang Henry. Li, Hui, 1964- Yuan, Xiao-Zi.<br/>Yer Numarası TK2933 .P76 P465 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439839188">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:3057212025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Todinov, M. T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:5409782025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Sachs, Neville W., author.<br/>Yer Numarası TJ153 .S164 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420020007">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:5453092025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Tawancy, Hani M., author. Abbas, Nureddin Mohamed. Ul-Hamid, Anwar.<br/>Yer Numarası TA169.5 .T39 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Investigation of aeronautical and engineering component failuresent://SD_ILS/0/SD_ILS:5392522025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Reddy, A. Venugopal., author.<br/>Yer Numarası TL672 .R44 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781136968525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Root cause failure analysisent://SD_ILS/0/SD_ILS:1537712025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Mobley, R. Keith, 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671583">http://www.sciencedirect.com/science/book/9780750671583</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:2563092025-12-25T15:25:21Z2025-12-25T15:25:21ZYazar Ohring, Milton, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>