Arama Sonu&ccedil;lar&#305; System failures (Engineering) - Daralt&#305;lm&#305;&#351;: English SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem$002bfailures$002b$002528Engineering$002529$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ps$003d300?dt=list 2025-12-08T11:54:58Z The Field Guide to Understanding 'Human Error' ent://SD_ILS/0/SD_ILS:540517 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Dekker, Sidney.<br/>Yer Numaras&#305;&#160;TA169.5 .D45 2014<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781317031840">https://www.taylorfrancis.com/books/e/9781317031840</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781315558172">https://www.taylorfrancis.com/books/e/9781315558172</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315558172">https://www.taylorfrancis.com/books/9781315558172</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:355485 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Ohring, Milton, 1936-&#160;Kasprzak, Lucian.<br/>Yer Numaras&#305;&#160;ONLINE(355485.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IAENG transactions on engineering sciences : special issue of the International Multiconference of Engineers and Computer Scientists 2013 and World Congress on Engineering 2013 ent://SD_ILS/0/SD_ILS:539361 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;International Multi-Conference of Engineers and Computer Scientists (2013). author.&#160;Ao, Sio-Iong, editor.&#160;Chan, Alan Hoi-Shou, editor.&#160;Katagiri, Hideki, editor.&#160;Xu, Li D., editor.<br/>Yer Numaras&#305;&#160;TA5 .I58 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315761817">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Systems engineering and safety : building the bridge ent://SD_ILS/0/SD_ILS:539717 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Glismann, Peter J., author.<br/>Yer Numaras&#305;&#160;TA169 .G54 2013<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781466552135">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> PEM fuel cell failure mode analysis ent://SD_ILS/0/SD_ILS:542776 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Wang, Haijiang Henry.&#160;Li, Hui, 1964-&#160;Yuan, Xiao-Zi.<br/>Yer Numaras&#305;&#160;TK2933 .P76 P465 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781439839188">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Machine learning and knowledge discovery for engineering systems health management ent://SD_ILS/0/SD_ILS:545090 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Srivastava, Ashok N. 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I. 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T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliability ent://SD_ILS/0/SD_ILS:540978 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Sachs, Neville W., author.<br/>Yer Numaras&#305;&#160;TJ153 .S164 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420020007">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wood Pole Overhead Lines ent://SD_ILS/0/SD_ILS:247909 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Wareing, Brian<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBPO048E">http://dx.doi.org/10.1049/PBPO048E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Investigation of aeronautical and engineering component failures ent://SD_ILS/0/SD_ILS:539252 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Reddy, A. 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Lee, 1949, author.<br/>Yer Numaras&#305;&#160;TK3091 .W55 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420030310">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical engineering failure analysis ent://SD_ILS/0/SD_ILS:545309 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Tawancy, Hani M., author.&#160;Abbas, Nureddin Mohamed.&#160;Ul-Hamid, Anwar.<br/>Yer Numaras&#305;&#160;TA169.5 .T39 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Root cause failure analysis ent://SD_ILS/0/SD_ILS:153771 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Mobley, R. Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671583">http://www.sciencedirect.com/science/book/9780750671583</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:256309 2025-12-08T11:54:58Z 2025-12-08T11:54:58Z Yazar&#160;Ohring, Milton, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>