Arama Sonuçları System failures (Engineering) - Daraltılmış: CRC EkitaplarıSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem$002bfailures$002b$002528Engineering$002529$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ACRCEBOOKS$002509CRC$002bEkitaplar$0025C4$0025B1$0026ic$003dtrue$0026ps$003d300?2025-12-09T11:03:20ZThe Field Guide to Understanding 'Human Error'ent://SD_ILS/0/SD_ILS:5405172025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Dekker, Sidney.<br/>Yer Numarası TA169.5 .D45 2014<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781317031840">https://www.taylorfrancis.com/books/e/9781317031840</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781315558172">https://www.taylorfrancis.com/books/e/9781315558172</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315558172">https://www.taylorfrancis.com/books/9781315558172</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IAENG transactions on engineering sciences : special issue of the International Multiconference of Engineers and Computer Scientists 2013 and World Congress on Engineering 2013ent://SD_ILS/0/SD_ILS:5393612025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar International Multi-Conference of Engineers and Computer Scientists (2013). author. Ao, Sio-Iong, editor. Chan, Alan Hoi-Shou, editor. Katagiri, Hideki, editor. Xu, Li D., editor.<br/>Yer Numarası TA5 .I58 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315761817">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Systems engineering and safety : building the bridgeent://SD_ILS/0/SD_ILS:5397172025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Glismann, Peter J., author.<br/>Yer Numarası TA169 .G54 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466552135">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>PEM fuel cell failure mode analysisent://SD_ILS/0/SD_ILS:5427762025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Wang, Haijiang Henry. Li, Hui, 1964- Yuan, Xiao-Zi.<br/>Yer Numarası TK2933 .P76 P465 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439839188">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Machine learning and knowledge discovery for engineering systems health managementent://SD_ILS/0/SD_ILS:5450902025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Srivastava, Ashok N. (Ashok Narain), 1969- Han, Jiawei.<br/>Yer Numarası TA169.5 .M33 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439841792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical models for systems reliabilityent://SD_ILS/0/SD_ILS:5389052025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Epstein, Benjamin, 1918, author. Weissman, Ishay, 1940-<br/>Yer Numarası TA169 .E67 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:5409782025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Sachs, Neville W., author.<br/>Yer Numarası TJ153 .S164 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420020007">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Investigation of aeronautical and engineering component failuresent://SD_ILS/0/SD_ILS:5392522025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Reddy, A. Venugopal., author.<br/>Yer Numarası TL672 .R44 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781136968525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Power distribution planning reference bookent://SD_ILS/0/SD_ILS:5419572025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Willis, H. Lee, 1949, author.<br/>Yer Numarası TK3091 .W55 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420030310">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:5453092025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Tawancy, Hani M., author. Abbas, Nureddin Mohamed. Ul-Hamid, Anwar.<br/>Yer Numarası TA169.5 .T39 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design reliability : fundamentals and applicationsent://SD_ILS/0/SD_ILS:5405722025-12-09T11:03:20Z2025-12-09T11:03:20ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası TA174 .D4929 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>