Arama Sonu&ccedil;lar&#305; System failures (Engineering) - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem$002bfailures$002b$002528Engineering$002529$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300? 2025-12-09T06:58:10Z Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:355485 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Ohring, Milton, 1936-&#160;Kasprzak, Lucian.<br/>Yer Numaras&#305;&#160;ONLINE(355485.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability technology principles and practice of failure prevention in electronic systems ent://SD_ILS/0/SD_ILS:298817 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Pascoe, Norman.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Failure analysis a practical guide for manufacturers of electronic components and systems ent://SD_ILS/0/SD_ILS:305690 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;B&acirc;zu, M. I. (Marius I.), 1948-&#160;B&#259;jenescu, Titu I., 1938-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Spacecraft reliability and multi-state failures a statistical approach ent://SD_ILS/0/SD_ILS:305721 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Saleh, Joseph H., 1971-&#160;Castet, Jean-Fran&ccedil;ois.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Verification, validation, and testing of engineered systems ent://SD_ILS/0/SD_ILS:298010 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Engel, Avner.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35180">http://www.books24x7.com/marc.asp?bookid=35180</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470618851">http://dx.doi.org/10.1002/9780470618851</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470618851">http://onlinelibrary.wiley.com/book/10.1002/9780470618851</a> <a href="http://proquest.safaribooksonline.com/?fpi=9781118029312">http://proquest.safaribooksonline.com/?fpi=9781118029312</a> <a href="http://proquest.safaribooksonline.com/9781118029312">http://proquest.safaribooksonline.com/9781118029312</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk-based reliability analysis and generic principles for risk reduction ent://SD_ILS/0/SD_ILS:148956 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Todinov, M. T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Wood Pole Overhead Lines ent://SD_ILS/0/SD_ILS:247909 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Wareing, Brian<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBPO048E">http://dx.doi.org/10.1049/PBPO048E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Root cause failure analysis ent://SD_ILS/0/SD_ILS:153771 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Mobley, R. Keith, 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671583">http://www.sciencedirect.com/science/book/9780750671583</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and failure of electronic materials and devices ent://SD_ILS/0/SD_ILS:256309 2025-12-09T06:58:10Z 2025-12-09T06:58:10Z Yazar&#160;Ohring, Milton, 1936-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>