Arama Sonu&ccedil;lar&#305; System safety. - Daralt&#305;lm&#305;&#351;: 2006 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem$002bsafety.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092006$0025092006$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-25T23:08:43Z Basic guide to system safety ent://SD_ILS/0/SD_ILS:301844 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Vincoli, Jeffrey W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471786454">http://dx.doi.org/10.1002/0471786454</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/61456555.html">http://catalog.hathitrust.org/api/volumes/oclc/61456555.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Assurance technologies principles and practices : a product, process, and system safety perspective ent://SD_ILS/0/SD_ILS:295628 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Raheja, Dev.&#160;Allocco, Michael.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a> John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied Semi-Markov Processes ent://SD_ILS/0/SD_ILS:165657 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Janssen, Jacques. author.&#160;Manca, Raimondo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-29548-8">http://dx.doi.org/10.1007/0-387-29548-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Writing Testbenches using System Verilog ent://SD_ILS/0/SD_ILS:165809 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Bergeron, Janick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-31275-7">http://dx.doi.org/10.1007/0-387-31275-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Six Sigma ent://SD_ILS/0/SD_ILS:165709 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Kumar, U Dinesh. author.&#160;Crocker, John. author.&#160;Chitra, T. author.&#160;Saranga, Haritha. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-30256-5">http://dx.doi.org/10.1007/0-387-30256-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Stochastic Ageing and Dependence for Reliability ent://SD_ILS/0/SD_ILS:166017 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Lai, Chin-Diew. author.&#160;Xie, Min. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-34232-X">http://dx.doi.org/10.1007/0-387-34232-X</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Challenging American Leadership Impact of National Quality on Risk of Losing Leadership ent://SD_ILS/0/SD_ILS:169311 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Frankel, Ernst Gabriel. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-4907-2">http://dx.doi.org/10.1007/1-4020-4907-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Countering Nuclear and Radiological Terrorism ent://SD_ILS/0/SD_ILS:169315 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Apikyan, Samuel. editor.&#160;Diamond, David, 1915-2005 editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-4921-8">http://dx.doi.org/10.1007/1-4020-4921-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Nuclear Imperative A Critical Look at the Approaching Energy Crisis ent://SD_ILS/0/SD_ILS:169319 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Eerkens, Jeff W. author.&#160;SpringerLink (Online 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editor.&#160;Kennedy, Jim. editor.&#160;Ma, Lin. editor.&#160;Tan, Andy. editor.&#160;Anderson, Deryk. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-814-2">http://dx.doi.org/10.1007/978-1-84628-814-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> MES &mdash; Manufacturing Execution System Moderne Informationstechnologie zur Prozessf&auml;higkeit der Wertsch&ouml;pfung ent://SD_ILS/0/SD_ILS:181621 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Kletti, J&uuml;rgen. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-28011-1">http://dx.doi.org/10.1007/3-540-28011-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Explosion-Resistant Buildings Design, Analysis, and Case Studies 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G. editor.&#160;Chen, C. S. editor.&#160;Fokuda, T. editor.&#160;Harashima, F. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-4078-4">http://dx.doi.org/10.1007/1-4020-4078-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Warranty Management and Product Manufacture ent://SD_ILS/0/SD_ILS:175346 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Murthy, D.N. Prabhakar. author.&#160;Blischke, Wallace R. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-84628-258-6">http://dx.doi.org/10.1007/1-84628-258-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Engineering Statistics ent://SD_ILS/0/SD_ILS:175362 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Pham, Hoang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-288-1">http://dx.doi.org/10.1007/978-1-84628-288-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Optimal Maintenance ent://SD_ILS/0/SD_ILS:175380 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Wang, Hongzhou. author.&#160;Pham, Hoang. author.&#160;SpringerLink (Online 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Yazar&#160;Osten, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-29303-5">http://dx.doi.org/10.1007/3-540-29303-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Materials Measurement Methods ent://SD_ILS/0/SD_ILS:182291 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30300-8">http://dx.doi.org/10.1007/978-3-540-30300-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault-Diagnosis Systems An Introduction from Fault Detection to Fault Tolerance ent://SD_ILS/0/SD_ILS:182311 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Isermann, Rolf. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-30368-5">http://dx.doi.org/10.1007/3-540-30368-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ecological Risks Associated with the Destruction of Chemical Weapons ent://SD_ILS/0/SD_ILS:168819 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z Yazar&#160;Kolodkin, Vladimir M. editor.&#160;Ruck, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-3137-8">http://dx.doi.org/10.1007/1-4020-3137-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Technique d&rsquo;&eacute;quilibrage Traduction de la 6e &eacute;dition allemande ent://SD_ILS/0/SD_ILS:176369 2024-11-25T23:08:43Z 2024-11-25T23:08:43Z 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