Arama Sonu&ccedil;lar&#305; System. - Daralt&#305;lm&#305;&#351;: Surfaces (Physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dSystem.$0026qf$003dSUBJECT$002509Konu$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300?dt=list 2024-12-22T17:44:18Z The Science of Solar System Ices ent://SD_ILS/0/SD_ILS:331315 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Gudipati, Murthy S. editor.&#160;Castillo-Rogez, Julie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331315.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3076-6">http://dx.doi.org/10.1007/978-1-4614-3076-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Units of Measurement Past, Present and Future. International System of Units ent://SD_ILS/0/SD_ILS:189790 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Gupta, S. V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-00738-5">http://dx.doi.org/10.1007/978-3-642-00738-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:330843 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Sabbagh, Harold A. author.&#160;Murphy, R. Kim. author.&#160;Sabbagh, Elias H. author.&#160;Aldrin, John C. author.&#160;Knopp, Jeremy S. author.<br/>Yer Numaras&#305;&#160;ONLINE(330843.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:332097 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332097.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems ent://SD_ILS/0/SD_ILS:333141 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Czichos, Horst. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333141.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25850-3">http://dx.doi.org/10.1007/978-3-642-25850-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of Mass Determination ent://SD_ILS/0/SD_ILS:191843 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Borys, Michael. author.&#160;Schwartz, Roman. author.&#160;Reichmuth, Arthur. author.&#160;Nater, Roland. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-11937-8">http://dx.doi.org/10.1007/978-3-642-11937-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Safety of VVER-440 Reactors Barriers Against Fission Products Release ent://SD_ILS/0/SD_ILS:176246 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Sluge&#328;, Vladim&iacute;r. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84996-420-3">http://dx.doi.org/10.1007/978-1-84996-420-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:193364 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials Proceedings of the IUTAM Symposium on Multiscale Modelling of Fatigue, Damage and Fracture in Smart Materials, held in Freiberg, Germany, September 1-4, 2009 ent://SD_ILS/0/SD_ILS:205621 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Kuna, Meinhard. editor.&#160;Ricoeur, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9887-0">http://dx.doi.org/10.1007/978-90-481-9887-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Towards Estimating Entrainment Fraction for Dust Layers ent://SD_ILS/0/SD_ILS:174242 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Ural, Erdem A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-3372-9">http://dx.doi.org/10.1007/978-1-4614-3372-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:172252 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-1456-9">http://dx.doi.org/10.1007/978-1-4419-1456-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:170410 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Merkus, Henk G. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Blast Cleaning Technology ent://SD_ILS/0/SD_ILS:186922 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Momber, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73645-5">http://dx.doi.org/10.1007/978-3-540-73645-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Metal Fatigue What It Is, Why It Matters ent://SD_ILS/0/SD_ILS:169533 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Pook, Les. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5597-3">http://dx.doi.org/10.1007/978-1-4020-5597-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Suhir, E. editor.&#160;Lee, Y. C. editor.&#160;Wong, C. P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Ultrasonic Nondestructive Evaluation Systems Models and Measurements ent://SD_ILS/0/SD_ILS:166454 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Schmerr, Lester W. author.&#160;Song, Sung-Jin. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49063-2">http://dx.doi.org/10.1007/978-0-387-49063-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Materials Measurement Methods ent://SD_ILS/0/SD_ILS:182291 2024-12-22T17:44:18Z 2024-12-22T17:44:18Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30300-8">http://dx.doi.org/10.1007/978-3-540-30300-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>