Arama Sonuçları Technology -- Methodology. - Daraltılmış: 2013SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTechnology$002b--$002bMethodology.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092013$0025092013$0026ps$003d300?dt=list2025-03-20T18:20:00ZBlasting in mining new trends : workshop hosted by Fragblast 10 : the 10th International Symposium on Rock Fragmentation by Blasting, New Delhi, India, 24-25 November, 2012ent://SD_ILS/0/SD_ILS:2854712025-03-20T18:20:00Z2025-03-20T18:20:00ZYazar Ghose, Ajoy K. Joshi, Akhilesh. Fragblast 10 International Symposium on Rock Fragmentation by Blasting (2012 : New Delhi, India)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203388068">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Official (ISC)[superscript 2] guide to the CAP CBKent://SD_ILS/0/SD_ILS:2880562025-03-20T18:20:00Z2025-03-20T18:20:00ZYazar Howard, Patrick D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439820766">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Strain-engineered MOSFETsent://SD_ILS/0/SD_ILS:2881472025-03-20T18:20:00Z2025-03-20T18:20:00ZYazar Maiti, C. K. Maiti, T. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466503472">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>