Arama Sonuçları Technology. - Daraltılmış: Fuchs, Harald. editor.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTechnology.$0026qf$003dAUTHOR$002509Yazar$002509Fuchs$00252C$002bHarald.$002beditor.$002509Fuchs$00252C$002bHarald.$002beditor.$0026te$003dILS$0026ps$003d300?
2024-09-11T05:43:24Z
Applied Scanning Probe Methods XII Characterization
ent://SD_ILS/0/SD_ILS:188565
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85039-7">http://dx.doi.org/10.1007/978-3-540-85039-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:188568
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:184523
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Kawata, Satoshi. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods VII Biomimetics and Industrial Applications
ent://SD_ILS/0/SD_ILS:184525
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11785705">http://dx.doi.org/10.1007/11785705</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods III Characterization
ent://SD_ILS/0/SD_ILS:181079
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods IV Industrial Applications
ent://SD_ILS/0/SD_ILS:181082
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
ent://SD_ILS/0/SD_ILS:181412
2024-09-11T05:43:24Z
2024-09-11T05:43:24Z
Yazar Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>