Arama Sonuçları Test. - Daraltılmış: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2025-12-31T11:40:44ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:5450382025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Walton, William Clarence., author.<br/>Yer Numarası GB1199 .W345 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042931">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:5386982025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Ilgenfritz, Merle., author. Ilgenfritz, John. Powell, John. Baca, Steven.<br/>Yer Numarası QA76.3 .I56 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420066005">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:5303292025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5372362025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5467662025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5391942025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420091175">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:5440312025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Gruijter, Dato N. de., author. Kamp, Leo J. Th. van der.<br/>Yer Numarası H61.25 .G78 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781584889595">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Oscillation-Based Test in Mixed-Signal Circuitsent://SD_ILS/0/SD_ILS:1694322025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5471942025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049831">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Well test analysis for fractured reservoir evaluationent://SD_ILS/0/SD_ILS:2554672025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Da Prat, Giovanni.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444886910">http://www.sciencedirect.com/science/book/9780444886910</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Test Attacks to Break Mobile and Embedded Devices.ent://SD_ILS/0/SD_ILS:5396352025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hagar, Jon Duncan, author. CRC Press LLC.<br/>Yer Numarası QA76.9 .A25 H343 2017<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429071911">https://www.taylorfrancis.com/books/9780429071911</a>
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R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 MCAT biology questions to know by test dayent://SD_ILS/0/SD_ILS:2940152025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Stewart, Robert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-biology-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 MCAT organic chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940162025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Moore, John T., 1947- Langley, Richard.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-organic-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's GRE Graduate Record Examination general testent://SD_ILS/0/SD_ILS:2940202025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Dulan, Steven W. Advantage Education (Firm)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-gre-2013-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's 500 MCAT general chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940122025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Moore, John T., 1947- Langley, Richard.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-general-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English literature questions to know by test dayent://SD_ILS/0/SD_ILS:2938352025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Miller, Shveta Verma.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Demeter, Scott E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP psychology questions to know by test dayent://SD_ILS/0/SD_ILS:2938512025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Williams, Lauren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-psychology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. 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J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Roman, Adam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Irwing, Frederick Paul, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Place and Health as Complex Systems A Case Study and Empirical Testent://SD_ILS/0/SD_ILS:5193872025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Castellani, Brian. author. Rajaram, Rajeev. author. Buckwalter, J. Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Critical mm-Wave Components for Synthetic Automatic Test Systemsent://SD_ILS/0/SD_ILS:5296442025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hrobak, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RILEM Technical Committee 195-DTD Recommendation for Test Methods for AD and TD of Early Age Concrete Round Robin Documentation Report: Program, Test Results and Statistical Evaluationent://SD_ILS/0/SD_ILS:5297902025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bjøntegaard, Øyvind. author. Martius-Hammer, Tor Arne. author. Krauss, Matias. author. Budelmann, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-017-9266-0">https://doi.org/10.1007/978-94-017-9266-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Larner, A.J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:5386682025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Yer Numarası QA76.9 .C65 S56 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482225501">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bates, Jan Wheeler. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Evaluation of Aircraft Avionics and Weapon Systemsent://SD_ILS/0/SD_ILS:3649292025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar McShea, Robert E.<br/>Yer Numarası \(364929.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA507E">http://dx.doi.org/10.1049/SBRA507E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICsent://SD_ILS/0/SD_ILS:4874052025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Psychiatric mental health nursing success a course review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2805972025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Curtis, Cathy Melfi. Fegley, Audra Baker. Tuzo, Carol Norton.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instant penetration testing setting up a test lab how-to : set up your own penetration testing lab using practical and precise recipesent://SD_ILS/0/SD_ILS:3130442025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Fadyushin, Vyacheslav.<br/>Yer Numarası ONLINE(313044.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Families of the missing a test for contemporary approaches to transitional justiceent://SD_ILS/0/SD_ILS:3445352025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Robins, Simon.<br/>Yer Numarası ONLINE(344535.1)<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203517079">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approachent://SD_ILS/0/SD_ILS:3309862025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333066.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15772-1">http://dx.doi.org/10.1007/978-3-642-15772-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Characteristics of Virtual Learning Environments A Theoretical Integration and Empirical Test of Technology Acceptance and IS Success Researchent://SD_ILS/0/SD_ILS:3352402025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Müller, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335240.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a 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href="http://dx.doi.org/10.1049/SBRA033E">http://dx.doi.org/10.1049/SBRA033E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test ride on the Sunnyland bus a daughter's civil rights journeyent://SD_ILS/0/SD_ILS:2463942025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Spagna, Ana Maria. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780803233928/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and test technology for dependable systems-on-chipent://SD_ILS/0/SD_ILS:2780432025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Ubar, Raimund, 1941- Raik, Jaan, 1972- Vierhaus, Heinrich Theodor, 1951-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154</a><br/>Format: Elektrnik 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editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologiesent://SD_ILS/0/SD_ILS:1721032025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nuclear Test Ban Converting Political Visions to Realityent://SD_ILS/0/SD_ILS:1699802025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Haak, Hein. author. Mykkeltveit, S. author. Dahlman, Ola. author. SpringerLink (Online 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P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126897500">http://www.sciencedirect.com/science/book/9780126897500</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The science of sound recordingent://SD_ILS/0/SD_ILS:2671032025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CE marking handbook a practical approach to global safety certificationent://SD_ILS/0/SD_ILS:2543652025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lohbeck, David, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750698191">http://www.sciencedirect.com/science/book/9780750698191</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's DATent://SD_ILS/0/SD_ILS:2940062025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Evangelist, Thomas A. Hanks, Wendy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-dat-cdrom">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's GMATent://SD_ILS/0/SD_ILS:2940422025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hasik, James. Rudnick, Stacey. Hackney, Ryan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-gmat-2011-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's CBESTent://SD_ILS/0/SD_ILS:2940442025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar McGraw-Hill Companies.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-cbest">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MCATent://SD_ILS/0/SD_ILS:2940562025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Hademenos, George J. McCloskey, Candice J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mcat-cdrom-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the Emergency Medicine Oral Boardsent://SD_ILS/0/SD_ILS:2937212025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Howes, David S. Gupta, Rohit. Waples-Trefil, Flora J. Pillow, M. Tyson. Tupesis, Janis P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-for-emergency-medicine-oral-boards54521">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid Q&A for the NBDE part IIent://SD_ILS/0/SD_ILS:2937222025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Portnof, Jason E. Leung, Timothy. Yeoh, Melvyn S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-qampa-for-nbde-part-ii">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the wardsent://SD_ILS/0/SD_ILS:2937232025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao. Bhushan, Vikas. Skapik, Julia.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-for-wards-fifth-edition54577">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's 10 SAT math level 2 practice testsent://SD_ILS/0/SD_ILS:2940272025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-10-math-level-2-practice-tests">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 calculus questions ace your college examsent://SD_ILS/0/SD_ILS:2940142025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Mendelson, Elliott.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-college-calculus-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the family medicine boardsent://SD_ILS/0/SD_ILS:2936962025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao. Mendoza, Michael D. Coffa, Diana.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-family-medicine-boards-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the emergency medicine boardsent://SD_ILS/0/SD_ILS:2936972025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Blok, Barbara K. Cheung, Dickson S. Platts-Mills, Timothy Fortescue.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-boards-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the basic sciences. 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General principlesent://SD_ILS/0/SD_ILS:2936992025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao. Krause, Kendall. Takiar, Vinita.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-basic-sciences-general-principles-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's 500 linear algebra questions ace your college examsent://SD_ILS/0/SD_ILS:2940072025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lipschutz, Seymour.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-college-linear-algebra-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>An introduction to TTCN-3ent://SD_ILS/0/SD_ILS:2987922025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Willcock, Colin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470977903">An electronic book accessible through the World Wide Web; click for information</a>
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(Mark James) Pickering, Trevor R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-orthopaedic-boards-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the wardsent://SD_ILS/0/SD_ILS:2937062025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao. Bhushan, Vikas. Skapik, Julia.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-wards-fourth-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the NBDE. Part Ient://SD_ILS/0/SD_ILS:2937072025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Steinbacher, Derek M. (Derek Matthew) Sierakowski, Steven R. (Steven Robert) American Dental Association. Joint Commission on National Dental Examinations.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-nbde-part-1-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the anesthesiology boardsent://SD_ILS/0/SD_ILS:2937082025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Bhatt, Himani. Powell, Karlyn J. Jean, Dominique Aimee.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-anesthesiology-boards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the psychiatry boardsent://SD_ILS/0/SD_ILS:2937092025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Azzam, Amin. Yanofski, Jason, 1980- Kaftarian, Edward. Le, Tao. American Board of Psychiatry and Neurology.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-psychiatry-boards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the neurology boardsent://SD_ILS/0/SD_ILS:2937102025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Rafii, Michael S. Cochrane, Thomas I. Le, Tao. American Board of Psychiatry and Neurology.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-neurology-boards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the ABSITEent://SD_ILS/0/SD_ILS:2937112025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar LaFemina, Jennifer. Lancaster, Robert Todd. Le, Tao.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-absite">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the matchent://SD_ILS/0/SD_ILS:2937122025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao. Chin-Hong, Peter. Baudendistel, Thomas E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-match-fifth-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the surgery clerkshipent://SD_ILS/0/SD_ILS:2937132025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Stead, Latha G. Stead, S. Matthew. Kaufman, Matthew S. Mishra, Nitin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-surgery-clerkship">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the emergency medicine boardsent://SD_ILS/0/SD_ILS:2937142025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Blok, Barbara K. Cheung, Dickson S. Platts-Mills, Timothy Fortescue.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-boards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid radiology for the wardsent://SD_ILS/0/SD_ILS:2937152025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Stead, Latha G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-radiology-for-wards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the medicine clerkshipent://SD_ILS/0/SD_ILS:2937162025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kaufman, Matthew S. Stead, Latha G. Rusovici, Arthur.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-medicine-clerkship-third-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the pediatric boardsent://SD_ILS/0/SD_ILS:2937172025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Le, Tao.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-pediatric-boards-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the COMLEX an osteopathic manipulative medicine reviewent://SD_ILS/0/SD_ILS:2937182025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Nye, Zachary. Huxley, Stephen M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-comlex-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the NBDE. Part IIent://SD_ILS/0/SD_ILS:2937192025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Portnof, Jason E. Leung, Timothy. Le, Tao.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-nbde-part-ii">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid Q&A for the NBDE part Ient://SD_ILS/0/SD_ILS:2937202025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Steinbacher, Derek M. (Derek Matthew) Sierakowski, Steven R. 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(Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/tabe-test-adult-basic-education-level-math-workbook-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information security management handbookent://SD_ILS/0/SD_ILS:5428312025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Tipton, Harold F. Krause, Micki.<br/>Yer Numarası QA76.9 .A25 I54165 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420003406">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Supported Education 14th International Conference, CSEDU 2022, Virtual Event, April 22-24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5204462025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Uhomoibhi, James. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40501-3">https://doi.org/10.1007/978-3-031-40501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT Technologies for HealthCare 9th EAI International Conference, HealthyIoT 2022, Braga, Portugal, November 16-18, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5206672025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Spinsante, Susanna. editor. Iadarola, Grazia. editor. Paglialonga, Alessia. editor. Tramarin, Federico. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28663-6">https://doi.org/10.1007/978-3-031-28663-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence in Education. 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S. editor. Das, Bibhuti Bhusan. editor. (orcid)0000-0002-1245-4494 Mehta, Yusuf A. editor. Gupta, Rishi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2145-2">https://doi.org/10.1007/978-981-19-2145-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Foundation and Forensic Geotechnical Engineering Proceedings of the Indian Geotechnical Conference 2021 Volume 2ent://SD_ILS/0/SD_ILS:5284992025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Muthukkumaran, Kasinathan. editor. Reddy, C. N. V. 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Simon. editor. Dey, Nilanjan. editor. Joshi, Amit. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-3243-6">https://doi.org/10.1007/978-981-99-3243-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of Eighth International Congress on Information and Communication Technology ICICT 2023, London, Volume 2ent://SD_ILS/0/SD_ILS:5287012025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Yang, Xin-She. editor. Sherratt, R. 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T., author. Sakihara, Masako, author. Shishido, Loren I., author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1515/9780824897451">https://doi.org/10.1515/9780824897451</a>
<a href="https://www.degruyter.com/isbn/9780824897451">https://www.degruyter.com/isbn/9780824897451</a>
Cover <a href="https://www.degruyter.com/document/cover/isbn/9780824897451/original">https://www.degruyter.com/document/cover/isbn/9780824897451/original</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pervasive Computing Technologies for Healthcare 16th EAI International Conference, PervasiveHealth 2022, Thessaloniki, Greece, December 12-14, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204582025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Tsanas, Athanasios. editor. Triantafyllidis, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34586-9">https://doi.org/10.1007/978-3-031-34586-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>6GN for Future Wireless Networks 5th EAI International Conference, 6GN 2022, Harbin, China, December 17-18, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5204902025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Li, Ao. editor. Shi, Yao. editor. Xi, Liang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36011-4">https://doi.org/10.1007/978-3-031-36011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Computing and Data Sciences 7th International Conference, ICACDS 2023, Kolkata, India, April 27-28, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205212025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Singh, Mayank. editor. Tyagi, Vipin. editor. Gupta, P.K. editor. Flusser, Jan. editor. Ören, Tuncer. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37940-6">https://doi.org/10.1007/978-3-031-37940-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5207522025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23944-1">https://doi.org/10.1007/978-3-031-23944-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Systems and Information Processing 7th International Conference, ICCSIP 2022, Fuzhou, China, December 17-18, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5207582025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Sun, Fuchun. editor. Cangelosi, Angelo. editor. Zhang, Jianwei. editor. Yu, Yuanlong. editor. Liu, Huaping. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0617-8">https://doi.org/10.1007/978-981-99-0617-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Quality: Higher Software Quality through Zero Waste Development 15th International Conference, SWQD 2023, Munich, Germany, May 23-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5207662025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Mendez, Daniel. editor. Winkler, Dietmar. editor. Kross, Johannes. editor. Biffl, Stefan. editor. Bergsmann, Johannes. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31488-9">https://doi.org/10.1007/978-3-031-31488-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unconventional Computation and Natural Computation 20th International Conference, UCNC 2023, Jacksonville, FL, USA, March 13-17, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209562025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Genova, Daniela. editor. Kari, Jarkko. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34034-5">https://doi.org/10.1007/978-3-031-34034-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovative Technologies and Learning 6th International Conference, ICITL 2023, Porto, Portugal, August 28-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209652025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Huang, Yueh-Min. editor. (orcid) Rocha, Tânia. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40113-8">https://doi.org/10.1007/978-3-031-40113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>NASA Formal Methods 15th International Symposium, NFM 2023, Houston, TX, USA, May 16-18, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209842025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Rozier, Kristin Yvonne. editor. Chaudhuri, Swarat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33170-1">https://doi.org/10.1007/978-3-031-33170-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210022025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36616-1">https://doi.org/10.1007/978-3-031-36616-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Interface and the Management of Information Thematic Area, HIMI 2023, Held as Part of the 25th HCI International Conference, HCII 2023, Copenhagen, Denmark, July 23-28, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5210332025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Mori, Hirohiko. editor. Asahi, Yumi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35129-7">https://doi.org/10.1007/978-3-031-35129-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in Artificial Intelligence 22nd EPIA Conference on Artificial Intelligence, EPIA 2023, Faial Island, Azores, September 5-8, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213632025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Moniz, Nuno. editor. Vale, Zita. editor. Cascalho, José. editor. Silva, Catarina. editor. Sebastião, Raquel. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-49008-8">https://doi.org/10.1007/978-3-031-49008-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence over Infrared Images for Medical Applications Second MICCAI Workshop, AIIIMA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214032025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kakileti, Siva Teja. editor. (orcid) Manjunath, Geetha. editor. Schwartz, Robert G. editor. Frangi, Alejandro F. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44511-8">https://doi.org/10.1007/978-3-031-44511-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphonomics in Human Body Movement. Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Character Building and Competence Development in Medical and Health Professions Education The First Biennial Indonesian Medical and Health Professions Education Conferenceent://SD_ILS/0/SD_ILS:5219502025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Claramita, Mora. editor. Soemantri, Diantha. editor. Hidayah, Rachmadya Nur. editor. Findyartini, Ardi. editor. Samarasekera, Dujeepa D. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-4573-3">https://doi.org/10.1007/978-981-99-4573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Neuroanatomy for the Boards and the Clinic Finding the Lesionent://SD_ILS/0/SD_ILS:5219862025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Leo, Jonathan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41123-6">https://doi.org/10.1007/978-3-031-41123-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Experimental Investigation of Deep‐Sea Oil Spills in a High‐Pressure Laboratory Environmentent://SD_ILS/0/SD_ILS:5267152025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Malone, Karen. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25545-8">https://doi.org/10.1007/978-3-031-25545-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Variable Refrigerant Flow Systems Advances and Applications of VRFent://SD_ILS/0/SD_ILS:5267282025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Enteria, Napoleon. editor. Sawachi, Takao. editor. Saito, Kiyoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6833-4">https://doi.org/10.1007/978-981-19-6833-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Proceedings of the 2021 Asia-Pacific International Symposium on Aerospace Technology (APISAT 2021), Volume 1ent://SD_ILS/0/SD_ILS:5267712025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Lee, Sangchul. editor. Han, Cheolheui. editor. Choi, Jeong-Yeol. editor. Kim, Seungkeun. editor. Kim, Jeong Ho. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2689-1">https://doi.org/10.1007/978-981-19-2689-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cloud Computing with Security and Scalability. Concepts and Practicesent://SD_ILS/0/SD_ILS:5267752025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Sehgal, Naresh Kumar. author. Bhatt, Pramod Chandra P. author. Acken, John M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-07242-0">https://doi.org/10.1007/978-3-031-07242-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Predictive Analytics in System Reliabilityent://SD_ILS/0/SD_ILS:5267812025-12-31T11:40:44Z2025-12-31T11:40:44ZYazar Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>