Arama Sonuçları Test. - Daraltılmış: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2026-01-14T12:01:01ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:5450382026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Walton, William Clarence., author.<br/>Yer Numarası GB1199 .W345 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042931">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The Turing test argumentent://SD_ILS/0/SD_ILS:5781672026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gonçalves, Bernardo, author.<br/>Yer Numarası Q341 .G66 2024<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003300267">https://www.taylorfrancis.com/books/9781003300267</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Clinical integration of neuropsychological test resultsent://SD_ILS/0/SD_ILS:5627292026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Golden, Charles J., 1949- editor. Bennett, Ryan (Ryan D.), editor.<br/>Yer Numarası RC386.6 .N48<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309604">https://www.taylorfrancis.com/books/9781003309604</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:5386982026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Ilgenfritz, Merle., author. Ilgenfritz, John. Powell, John. Baca, Steven.<br/>Yer Numarası QA76.3 .I56 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420066005">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:5303292026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5372362026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5467662026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5391942026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420091175">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:5440312026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gruijter, Dato N. de., author. Kamp, Leo J. Th. van der.<br/>Yer Numarası H61.25 .G78 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781584889595">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Oscillation-Based Test in Mixed-Signal Circuitsent://SD_ILS/0/SD_ILS:1694322026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5471942026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049831">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Well test analysis for fractured reservoir evaluationent://SD_ILS/0/SD_ILS:2554672026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Da Prat, Giovanni.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444886910">http://www.sciencedirect.com/science/book/9780444886910</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Test Attacks to Break Mobile and Embedded Devices.ent://SD_ILS/0/SD_ILS:5396352026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hagar, Jon Duncan, author. CRC Press LLC.<br/>Yer Numarası QA76.9 .A25 H343 2017<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429071911">https://www.taylorfrancis.com/books/9780429071911</a>
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McGraw-Hill's SSAT/ISEE high school entrance exams.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-ssatisee-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940292026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940302026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940312026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP statistics questions to know by test dayent://SD_ILS/0/SD_ILS:2938232026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Phan, Jennifer. Balachandran, Divya. Walker, Jerimi Ann.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-statistics-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP microeconomics/macroeconomics questions to know by test dayent://SD_ILS/0/SD_ILS:2938242026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Reddington, Brian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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dayent://SD_ILS/0/SD_ILS:2938352026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Miller, Shveta Verma.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940532026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940542026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level A test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940682026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Dutwin, Phyllis. Altreuter, Carol. Guglielmi, Kathy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940692026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level D test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940752026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Dutwin, Phyllis. Ku, Richard T. (Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 2ent://SD_ILS/0/SD_ILS:2940522026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-2-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>MACHINA SAPIENS how intelligent machines passed turing's test (and what happened the next day).ent://SD_ILS/0/SD_ILS:5698062026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Cristianini, Nello.<br/>Yer Numarası Q325.5<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003582212">https://www.taylorfrancis.com/books/9781003582212</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Frontiers of test validity theory : measurement, causation, and meaningent://SD_ILS/0/SD_ILS:5551502026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Markus, Keith A., author. Borsboom, Denny, author.<br/>Yer Numarası BF39<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003398219">https://www.taylorfrancis.com/books/9781003398219</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>State-society relations around the world through the lens of the COVID-19 pandemic : rapid-testent://SD_ILS/0/SD_ILS:5859532026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Duca, Federica, editor. Meny-Gibert, Sarah, editor.<br/>Yer Numarası RA644 .C67<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003321545">https://www.taylorfrancis.com/books/9781003321545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dengue Diagnostics The Right Test at the Right Time for the Right Group.ent://SD_ILS/0/SD_ILS:5563622026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sekaran, Shamala Devi.<br/>Yer Numarası RA644 .D4<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032669564">https://www.taylorfrancis.com/books/9781032669564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A test of morals : surgical, ethical, and psychosocial considerations in human head transplantationent://SD_ILS/0/SD_ILS:5869782026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Furr, L. Allen, author.<br/>Yer Numarası RD594.12<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003367017">https://www.taylorfrancis.com/books/9781003367017</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing of Materials for Fire Protection Needs European Standard Test Methods for the Building Sectorent://SD_ILS/0/SD_ILS:5275692026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Makovická Osvaldová, Linda. author. Fatriasari, Widya. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39711-0">https://doi.org/10.1007/978-3-031-39711-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Parsa, Saeed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>ACE THAT TEST a students guide to learning better.ent://SD_ILS/0/SD_ILS:5520982026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sumeracki, Megan, author.<br/>Yer Numarası LB1066<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003327530">https://www.taylorfrancis.com/books/9781003327530</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>British nuclear weapons and the test ban : squaring the circle of defence and arms control, 1974-82ent://SD_ILS/0/SD_ILS:5773322026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Walker, John R., 1960- author.<br/>Yer Numarası U264.5 .G7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003375708">https://www.taylorfrancis.com/books/9781003375708</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Educational accountability and American federalism : moving beyond a test-based approachent://SD_ILS/0/SD_ILS:5810632026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Portz, John, 1953- author.<br/>Yer Numarası LB2806.22<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003276890">https://www.taylorfrancis.com/books/9781003276890</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>SYSTEMATICALLY ANALYSING INDIRECT TRANSLATIONS putting the concatenation effect hypothesis to... the test.ent://SD_ILS/0/SD_ILS:5670642026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hadley, James (Researcher in literary translation), author.<br/>Yer Numarası P306.97 .I53<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429282768">https://www.taylorfrancis.com/books/9780429282768</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CALIFORNIA'S RECALL ELECTION OF GAVIN NEWSOM covid-19 and the test of leadership.ent://SD_ILS/0/SD_ILS:5635372026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gerston, Larry N. Currin-Percival, Mary. Percival, Garrick L.<br/>Yer Numarası F866.4 .N498<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217954">https://www.taylorfrancis.com/books/9781003217954</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pluralism, poetry, and literacy : a test of reading and interpretive techniquesent://SD_ILS/0/SD_ILS:5709572026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kalck, Xavier, author.<br/>Yer Numarası PN81 .K24 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429200786">https://www.taylorfrancis.com/books/9780429200786</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pregnancy, delivery, childbirth : a gender and cultural history from antiquity to the test tube in Europeent://SD_ILS/0/SD_ILS:5641672026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Filippini, Nadia Maria, author. Boscolo, Clelia, translator.<br/>Yer Numarası RG511 .F4513 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429265457">https://www.taylorfrancis.com/books/9780429265457</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>SIGNAL DETECTION FOR MEDICAL SCIENTISTS; LIKELIHOOD RATIO TEST-BASED METHODOLOGYent://SD_ILS/0/SD_ILS:5545052026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tiwari, Ram (Ram C.), author. Zalkikar, Jyoti, author. Huang, Lan (Statistician), author.<br/>Yer Numarası RM301.27<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429259753">https://www.taylorfrancis.com/books/9780429259753</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A democratic theory of educational credibility : from test-based assessment to interpersonal responsibilityent://SD_ILS/0/SD_ILS:5583472026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gottlieb, Derek, author.<br/>Yer Numarası LB2806.22 .G68 2020 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429019159">https://www.taylorfrancis.com/books/9780429019159</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Validity an integrated approach to test score meaning and useent://SD_ILS/0/SD_ILS:5825712026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Cizek, Gregory J.<br/>Yer Numarası LB3060.7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429291661">https://www.taylorfrancis.com/books/9780429291661</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>PSYCHOMETRICS OF STANDARD SETTING connecting policy and test scores.ent://SD_ILS/0/SD_ILS:5844652026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Reckase, Mark.<br/>Yer Numarası BF39<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429156410">https://www.taylorfrancis.com/books/9780429156410</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Larner, A. J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Roman, Adam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Irwing, Frederick Paul, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RILEM Technical Committee 195-DTD Recommendation for Test Methods for AD and TD of Early Age Concrete Round Robin Documentation Report: Program, Test Results and Statistical Evaluationent://SD_ILS/0/SD_ILS:5297902026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bjøntegaard, Øyvind. author. Martius-Hammer, Tor Arne. author. Krauss, Matias. author. Budelmann, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-017-9266-0">https://doi.org/10.1007/978-94-017-9266-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Larner, A.J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Place and Health as Complex Systems A Case Study and Empirical Testent://SD_ILS/0/SD_ILS:5193872026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Castellani, Brian. author. Rajaram, Rajeev. author. Buckwalter, J. Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Critical mm-Wave Components for Synthetic Automatic Test Systemsent://SD_ILS/0/SD_ILS:5296442026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hrobak, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:5386682026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Yer Numarası QA76.9 .C65 S56 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482225501">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Evaluation of Aircraft Avionics and Weapon Systemsent://SD_ILS/0/SD_ILS:3649292026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar McShea, Robert E.<br/>Yer Numarası \(364929.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA507E">http://dx.doi.org/10.1049/SBRA507E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICsent://SD_ILS/0/SD_ILS:4874052026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bates, Jan Wheeler. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instant penetration testing setting up a test lab how-to : set up your own penetration testing lab using practical and precise recipesent://SD_ILS/0/SD_ILS:3130442026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Fadyushin, Vyacheslav.<br/>Yer Numarası ONLINE(313044.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333066.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15772-1">http://dx.doi.org/10.1007/978-3-642-15772-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System-Level Validation High-Level Modeling and Directed Test Generation Techniquesent://SD_ILS/0/SD_ILS:3312652026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Characteristics of Virtual Learning Environments A Theoretical Integration and Empirical Test of Technology Acceptance and IS Success Researchent://SD_ILS/0/SD_ILS:3352402026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Müller, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335240.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approachent://SD_ILS/0/SD_ILS:3309862026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Psychiatric mental health nursing success a course review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2805972026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Curtis, Cathy Melfi. Fegley, Audra Baker. Tuzo, Carol Norton.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technologyent://SD_ILS/0/SD_ILS:3344202026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334420.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37398-5">http://dx.doi.org/10.1007/978-3-642-37398-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Families of the missing a test for contemporary approaches to transitional justiceent://SD_ILS/0/SD_ILS:3445352026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Robins, Simon.<br/>Yer Numarası ONLINE(344535.1)<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203517079">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in-Self-Test and Digital Self-Calibration for RF SoCsent://SD_ILS/0/SD_ILS:1732422026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9548-3">http://dx.doi.org/10.1007/978-1-4419-9548-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Quality Test Pattern Generation and Boolean Satisfiabilityent://SD_ILS/0/SD_ILS:1733602026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methodsent://SD_ILS/0/SD_ILS:1686472026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-977-2">http://dx.doi.org/10.1007/978-0-85729-977-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Is There a Court for Gaza? A Test Bench for International Justiceent://SD_ILS/0/SD_ILS:2056722026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Meloni, Chantal. editor. Tognoni, Gianni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-6704-820-0">http://dx.doi.org/10.1007/978-90-6704-820-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals success a Q & A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803162026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Refinement of Econometric Estimation and Test Procedures Finite Sample and Asymptotic Analysisent://SD_ILS/0/SD_ILS:2370032026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Phillips, Garry D. A.. Tzavalis, Elias.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511493157">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Assessing neuromotor readiness for learning the INPP developmental screening test and school intervention programmeent://SD_ILS/0/SD_ILS:3054912026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Goddard, Sally, 1957- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119945017">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's PCATent://SD_ILS/0/SD_ILS:2940572026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hademenos, George J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A. Whitener, Mark A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-pcat">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests of adult basic education level A mathematics workbookent://SD_ILS/0/SD_ILS:2940602026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Ku, Richard T. (Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/tabe-test-adult-basic-education-level-math-workbook-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>REDESIGNING JUSTICE FOR PLURAL SOCIETIES case studies of minority accommodation from around the globeent://SD_ILS/0/SD_ILS:5587472026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar (Re)designing Justice for Plural Societies: Accommodative Practices Put to the Test (Conference) (2017 : Max Planck Institut für ethnologische Forschung) Alidadi, Katayoun, editor. Foblets, Marie-Claire, 1959- editor. Müller, Dominik M., editor. Max-Planck-Institut für ethnologische Forschung, sponsoring body.<br/>Yer Numarası K3242 .A6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003224174">https://www.taylorfrancis.com/books/9781003224174</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The lieutenant nun : annotated translation of the play, historical accounts and documents about Antonio/Catalina de Erausoent://SD_ILS/0/SD_ILS:5646252026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Albalá Pelegrín, Marta, editor. Test, Edward McLean, editor. Velasco, Sherry M. (Sherry Marie), 1962- writer of foreword. Chess, Simone, 1980- writer of afterword. Kemp, Sawyer K., writer of afterword.<br/>Yer Numarası CT1358 .E7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003291732">https://www.taylorfrancis.com/books/9781003291732</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information security management handbookent://SD_ILS/0/SD_ILS:5428312026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tipton, Harold F. Krause, Micki.<br/>Yer Numarası QA76.9 .A25 I54165 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420003406">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>COMMUNICATION SKILLS FOR YOUR POLICING DEGREEent://SD_ILS/0/SD_ILS:5718322026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bottomley, Jane (Senior language tutor), auteur. Pryjmachuk, Steven, 1964- author. Wright, Martin, Dr., author.<br/>Yer Numarası HV7936 .C8<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054658">https://www.taylorfrancis.com/books/9781041054658</a>
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OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>MULTILINGUAL LEADERSHIP IN TESOLent://SD_ILS/0/SD_ILS:5570482026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tính Trịnh, Ethan. De Oliveira, Luciana C. Selvi, Ali Fuad.<br/>Yer Numarası PE1128 .A2<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003396079">https://www.taylorfrancis.com/books/9781003396079</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>English language mediated settings and educational inequalities : language education policy agendas in the South Pacificent://SD_ILS/0/SD_ILS:5590962026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Goundar, Prashneel R., author.<br/>Yer Numarası PE1068 .O3<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003479147">https://www.taylorfrancis.com/books/9781003479147</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>UNDERSTANDING AND HELPING TO OVERCOME EXAM ANXIETY what is it, why is it important and where... does it come from?.ent://SD_ILS/0/SD_ILS:5563772026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Putwain, David.<br/>Yer Numarası LB3060.6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032716411">https://www.taylorfrancis.com/books/9781032716411</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Quality: Higher Software Quality through Zero Waste Development 15th International Conference, SWQD 2023, Munich, Germany, May 23-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5207662026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Mendez, Daniel. editor. Winkler, Dietmar. editor. Kross, Johannes. editor. Biffl, Stefan. editor. Bergsmann, Johannes. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31488-9">https://doi.org/10.1007/978-3-031-31488-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5207992026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5211252026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar De Paolis, Lucio Tommaso. editor. Arpaia, Pasquale. editor. Sacco, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43404-4">https://doi.org/10.1007/978-3-031-43404-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Image Learning with Limited and Noisy Data Second International Workshop, MILLanD 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 8, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212262026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Xue, Zhiyun. editor. Antani, Sameer. editor. Zamzmi, Ghada. editor. Yang, Feng. editor. Rajaraman, Sivaramakrishnan. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44917-8">https://doi.org/10.1007/978-3-031-44917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Functional Neuroradiology Principles and Clinical Applicationsent://SD_ILS/0/SD_ILS:5215812026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Faro, Scott H. editor. Mohamed, Feroze B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-10909-6">https://doi.org/10.1007/978-3-031-10909-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Experimental Investigation of Deep‐Sea Oil Spills in a High‐Pressure Laboratory Environmentent://SD_ILS/0/SD_ILS:5267152026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Malone, Karen. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25545-8">https://doi.org/10.1007/978-3-031-25545-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Variable Refrigerant Flow Systems Advances and Applications of VRFent://SD_ILS/0/SD_ILS:5267282026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Enteria, Napoleon. editor. Sawachi, Takao. editor. Saito, Kiyoshi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6833-4">https://doi.org/10.1007/978-981-19-6833-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the Sixth International Conference of Transportation Research Group of India CTRG 2021 Volume 1ent://SD_ILS/0/SD_ILS:5267892026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Devi, Lelitha. editor. Das, Animesh. editor. Sahu, Prasanta Kumar. editor. Basu, Debasis. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3505-3">https://doi.org/10.1007/978-981-19-3505-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022ent://SD_ILS/0/SD_ILS:5268562026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0055-8">https://doi.org/10.1007/978-981-99-0055-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Technologies in Data Mining and Information Security Proceedings of IEMIS 2022, Volume 3ent://SD_ILS/0/SD_ILS:5268852026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Dutta, Paramartha. editor. Bhattacharya, Abhishek. editor. Dutta, Soumi. editor. Lai, Wen-Cheng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-4676-9">https://doi.org/10.1007/978-981-19-4676-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of I4SDG Workshop 2023 IFToMM for Sustainable Development Goalsent://SD_ILS/0/SD_ILS:5269692026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Petuya, Victor. editor. Quaglia, Giuseppe. editor. (orcid)0000-0003-4951-9228 Parikyan, Tigran. editor. Carbone, Giuseppe. editor. (orcid)0000-0003-0831-8358 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32439-0">https://doi.org/10.1007/978-3-031-32439-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Variable Geometry Turbine Technology for Marine Gas Turbinesent://SD_ILS/0/SD_ILS:5269922026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Gao, Jie. author. Zheng, Qun. author. Lin, Feng. author. Liang, Chen. author. Liu, Yu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6952-2">https://doi.org/10.1007/978-981-19-6952-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Flight Testing Analysis of the Spin Dynamics of a Single-Engine Low-Wing Aeroplaneent://SD_ILS/0/SD_ILS:5274232026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Schrader, Steffen Haakon. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-63218-5">https://doi.org/10.1007/978-3-662-63218-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Machine Learning Support for Fault Diagnosis of System-on-Chipent://SD_ILS/0/SD_ILS:5275272026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Special Topics in Structural Dynamics & Experimental Techniques, Volume 5 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5275002026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Allen, Matt. editor. Davaria, Sheyda. editor. Davis, R. Benjamin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05405-1">https://doi.org/10.1007/978-3-031-05405-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Topics in Modal Analysis & Parameter Identification, Volume 8 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5275772026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Dilworth, Brandon J. editor. Marinone, Timothy. editor. Mains, Michael. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05445-7">https://doi.org/10.1007/978-3-031-05445-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the Munich Symposium on Lightweight Design 2021 Tagungsband zum Münchner Leichtbauseminar 2021ent://SD_ILS/0/SD_ILS:5275782026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Rieser, Jasper. editor. (orcid)0000-0002-0367-0224 Endress, Felix. editor. Horoschenkoff, Alexander. editor. Höfer, Philipp. editor. (orcid)0000-0001-9090-1643 Dickhut, Tobias. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65216-9">https://doi.org/10.1007/978-3-662-65216-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practice of Discrete Element Method in Soil-Structure Interface Modellingent://SD_ILS/0/SD_ILS:5275822026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Zhou, Wan-Huan. author. Yin, Zhen-Yu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-0047-1">https://doi.org/10.1007/978-981-19-0047-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability-Based Multi-objective Optimization for Material Selectionent://SD_ILS/0/SD_ILS:5275832026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Zheng, Maosheng. author. Teng, Haipeng. author. Yu, Jie. author. Cui, Ying. author. Wang, Yi. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3351-6">https://doi.org/10.1007/978-981-19-3351-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building for the Future: Durable, Sustainable, Resilient Proceedings of the fib Symposium 2023 - Volume 2ent://SD_ILS/0/SD_ILS:5278072026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Ilki, Alper. editor. Çavunt, Derya. editor. Çavunt, Yavuz Selim. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32511-3">https://doi.org/10.1007/978-3-031-32511-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reservoir Ecotoxicologyent://SD_ILS/0/SD_ILS:5276992026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Pei, De-Sheng. author. Hamid, Naima. author. Sultan, Marriya. author. Thodhal Yoganandham, Suman. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26344-6">https://doi.org/10.1007/978-3-031-26344-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dual-Mass Linear Vibration Silicon-Based MEMS Gyroscopeent://SD_ILS/0/SD_ILS:5277772026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Cao, Huiliang. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9247-6">https://doi.org/10.1007/978-981-19-9247-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Conservation and Restoration of Historic Mortars and Masonry Structures HMC 2022ent://SD_ILS/0/SD_ILS:5278272026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Bokan Bosiljkov, Violeta. editor. Padovnik, Andreja. editor. Turk, Tilen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31472-8">https://doi.org/10.1007/978-3-031-31472-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Trends in Educational Activity in the Field of Mechanism and Machine Theory (2018-2022) Selected Papers from ISEMMS 2022ent://SD_ILS/0/SD_ILS:5278392026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar García Prada, Juan Carlos. editor. Castejon, Cristina. editor. Pedrero Moya, Jose Ignacio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25730-8">https://doi.org/10.1007/978-3-031-25730-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical Methods at the Forefront of Biomedical Advancesent://SD_ILS/0/SD_ILS:5278642026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Larriba, Yolanda. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32729-2">https://doi.org/10.1007/978-3-031-32729-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of International Conference on Intelligent Vision and Computing (ICIVC 2022) Volume 1ent://SD_ILS/0/SD_ILS:5282172026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Sharma, Harish. editor. Saha, Apu Kumar. editor. Prasad, Mukesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31164-2">https://doi.org/10.1007/978-3-031-31164-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Functioning in Schizophrenia: Leveraging the RDoC Frameworkent://SD_ILS/0/SD_ILS:5283962026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Barch, Deanna M. editor. Young, Jared W. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26441-2">https://doi.org/10.1007/978-3-031-26441-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the 9th International Conference on Computational Science and Technology ICCST 2022, 27-28 August, Johor Bahru, Malaysiaent://SD_ILS/0/SD_ILS:5286132026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kang, Dae-Ki. editor. Alfred, Rayner. editor. Ismail, Zamhar Iswandono Bin Awang. editor. Baharum, Aslina. editor. Thiruchelvam, Vinesh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8406-8">https://doi.org/10.1007/978-981-19-8406-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Intelligent Information Processing with Matlabent://SD_ILS/0/SD_ILS:5286322026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Zhang, Xiu. author. Zhang, Xin. author. Wang, Wei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6449-9">https://doi.org/10.1007/978-981-99-6449-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Chemical Signals in Vertebrates 15ent://SD_ILS/0/SD_ILS:5286332026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Schaal, Benoist. editor. Rekow, Diane. editor. Keller, Matthieu. editor. Damon, Fabrice. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35159-4">https://doi.org/10.1007/978-3-031-35159-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Vulnerabilities Rethinking Medicine Rights and Humanities in Post-pandemicent://SD_ILS/0/SD_ILS:5286622026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Achella, Stefania. editor. (orcid)0000-0001-9806-5811 Marazia, Chantal. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39378-5">https://doi.org/10.1007/978-3-031-39378-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of Eighth International Congress on Information and Communication Technology ICICT 2023, London, Volume 1ent://SD_ILS/0/SD_ILS:5287002026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Yang, Xin-She. editor. Sherratt, R. Simon. editor. Dey, Nilanjan. editor. Joshi, Amit. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-3243-6">https://doi.org/10.1007/978-981-99-3243-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of Eighth International Congress on Information and Communication Technology ICICT 2023, London, Volume 2ent://SD_ILS/0/SD_ILS:5287012026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Yang, Xin-She. editor. Sherratt, R. Simon. editor. Dey, Nilanjan. editor. Joshi, Amit. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-3091-3">https://doi.org/10.1007/978-981-99-3091-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human-Technology Interaction Shaping the Future of Industrial User Interfacesent://SD_ILS/0/SD_ILS:5202532026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Röcker, Carsten. editor. Büttner, Sebastian. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-99235-4">https://doi.org/10.1007/978-3-030-99235-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Enterprise, Business-Process and Information Systems Modeling 24th International Conference, BPMDS 2023, and 28th International Conference, EMMSAD 2023, Zaragoza, Spain, June 12-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5204212026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar van der Aa, Han. editor. Bork, Dominik. editor. (orcid) Proper, Henderik A. editor. Schmidt, Rainer. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34241-7">https://doi.org/10.1007/978-3-031-34241-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>6GN for Future Wireless Networks 5th EAI International Conference, 6GN 2022, Harbin, China, December 17-18, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5204902026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Li, Ao. editor. Shi, Yao. editor. Xi, Liang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36011-4">https://doi.org/10.1007/978-3-031-36011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Computing and Data Sciences 7th International Conference, ICACDS 2023, Kolkata, India, April 27-28, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205212026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Singh, Mayank. editor. Tyagi, Vipin. editor. Gupta, P.K. editor. Flusser, Jan. editor. Ören, Tuncer. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37940-6">https://doi.org/10.1007/978-3-031-37940-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Research Challenges in Information Science: Information Science and the Connected World 17th International Conference, RCIS 2023, Corfu, Greece, May 23-26, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205802026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Nurcan, Selmin. editor. Opdahl, Andreas L. editor. Mouratidis, Haralambos. editor. Tsohou, Aggeliki. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33080-3">https://doi.org/10.1007/978-3-031-33080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Intelligence 8th International Conference, CBI 2023, Istanbul, Turkey, July 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205962026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar El Ayachi, Rachid. editor. Fakir, Mohamed. editor. Baslam, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37872-0">https://doi.org/10.1007/978-3-031-37872-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206062026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Fernandes, José Maria. editor. Travassos, Guilherme H. editor. Lenarduzzi, Valentina. editor. Li, Xiaozhou. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Production Management Systems. Production Management Systems for Responsible Manufacturing, Service, and Logistics Futures IFIP WG 5.7 International Conference, APMS 2023, Trondheim, Norway, September 17-21, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5206112026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Alfnes, Erlend. editor. Romsdal, Anita. editor. Strandhagen, Jan Ola. editor. von Cieminski, Gregor. editor. Romero, David. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43666-6">https://doi.org/10.1007/978-3-031-43666-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Dynamic Data Driven Applications Systems Volume 2ent://SD_ILS/0/SD_ILS:5206142026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Darema, Frederica. editor. Blasch, Erik P. editor. Ravela, Sai. editor. Aved, Alex J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27986-7">https://doi.org/10.1007/978-3-031-27986-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Science 9th International Conference of Pioneering Computer Scientists, Engineers and Educators, ICPCSEE 2023, Harbin, China, September 22-24, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5206882026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Yu, Zhiwen. editor. Han, Qilong. editor. Wang, Hongzhi. editor. Guo, Bin. editor. Zhou, Xiaokang. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5968-6">https://doi.org/10.1007/978-981-99-5968-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structured Object-Oriented Formal Language and Method 11th International Workshop, SOFL+MSVL 2022, Madrid, Spain, October 24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5209112026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Liu, Shaoying. editor. Duan, Zhenhua. editor. Liu, Ai. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29476-1">https://doi.org/10.1007/978-3-031-29476-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in Artificial Intelligence 22nd EPIA Conference on Artificial Intelligence, EPIA 2023, Faial Island, Azores, September 5-8, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213632026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Moniz, Nuno. editor. Vale, Zita. editor. Cascalho, José. editor. Silva, Catarina. editor. Sebastião, Raquel. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-49008-8">https://doi.org/10.1007/978-3-031-49008-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evolutionary Multi-Criterion Optimization 12th International Conference, EMO 2023, Leiden, The Netherlands, March 20-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213852026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Emmerich, Michael. editor. Deutz, André. editor. Wang, Hao. editor. Kononova, Anna V. editor. Naujoks, Boris. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27250-9">https://doi.org/10.1007/978-3-031-27250-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence over Infrared Images for Medical Applications Second MICCAI Workshop, AIIIMA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214032026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kakileti, Siva Teja. editor. (orcid) Manjunath, Geetha. editor. Schwartz, Robert G. editor. Frangi, Alejandro F. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44511-8">https://doi.org/10.1007/978-3-031-44511-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphonomics in Human Body Movement. Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thyroid FNA Cytology Differential Diagnoses and Pitfallsent://SD_ILS/0/SD_ILS:5222622026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kakudo, Kennichi. editor. Liu, Zhiyan. editor. Jung, Chan Kwon. editor. Hirokawa, Mitsuyoshi. editor. Bychkov, Andrey. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6782-7">https://doi.org/10.1007/978-981-99-6782-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Helicobacter pylorient://SD_ILS/0/SD_ILS:5222792026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Kim, Nayoung. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0013-4">https://doi.org/10.1007/978-981-97-0013-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5203192026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2446-2">https://doi.org/10.1007/978-981-99-2446-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nature of Computation and Communication 8th EAI International Conference, ICTCC 2022, Vinh Long, Vietnam, October 27-28, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203732026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Phan, Cong Vinh. editor. (orcid) Nguyen, Thanh Dung. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28790-9">https://doi.org/10.1007/978-3-031-28790-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Supported Education 14th International Conference, CSEDU 2022, Virtual Event, April 22-24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5204462026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Uhomoibhi, James. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40501-3">https://doi.org/10.1007/978-3-031-40501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pervasive Computing Technologies for Healthcare 16th EAI International Conference, PervasiveHealth 2022, Thessaloniki, Greece, December 12-14, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204582026-01-14T12:01:01Z2026-01-14T12:01:01ZYazar Tsanas, Athanasios. editor. Triantafyllidis, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34586-9">https://doi.org/10.1007/978-3-031-34586-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>