Arama Sonuçları Test. - Daraltılmış: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300$0026isd$003dtrue?dt=list2026-01-11T23:18:54ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:5450382026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Walton, William Clarence., author.<br/>Yer Numarası GB1199 .W345 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042931">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The Turing test argumentent://SD_ILS/0/SD_ILS:5781672026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Gonçalves, Bernardo, author.<br/>Yer Numarası Q341 .G66 2024<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003300267">https://www.taylorfrancis.com/books/9781003300267</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Clinical integration of neuropsychological test resultsent://SD_ILS/0/SD_ILS:5627292026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Golden, Charles J., 1949- editor. Bennett, Ryan (Ryan D.), editor.<br/>Yer Numarası RC386.6 .N48<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309604">https://www.taylorfrancis.com/books/9781003309604</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:5386982026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Ilgenfritz, Merle., author. Ilgenfritz, John. Powell, John. Baca, Steven.<br/>Yer Numarası QA76.3 .I56 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420066005">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:5303292026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5372362026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5467662026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Broemeling, Lyle D., 1939, author.<br/>Yer Numarası RC71.3 .A38 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5391942026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420091175">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:5440312026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Gruijter, Dato N. de., author. Kamp, Leo J. Th. van der.<br/>Yer Numarası H61.25 .G78 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781584889595">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Oscillation-Based Test in Mixed-Signal Circuitsent://SD_ILS/0/SD_ILS:1694322026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5471942026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kett, Irving., author.<br/>Yer Numarası TA442.5 .K48 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049831">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Well test analysis for fractured reservoir evaluationent://SD_ILS/0/SD_ILS:2554672026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Da Prat, Giovanni.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444886910">http://www.sciencedirect.com/science/book/9780444886910</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Test Attacks to Break Mobile and Embedded Devices.ent://SD_ILS/0/SD_ILS:5396352026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hagar, Jon Duncan, author. CRC Press LLC.<br/>Yer Numarası QA76.9 .A25 H343 2017<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429071911">https://www.taylorfrancis.com/books/9780429071911</a>
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Math level 1ent://SD_ILS/0/SD_ILS:2940292026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940302026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940312026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's 500 MCAT general chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940122026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Moore, John T., 1947- Langley, Richard.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-general-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 MCAT biology questions to know by test dayent://SD_ILS/0/SD_ILS:2940152026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Stewart, Robert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-biology-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 MCAT organic chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940162026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Moore, John T., 1947- Langley, Richard.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-organic-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP statistics questions to know by test dayent://SD_ILS/0/SD_ILS:2938232026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Phan, Jennifer. Balachandran, Divya. Walker, Jerimi Ann.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-statistics-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's GRE Graduate Record Examination general testent://SD_ILS/0/SD_ILS:2940202026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dulan, Steven W. Advantage Education (Firm)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-gre-2013-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP calculus AB/BC questions to know by test dayent://SD_ILS/0/SD_ILS:2938252026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Miner, Zachary. Folwaczny, Lena.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-calculus-abbc-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2938292026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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dayent://SD_ILS/0/SD_ILS:2938242026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Reddington, Brian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-mustknow-ap-microeconomicsmacroeconomics-questions">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 2ent://SD_ILS/0/SD_ILS:2940522026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-2-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940532026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940542026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level A test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940682026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dutwin, Phyllis. Altreuter, Carol. Guglielmi, Kathy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940692026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level D test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940752026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dutwin, Phyllis. Ku, Richard T. (Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English literature questions to know by test dayent://SD_ILS/0/SD_ILS:2938352026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Miller, Shveta Verma.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Demeter, Scott E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP psychology questions to know by test dayent://SD_ILS/0/SD_ILS:2938512026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Williams, Lauren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-psychology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>MACHINA SAPIENS how intelligent machines passed turing's test (and what happened the next day).ent://SD_ILS/0/SD_ILS:5698062026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Cristianini, Nello.<br/>Yer Numarası Q325.5<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003582212">https://www.taylorfrancis.com/books/9781003582212</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Frontiers of test validity theory : measurement, causation, and meaningent://SD_ILS/0/SD_ILS:5551502026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Markus, Keith A., author. Borsboom, Denny, author.<br/>Yer Numarası BF39<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003398219">https://www.taylorfrancis.com/books/9781003398219</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dengue Diagnostics The Right Test at the Right Time for the Right Group.ent://SD_ILS/0/SD_ILS:5563622026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sekaran, Shamala Devi.<br/>Yer Numarası RA644 .D4<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032669564">https://www.taylorfrancis.com/books/9781032669564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>State-society relations around the world through the lens of the COVID-19 pandemic : rapid-testent://SD_ILS/0/SD_ILS:5859532026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Duca, Federica, editor. Meny-Gibert, Sarah, editor.<br/>Yer Numarası RA644 .C67<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003321545">https://www.taylorfrancis.com/books/9781003321545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A test of morals : surgical, ethical, and psychosocial considerations in human head transplantationent://SD_ILS/0/SD_ILS:5869782026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Furr, L. Allen, author.<br/>Yer Numarası RD594.12<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003367017">https://www.taylorfrancis.com/books/9781003367017</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing of Materials for Fire Protection Needs European Standard Test Methods for the Building Sectorent://SD_ILS/0/SD_ILS:5275692026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Makovická Osvaldová, Linda. author. Fatriasari, Widya. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39711-0">https://doi.org/10.1007/978-3-031-39711-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>ACE THAT TEST a students guide to learning better.ent://SD_ILS/0/SD_ILS:5520982026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sumeracki, Megan, author.<br/>Yer Numarası LB1066<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003327530">https://www.taylorfrancis.com/books/9781003327530</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>SYSTEMATICALLY ANALYSING INDIRECT TRANSLATIONS putting the concatenation effect hypothesis to... the test.ent://SD_ILS/0/SD_ILS:5670642026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hadley, James (Researcher in literary translation), author.<br/>Yer Numarası P306.97 .I53<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429282768">https://www.taylorfrancis.com/books/9780429282768</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Parsa, Saeed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>British nuclear weapons and the test ban : squaring the circle of defence and arms control, 1974-82ent://SD_ILS/0/SD_ILS:5773322026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Walker, John R., 1960- author.<br/>Yer Numarası U264.5 .G7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003375708">https://www.taylorfrancis.com/books/9781003375708</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Educational accountability and American federalism : moving beyond a test-based approachent://SD_ILS/0/SD_ILS:5810632026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Portz, John, 1953- author.<br/>Yer Numarası LB2806.22<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003276890">https://www.taylorfrancis.com/books/9781003276890</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CALIFORNIA'S RECALL ELECTION OF GAVIN NEWSOM covid-19 and the test of leadership.ent://SD_ILS/0/SD_ILS:5635372026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Gerston, Larry N. Currin-Percival, Mary. Percival, Garrick L.<br/>Yer Numarası F866.4 .N498<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217954">https://www.taylorfrancis.com/books/9781003217954</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>SIGNAL DETECTION FOR MEDICAL SCIENTISTS; LIKELIHOOD RATIO TEST-BASED METHODOLOGYent://SD_ILS/0/SD_ILS:5545052026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tiwari, Ram (Ram C.), author. Zalkikar, Jyoti, author. Huang, Lan (Statistician), author.<br/>Yer Numarası RM301.27<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429259753">https://www.taylorfrancis.com/books/9780429259753</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pregnancy, delivery, childbirth : a gender and cultural history from antiquity to the test tube in Europeent://SD_ILS/0/SD_ILS:5641672026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Filippini, Nadia Maria, author. Boscolo, Clelia, translator.<br/>Yer Numarası RG511 .F4513 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429265457">https://www.taylorfrancis.com/books/9780429265457</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pluralism, poetry, and literacy : a test of reading and interpretive techniquesent://SD_ILS/0/SD_ILS:5709572026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kalck, Xavier, author.<br/>Yer Numarası PN81 .K24 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429200786">https://www.taylorfrancis.com/books/9780429200786</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A democratic theory of educational credibility : from test-based assessment to interpersonal responsibilityent://SD_ILS/0/SD_ILS:5583472026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Gottlieb, Derek, author.<br/>Yer Numarası LB2806.22 .G68 2020 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429019159">https://www.taylorfrancis.com/books/9780429019159</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Validity an integrated approach to test score meaning and useent://SD_ILS/0/SD_ILS:5825712026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Cizek, Gregory J.<br/>Yer Numarası LB3060.7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429291661">https://www.taylorfrancis.com/books/9780429291661</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>PSYCHOMETRICS OF STANDARD SETTING connecting policy and test scores.ent://SD_ILS/0/SD_ILS:5844652026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Reckase, Mark.<br/>Yer Numarası BF39<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429156410">https://www.taylorfrancis.com/books/9780429156410</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Larner, A. J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Roman, Adam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Irwing, Frederick Paul, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Place and Health as Complex Systems A Case Study and Empirical Testent://SD_ILS/0/SD_ILS:5193872026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Castellani, Brian. author. Rajaram, Rajeev. author. Buckwalter, J. Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Critical mm-Wave Components for Synthetic Automatic Test Systemsent://SD_ILS/0/SD_ILS:5296442026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hrobak, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Larner, A.J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RILEM Technical Committee 195-DTD Recommendation for Test Methods for AD and TD of Early Age Concrete Round Robin Documentation Report: Program, Test Results and Statistical Evaluationent://SD_ILS/0/SD_ILS:5297902026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bjøntegaard, Øyvind. author. Martius-Hammer, Tor Arne. author. Krauss, Matias. author. Budelmann, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-94-017-9266-0">https://doi.org/10.1007/978-94-017-9266-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:5386682026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Yer Numarası QA76.9 .C65 S56 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781482225501">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Evaluation of Aircraft Avionics and Weapon Systemsent://SD_ILS/0/SD_ILS:3649292026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar McShea, Robert E.<br/>Yer Numarası \(364929.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA507E">http://dx.doi.org/10.1049/SBRA507E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bates, Jan Wheeler. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICsent://SD_ILS/0/SD_ILS:4874052026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Characteristics of Virtual Learning Environments A Theoretical Integration and Empirical Test of Technology Acceptance and IS Success Researchent://SD_ILS/0/SD_ILS:3352402026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Müller, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335240.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instant penetration testing setting up a test lab how-to : set up your own penetration testing lab using practical and precise recipesent://SD_ILS/0/SD_ILS:3130442026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Fadyushin, Vyacheslav.<br/>Yer Numarası ONLINE(313044.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333066.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15772-1">http://dx.doi.org/10.1007/978-3-642-15772-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technologyent://SD_ILS/0/SD_ILS:3344202026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334420.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37398-5">http://dx.doi.org/10.1007/978-3-642-37398-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approachent://SD_ILS/0/SD_ILS:3309862026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System-Level Validation High-Level Modeling and Directed Test Generation Techniquesent://SD_ILS/0/SD_ILS:3312652026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Families of the missing a test for contemporary approaches to transitional justiceent://SD_ILS/0/SD_ILS:3445352026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Robins, Simon.<br/>Yer Numarası ONLINE(344535.1)<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203517079">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Psychiatric mental health nursing success a course review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2805972026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Curtis, Cathy Melfi. Fegley, Audra Baker. Tuzo, Carol Norton.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Is There a Court for Gaza? A Test Bench for International Justiceent://SD_ILS/0/SD_ILS:2056722026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Meloni, Chantal. editor. Tognoni, Gianni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-6704-820-0">http://dx.doi.org/10.1007/978-90-6704-820-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals success a Q & A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803162026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Assessing neuromotor readiness for learning the INPP developmental screening test and school intervention programmeent://SD_ILS/0/SD_ILS:3054912026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Goddard, Sally, 1957- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119945017">An electronic book accessible through the World Wide Web; click for information</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119970682.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119970682.jpg</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Refinement of Econometric Estimation and Test Procedures Finite Sample and Asymptotic Analysisent://SD_ILS/0/SD_ILS:2370032026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Phillips, Garry D. A.. Tzavalis, Elias.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511493157">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software : requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:5401562026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Merkow, Mark S., author. Raghavan, Lakshmikanth.<br/>Yer Numarası QA76.76 .T48 M47 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439866221">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>High Quality Test Pattern Generation and Boolean Satisfiabilityent://SD_ILS/0/SD_ILS:1733602026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in-Self-Test and Digital Self-Calibration for RF SoCsent://SD_ILS/0/SD_ILS:1732422026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9548-3">http://dx.doi.org/10.1007/978-1-4419-9548-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. 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author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7548-5">http://dx.doi.org/10.1007/978-1-4419-7548-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Streamline numerical well test interpretation theory and methodent://SD_ILS/0/SD_ILS:1485172026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Jun, Yao. Wu, Minglu.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123860279">http://www.sciencedirect.com/science/book/9780123860279</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical models for test equating, scaling, and linkingent://SD_ILS/0/SD_ILS:1446462026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Davier, Alina A. von.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a 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Ehsanes. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471773751">http://dx.doi.org/10.1002/0471773751</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Goodwillbilanzierung und Informationsvermittlung nach internationalen Rechnungslegungsstandards Business Combinations (IFRS, US-GAAP), Kaufpreisallokation, Impairment Test, Konvergenzbestrebungenent://SD_ILS/0/SD_ILS:2032942026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lopatta, Kerstin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8350-9211-2">http://dx.doi.org/10.1007/978-3-8350-9211-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>.NET Test Automation Recipes A Problem-Solution Approachent://SD_ILS/0/SD_ILS:1708682026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar McCaffrey, James D. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-0163-2">http://dx.doi.org/10.1007/978-1-4302-0163-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Make and Test Projects in Engineering Design Creativity, Engagement and Learningent://SD_ILS/0/SD_ILS:1753612026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Samuel, Andrew Emery. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-285-3">http://dx.doi.org/10.1007/1-84628-285-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™ent://SD_ILS/0/SD_ILS:1660492026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and development of medical electronic instrumentation a practical perspective of the design, construction, and test of medical devicesent://SD_ILS/0/SD_ILS:3188412026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Prutchi, David. Norris, Michael.<br/>Yer Numarası ONLINE(318841.1)<br/>Elektronik Erişim <a href="http://www.contentreserve.com/TitleInfo.asp?ID={0BB5C1F5-EFCF-4766-BDBA-63A640B37565}&Format=50">Click for information</a>
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James.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=102059">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=102059</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Using test data in clinical practice a handbook for mental health professionalsent://SD_ILS/0/SD_ILS:3698972026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar MacCluskie, Kathryn C. Welfel, Elizabeth Reynolds, 1949- Toman, Sarah M.<br/>Yer Numarası ONLINE(369897.1)<br/>Elektronik Erişim SAGE knowledge <a href="http://sk.sagepub.com/books/using-test-data-in-clinical-practice">http://sk.sagepub.com/books/using-test-data-in-clinical-practice</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Well test analysis the use of advanced interpretation modelsent://SD_ILS/0/SD_ILS:2554492026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bourdet, Dominique.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444509680">http://www.sciencedirect.com/science/book/9780444509680</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The total CISSP exam prep book : practice questions, answers, and test taking tips and techniquesent://SD_ILS/0/SD_ILS:5389642026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Peltier, Thomas R., author. Howard, Patrick D.<br/>Yer Numarası TK5105.59 .P454 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420031447">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Cell culture models of biological barriers : in vitro test systems for drug absorption and deliveryent://SD_ILS/0/SD_ILS:5463222026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lehr, Claus-Michael, 1961-<br/>Yer Numarası RM301.25 .C454 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781134473458">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical radio frequency test and measurement a technician's handbookent://SD_ILS/0/SD_ILS:2546922026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Carr, Joseph J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671613">http://www.sciencedirect.com/science/book/9780750671613</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>PDCA/Test : a quality tool framework for software testingent://SD_ILS/0/SD_ILS:5439272026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lewis, William E.<br/>Yer Numarası QA76.76 .T48 L49 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429131769">https://www.taylorfrancis.com/books/9780429131769</a>
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P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126897500">http://www.sciencedirect.com/science/book/9780126897500</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The science of sound recordingent://SD_ILS/0/SD_ILS:2671032026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CE marking handbook a practical approach to global safety certificationent://SD_ILS/0/SD_ILS:2543652026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lohbeck, David, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750698191">http://www.sciencedirect.com/science/book/9780750698191</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's DATent://SD_ILS/0/SD_ILS:2940062026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Evangelist, Thomas A. Hanks, Wendy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-dat-cdrom">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's GMATent://SD_ILS/0/SD_ILS:2940422026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hasik, James. Rudnick, Stacey. Hackney, Ryan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-gmat-2011-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's CBESTent://SD_ILS/0/SD_ILS:2940442026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar McGraw-Hill Companies.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-cbest">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MCATent://SD_ILS/0/SD_ILS:2940562026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hademenos, George J. McCloskey, Candice J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mcat-cdrom-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the Emergency Medicine Oral Boardsent://SD_ILS/0/SD_ILS:2937212026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Howes, David S. Gupta, Rohit. Waples-Trefil, Flora J. Pillow, M. 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Matthew. Kaufman, Matthew S. Mishra, Nitin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-surgery-clerkship">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the emergency medicine boardsent://SD_ILS/0/SD_ILS:2937142026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Blok, Barbara K. Cheung, Dickson S. Platts-Mills, Timothy Fortescue.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-boards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid radiology for the wardsent://SD_ILS/0/SD_ILS:2937152026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Stead, Latha G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-radiology-for-wards">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the medicine clerkshipent://SD_ILS/0/SD_ILS:2937162026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kaufman, Matthew S. Stead, Latha G. Rusovici, Arthur.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-medicine-clerkship-third-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the pediatric boardsent://SD_ILS/0/SD_ILS:2937172026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Le, Tao.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-pediatric-boards-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the COMLEX an osteopathic manipulative medicine reviewent://SD_ILS/0/SD_ILS:2937182026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Nye, Zachary. Huxley, Stephen M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-for-comlex-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the NBDE. 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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid Q&A for the NBDE part Ient://SD_ILS/0/SD_ILS:2937202026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Steinbacher, Derek M. (Derek Matthew) Sierakowski, Steven R. (Steven Robert)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/first-aid-qa-for-nbde-part-i">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's PCATent://SD_ILS/0/SD_ILS:2940572026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hademenos, George J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A. Whitener, Mark A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-pcat">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>REDESIGNING JUSTICE FOR PLURAL SOCIETIES case studies of minority accommodation from around the globeent://SD_ILS/0/SD_ILS:5587472026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar (Re)designing Justice for Plural Societies: Accommodative Practices Put to the Test (Conference) (2017 : Max Planck Institut für ethnologische Forschung) Alidadi, Katayoun, editor. Foblets, Marie-Claire, 1959- editor. Müller, Dominik M., editor. Max-Planck-Institut für ethnologische Forschung, sponsoring body.<br/>Yer Numarası K3242 .A6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003224174">https://www.taylorfrancis.com/books/9781003224174</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The lieutenant nun : annotated translation of the play, historical accounts and documents about Antonio/Catalina de Erausoent://SD_ILS/0/SD_ILS:5646252026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Albalá Pelegrín, Marta, editor. Test, Edward McLean, editor. Velasco, Sherry M. (Sherry Marie), 1962- writer of foreword. Chess, Simone, 1980- writer of afterword. Kemp, Sawyer K., writer of afterword.<br/>Yer Numarası CT1358 .E7<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003291732">https://www.taylorfrancis.com/books/9781003291732</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information security management handbookent://SD_ILS/0/SD_ILS:5428312026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Tipton, Harold F. Krause, Micki.<br/>Yer Numarası QA76.9 .A25 I54165 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420003406">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>UNDERSTANDING AND HELPING TO OVERCOME EXAM ANXIETY what is it, why is it important and where... does it come from?.ent://SD_ILS/0/SD_ILS:5563772026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Putwain, David.<br/>Yer Numarası LB3060.6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032716411">https://www.taylorfrancis.com/books/9781032716411</a>
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OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>COMMUNICATION SKILLS FOR YOUR POLICING DEGREEent://SD_ILS/0/SD_ILS:5718322026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bottomley, Jane (Senior language tutor), auteur. Pryjmachuk, Steven, 1964- author. Wright, Martin, Dr., author.<br/>Yer Numarası HV7936 .C8<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054658">https://www.taylorfrancis.com/books/9781041054658</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Critical thinking skills for your policing degreeent://SD_ILS/0/SD_ILS:5737602026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bottomley, Jane (Senior language tutor), author. Pryjmachuk, Steven, 1964- author. Wright, Martin (Writer on policing), author.<br/>Yer Numarası HV8195 .A4<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054887">https://www.taylorfrancis.com/books/9781041054887</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>English language mediated settings and educational inequalities : language education policy agendas in the South Pacificent://SD_ILS/0/SD_ILS:5590962026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Goundar, Prashneel R., author.<br/>Yer Numarası PE1068 .O3<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003479147">https://www.taylorfrancis.com/books/9781003479147</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>ACADEMIC WRITING AND REFERENCING FOR YOUR POLICING DEGREEent://SD_ILS/0/SD_ILS:5785882026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bottomley, Jane (Senior language tutor), author. Pryjmachuk, Steven, 1964- author. Wright, Martin (Writer on policing), author.<br/>Yer Numarası RT24<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054054">https://www.taylorfrancis.com/books/9781041054054</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Research Challenges in Information Science: Information Science and the Connected World 17th International Conference, RCIS 2023, Corfu, Greece, May 23-26, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205802026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Nurcan, Selmin. editor. Opdahl, Andreas L. editor. Mouratidis, Haralambos. editor. Tsohou, Aggeliki. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33080-3">https://doi.org/10.1007/978-3-031-33080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Intelligence 8th International Conference, CBI 2023, Istanbul, Turkey, July 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205962026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar El Ayachi, Rachid. editor. Fakir, Mohamed. editor. Baslam, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37872-0">https://doi.org/10.1007/978-3-031-37872-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Science 9th International Conference of Pioneering Computer Scientists, Engineers and Educators, ICPCSEE 2023, Harbin, China, September 22-24, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5206882026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Yu, Zhiwen. editor. Han, Qilong. editor. Wang, Hongzhi. editor. Guo, Bin. editor. Zhou, Xiaokang. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5968-6">https://doi.org/10.1007/978-981-99-5968-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5207992026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Image and Graphics 12th International Conference, ICIG 2023, Nanjing, China, September 22-24, 2023, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5212682026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lu, Huchuan. editor. Ouyang, Wanli. editor. Huang, Hui. editor. Lu, Jiwen. editor. Liu, Risheng. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46311-2">https://doi.org/10.1007/978-3-031-46311-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rigorous State-Based Methods 9th International Conference, ABZ 2023, Nancy, France, May 30-June 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212952026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Glässer, Uwe. editor. Creissac Campos, Jose. editor. Méry, Dominique. editor. Palanque, Philippe. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33163-3">https://doi.org/10.1007/978-3-031-33163-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mobile Web and Intelligent Information Systems 19th International Conference, MobiWIS 2023, Marrakech, Morocco, August 14-16, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213022026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Younas, Muhammad. editor. Awan, Irfan. editor. Grønli, Tor-Morten. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39764-6">https://doi.org/10.1007/978-3-031-39764-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Performance Computing ISC High Performance 2023 International Workshops, Hamburg, Germany, May 21-25, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5213052026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bienz, Amanda. editor. Weiland, Michèle. editor. Baboulin, Marc. editor. Kruse, Carola. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40843-4">https://doi.org/10.1007/978-3-031-40843-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lipoprotein(a)ent://SD_ILS/0/SD_ILS:5215672026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kostner, Karam. editor. Kostner, Gerhard M. editor. Toth, Peter P. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24575-6">https://doi.org/10.1007/978-3-031-24575-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Occupational Dermatosesent://SD_ILS/0/SD_ILS:5216382026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Giménez-Arnau, Ana M. editor. Maibach, Howard I. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22727-1">https://doi.org/10.1007/978-3-031-22727-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unlearn Pain The Successful Techniques And Exercises Of Psychological Pain Managementent://SD_ILS/0/SD_ILS:5216872026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Richter, Jutta. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65702-7">https://doi.org/10.1007/978-3-662-65702-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thyroid FNA Cytology Differential Diagnoses and Pitfallsent://SD_ILS/0/SD_ILS:5222622026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kakudo, Kennichi. editor. Liu, Zhiyan. editor. Jung, Chan Kwon. editor. Hirokawa, Mitsuyoshi. editor. Bychkov, Andrey. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6782-7">https://doi.org/10.1007/978-981-99-6782-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Helicobacter pylorient://SD_ILS/0/SD_ILS:5222792026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kim, Nayoung. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0013-4">https://doi.org/10.1007/978-981-97-0013-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Intelligent Data Analysis XXI 21st International Symposium on Intelligent Data Analysis, IDA 2023, Louvain-la-Neuve, Belgium, April 12-14, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208372026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Crémilleux, Bruno. editor. Hess, Sibylle. editor. Nijssen, Siegfried. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30047-9">https://doi.org/10.1007/978-3-031-30047-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental Approaches to Software Engineering 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, Paris, France, April 22-27, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208412026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lambers, Leen. editor. Uchitel, Sebastián. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30826-0">https://doi.org/10.1007/978-3-031-30826-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analysis, Verification and Transformation for Declarative Programming and Intelligent Systems Essays Dedicated to Manuel Hermenegildo on the Occasion of His 60th Birthdayent://SD_ILS/0/SD_ILS:5208642026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Lopez-Garcia, Pedro. editor. Gallagher, John P. editor. Giacobazzi, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31476-6">https://doi.org/10.1007/978-3-031-31476-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structured Object-Oriented Formal Language and Method 11th International Workshop, SOFL+MSVL 2022, Madrid, Spain, October 24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5209112026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Liu, Shaoying. editor. Duan, Zhenhua. editor. Liu, Ai. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29476-1">https://doi.org/10.1007/978-3-031-29476-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210022026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36616-1">https://doi.org/10.1007/978-3-031-36616-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211022026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Prevosto, Virgile. editor. Seceleanu, Cristina. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-38828-6">https://doi.org/10.1007/978-3-031-38828-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Software Engineering 10th International Conference, FSEN 2023, Tehran, Iran, May 4-5, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5211202026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Hojjat, Hossein. editor. Ábrahám, Erika. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42441-0">https://doi.org/10.1007/978-3-031-42441-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5211252026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar De Paolis, Lucio Tommaso. editor. Arpaia, Pasquale. editor. Sacco, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43404-4">https://doi.org/10.1007/978-3-031-43404-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Service-Oriented and Cloud Computing 10th IFIP WG 6.12 European Conference, ESOCC 2023, Larnaca, Cyprus, October 24-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212392026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Papadopoulos, George A. editor. (orcid) Rademacher, Florian. editor. Soldani, Jacopo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46235-1">https://doi.org/10.1007/978-3-031-46235-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information and Communications Security 25th International Conference, ICICS 2023, Tianjin, China, November 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212502026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Wang, Ding. editor. Yung, Moti. editor. (orcid) Liu, Zheli. editor. Chen, Xiaofeng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7356-9">https://doi.org/10.1007/978-981-99-7356-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Semantic Web: ESWC 2023 Satellite Events Hersonissos, Crete, Greece, May 28 - June 1, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212512026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Pesquita, Catia. editor. Skaf-Molli, Hala. editor. Efthymiou, Vasilis. editor. Kirrane, Sabrina. editor. Ngonga, Axel. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43458-7">https://doi.org/10.1007/978-3-031-43458-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evolutionary Multi-Criterion Optimization 12th International Conference, EMO 2023, Leiden, The Netherlands, March 20-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213852026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Emmerich, Michael. editor. Deutz, André. editor. Wang, Hao. editor. Kononova, Anna V. editor. Naujoks, Boris. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27250-9">https://doi.org/10.1007/978-3-031-27250-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 22nd International Conference, ICAISC 2023, Zakopane, Poland, June 18-22, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213092026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42505-9">https://doi.org/10.1007/978-3-031-42505-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Functional Neuroradiology Principles and Clinical Applicationsent://SD_ILS/0/SD_ILS:5215812026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Faro, Scott H. editor. Mohamed, Feroze B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-10909-6">https://doi.org/10.1007/978-3-031-10909-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Character Building and Competence Development in Medical and Health Professions Education The First Biennial Indonesian Medical and Health Professions Education Conferenceent://SD_ILS/0/SD_ILS:5219502026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Claramita, Mora. editor. Soemantri, Diantha. editor. Hidayah, Rachmadya Nur. editor. Findyartini, Ardi. editor. Samarasekera, Dujeepa D. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-4573-3">https://doi.org/10.1007/978-981-99-4573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Neuroanatomy for the Boards and the Clinic Finding the Lesionent://SD_ILS/0/SD_ILS:5219862026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Leo, Jonathan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41123-6">https://doi.org/10.1007/978-3-031-41123-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical Guide to Hereditary Breast and Ovarian Cancer Annual Meeting of the Japanese Organization of Hereditary Breast and Ovarian Cancer 2021ent://SD_ILS/0/SD_ILS:5220122026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Aoki, Daisuke. editor. Nakamura, Seigo. editor. Miki, Yoshio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5231-1">https://doi.org/10.1007/978-981-99-5231-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Sleep Medicineent://SD_ILS/0/SD_ILS:5220172026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Thomas, Robert J. editor. Bhat, Sushanth. editor. Chokroverty, Sudhansu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34625-5">https://doi.org/10.1007/978-3-031-34625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point-of-care US for Acute Abdomenent://SD_ILS/0/SD_ILS:5220542026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Zago, Mauro. editor. Troian, Marina. editor. Mariani, Diego. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40231-9">https://doi.org/10.1007/978-3-031-40231-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Normal Pressure Hydrocephalus Pathophysiology, Diagnosis, Treatment and Outcomeent://SD_ILS/0/SD_ILS:5220692026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bradac, Ondrej. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36522-5">https://doi.org/10.1007/978-3-031-36522-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Down Syndrome Screening A Practical Guideent://SD_ILS/0/SD_ILS:5221832026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Kamat, Abhijit. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7758-1">https://doi.org/10.1007/978-981-99-7758-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Protocols in Endocrinologyent://SD_ILS/0/SD_ILS:5221852026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Bhadada, Sanjay. editor. Das, Liza. editor. Pal, Rimesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6653-8">https://doi.org/10.1007/978-981-19-6653-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Flight Testing Analysis of the Spin Dynamics of a Single-Engine Low-Wing Aeroplaneent://SD_ILS/0/SD_ILS:5274232026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Schrader, Steffen Haakon. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-63218-5">https://doi.org/10.1007/978-3-662-63218-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>12th International Conference on Structural Engineering and Construction Management Proceedings of the ICSECM 2021ent://SD_ILS/0/SD_ILS:5273862026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dissanayake, Ranjith. editor. Mendis, Priyan. editor. Weerasekera, Kolita. editor. De Silva, Sudhira. editor. Fernando, Shiromal. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2886-4">https://doi.org/10.1007/978-981-19-2886-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Machine Learning Support for Fault Diagnosis of System-on-Chipent://SD_ILS/0/SD_ILS:5275272026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Topics in Modal Analysis & Parameter Identification, Volume 8 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5275772026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dilworth, Brandon J. editor. Marinone, Timothy. editor. Mains, Michael. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05445-7">https://doi.org/10.1007/978-3-031-05445-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the Munich Symposium on Lightweight Design 2021 Tagungsband zum Münchner Leichtbauseminar 2021ent://SD_ILS/0/SD_ILS:5275782026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Rieser, Jasper. editor. (orcid)0000-0002-0367-0224 Endress, Felix. editor. Horoschenkoff, Alexander. editor. Höfer, Philipp. editor. (orcid)0000-0001-9090-1643 Dickhut, Tobias. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65216-9">https://doi.org/10.1007/978-3-662-65216-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practice of Discrete Element Method in Soil-Structure Interface Modellingent://SD_ILS/0/SD_ILS:5275822026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Zhou, Wan-Huan. author. Yin, Zhen-Yu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-0047-1">https://doi.org/10.1007/978-981-19-0047-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability-Based Multi-objective Optimization for Material Selectionent://SD_ILS/0/SD_ILS:5275832026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Zheng, Maosheng. author. Teng, Haipeng. author. Yu, Jie. author. Cui, Ying. author. Wang, Yi. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3351-6">https://doi.org/10.1007/978-981-19-3351-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reservoir Ecotoxicologyent://SD_ILS/0/SD_ILS:5276992026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Pei, De-Sheng. author. Hamid, Naima. author. Sultan, Marriya. author. Thodhal Yoganandham, Suman. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26344-6">https://doi.org/10.1007/978-3-031-26344-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Intelligent Technologies: Concepts, Applications, and Future Directions, Volume 2ent://SD_ILS/0/SD_ILS:5278012026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dash, Satya Ranjan. editor. Das, Himansu. editor. Li, Kuan-Ching. editor. Tello, Esau Villatoro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-1482-1">https://doi.org/10.1007/978-981-99-1482-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>New Energy Vehicle Powertrain Technologies and Applicationsent://SD_ILS/0/SD_ILS:5278952026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Chen, Yong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9566-8">https://doi.org/10.1007/978-981-19-9566-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Platform Based Design and Immersive Technologies for Manufacturing and Assembly in Offsite Construction Applying Extended Reality and Game Applications to PDfMAent://SD_ILS/0/SD_ILS:5279762026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Potseluyko, Lilia. author. Pour Rahimian, Farzad. author. Dawood, Nashwan. author. (orcid)0000-0002-4873-7576 Elghaish, Faris. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32993-7">https://doi.org/10.1007/978-3-031-32993-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>13th World Congress of Performance Analysis of Sport and 13th International Symposium on Computer Science in Sportent://SD_ILS/0/SD_ILS:5280972026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Baca, Arnold. editor. Exel, Juliana. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31772-9">https://doi.org/10.1007/978-3-031-31772-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dynamic Substructures, Volume 4 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5281702026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Allen, Matthew. editor. D'Ambrogio, Walter. editor. Roettgen, Dan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04094-8">https://doi.org/10.1007/978-3-031-04094-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nonlinear Structures & Systems, Volume 1 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5281722026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Brake, Matthew R.W. editor. Renson, Ludovic. editor. Kuether, Robert J. editor. Tiso, Paolo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04086-3">https://doi.org/10.1007/978-3-031-04086-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5281732026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Walber, Chad. editor. Stefanski, Matthew. editor. Harvie, Julie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05415-0">https://doi.org/10.1007/978-3-031-05415-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of International Conference on Intelligent Vision and Computing (ICIVC 2022) Volume 1ent://SD_ILS/0/SD_ILS:5282172026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sharma, Harish. editor. Saha, Apu Kumar. editor. Prasad, Mukesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31164-2">https://doi.org/10.1007/978-3-031-31164-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the National Aerospace Propulsion Conference Select Proceedings of NAPC 2020ent://SD_ILS/0/SD_ILS:5282742026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Sivaramakrishna, Gullapalli. editor. Kishore Kumar, S. editor. Raghunandan, B. N. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2378-4">https://doi.org/10.1007/978-981-19-2378-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Forming, Machining and Automation Select Proceedings of AIMTDR 2021ent://SD_ILS/0/SD_ILS:5283042026-01-11T23:18:54Z2026-01-11T23:18:54ZYazar Dixit, Uday S. editor. Kanthababu, M. editor. Ramesh Babu, A. editor. Udhayakumar, S. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-3866-5">https://doi.org/10.1007/978-981-19-3866-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>