Arama Sonuçları Test. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300$0026isd$003dtrue?2024-11-11T01:41:37ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:2895492024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Walton, William Clarence.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042931">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:2896732024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Ilgenfritz, Merle. Ilgenfritz, John. Powell, John Wesley, 1834-1902 Baca, Steven.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420066005">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:2756052024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Broemeling, Lyle D., 1939-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439838792">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete mix design and test methodsent://SD_ILS/0/SD_ILS:2906382024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kett, Irving.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420091175">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:2908792024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Gruijter, Dato N. de. Kamp, Leo J. Th. van der.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781584889595">Distributed by publisher. 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(Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English literature questions to know by test dayent://SD_ILS/0/SD_ILS:2938352024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Miller, Shveta Verma.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Demeter, Scott E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP psychology questions to know by test dayent://SD_ILS/0/SD_ILS:2938512024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Williams, Lauren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-psychology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Yer Numarası XX(520291.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Parsa, Saeed. author. SpringerLink (Online service)<br/>Yer Numarası XX(520377.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521852.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Larner, A. J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Irwing, Frederick Paul, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Roman, Adam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:3571002024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Yer Numarası ONLINE(357100.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781482225501">Distributed by publisher. 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Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Yer Numarası XX(519387.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Larner, A.J. author. SpringerLink (Online service)<br/>Yer Numarası XX(519458.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bates, Jan Wheeler. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Evaluation of Aircraft Avionics and Weapon Systemsent://SD_ILS/0/SD_ILS:3649292024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar McShea, Robert E.<br/>Yer Numarası \(364929.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA507E">http://dx.doi.org/10.1049/SBRA507E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software test attacks to break mobile and embedded devicesent://SD_ILS/0/SD_ILS:3428682024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hagar, Jon Duncan, author.<br/>Yer Numarası ONLINE(342868.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466575318">Distributed by publisher. 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href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approachent://SD_ILS/0/SD_ILS:3309862024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a 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Numarası ONLINE(335240.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System-Level Validation High-Level Modeling and Directed Test Generation Techniquesent://SD_ILS/0/SD_ILS:3312652024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333066.1)<br/>Elektronik Erişim <a 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Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:2907992024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Merkow, Mark S. Raghavan, Lakshmikanth.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439866221">Distributed by publisher. 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Proceedingsent://SD_ILS/0/SD_ILS:1970902024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals success a Q & A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803162024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Is There a Court for Gaza? A Test Bench for International Justiceent://SD_ILS/0/SD_ILS:2056722024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Meloni, Chantal. editor. Tognoni, Gianni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-6704-820-0">http://dx.doi.org/10.1007/978-90-6704-820-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Refinement of Econometric Estimation and Test Procedures Finite Sample and Asymptotic Analysisent://SD_ILS/0/SD_ILS:2370032024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Phillips, Garry D. 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(orcid) Nguyen, Thanh Dung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520373.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28790-9">https://doi.org/10.1007/978-3-031-28790-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Enterprise, Business-Process and Information Systems Modeling 24th International Conference, BPMDS 2023, and 28th International Conference, EMMSAD 2023, Zaragoza, Spain, June 12-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5204212024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar van der Aa, Han. editor. Bork, Dominik. editor. (orcid) Proper, Henderik A. editor. Schmidt, Rainer. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520421.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34241-7">https://doi.org/10.1007/978-3-031-34241-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5203192024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520319.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2446-2">https://doi.org/10.1007/978-981-99-2446-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT and Big Data Technologies for Health Care Third EAI International Conference, IoTCare 2022, Virtual Event, December 12-13, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203252024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Wang, Shuihua. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520325.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33545-7">https://doi.org/10.1007/978-3-031-33545-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Supported Education 14th International Conference, CSEDU 2022, Virtual Event, April 22-24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5204462024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Uhomoibhi, James. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520446.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40501-3">https://doi.org/10.1007/978-3-031-40501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pervasive Computing Technologies for Healthcare 16th EAI International Conference, PervasiveHealth 2022, Thessaloniki, Greece, December 12-14, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204582024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Tsanas, Athanasios. editor. Triantafyllidis, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520458.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34586-9">https://doi.org/10.1007/978-3-031-34586-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Research Challenges in Information Science: Information Science and the Connected World 17th International Conference, RCIS 2023, Corfu, Greece, May 23-26, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205802024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Nurcan, Selmin. editor. Opdahl, Andreas L. editor. Mouratidis, Haralambos. editor. Tsohou, Aggeliki. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520580.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33080-3">https://doi.org/10.1007/978-3-031-33080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Intelligence 8th International Conference, CBI 2023, Istanbul, Turkey, July 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205962024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar El Ayachi, Rachid. editor. Fakir, Mohamed. editor. Baslam, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520596.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37872-0">https://doi.org/10.1007/978-3-031-37872-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>6GN for Future Wireless Networks 5th EAI International Conference, 6GN 2022, Harbin, China, December 17-18, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5204902024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Li, Ao. editor. Shi, Yao. editor. Xi, Liang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520490.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36011-4">https://doi.org/10.1007/978-3-031-36011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Computing and Data Sciences 7th International Conference, ICACDS 2023, Kolkata, India, April 27-28, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205212024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Singh, Mayank. editor. Tyagi, Vipin. editor. Gupta, P.K. editor. Flusser, Jan. editor. Ören, Tuncer. editor.<br/>Yer Numarası XX(520521.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37940-6">https://doi.org/10.1007/978-3-031-37940-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5207522024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520752.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23944-1">https://doi.org/10.1007/978-3-031-23944-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analysis, Verification and Transformation for Declarative Programming and Intelligent Systems Essays Dedicated to Manuel Hermenegildo on the Occasion of His 60th Birthdayent://SD_ILS/0/SD_ILS:5208642024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lopez-Garcia, Pedro. editor. Gallagher, John P. editor. Giacobazzi, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520864.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31476-6">https://doi.org/10.1007/978-3-031-31476-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unconventional Computation and Natural Computation 20th International Conference, UCNC 2023, Jacksonville, FL, USA, March 13-17, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209562024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Genova, Daniela. editor. Kari, Jarkko. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520956.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34034-5">https://doi.org/10.1007/978-3-031-34034-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovative Technologies and Learning 6th International Conference, ICITL 2023, Porto, Portugal, August 28-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209652024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Huang, Yueh-Min. editor. (orcid) Rocha, Tânia. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520965.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40113-8">https://doi.org/10.1007/978-3-031-40113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>NASA Formal Methods 15th International Symposium, NFM 2023, Houston, TX, USA, May 16-18, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209842024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rozier, Kristin Yvonne. editor. Chaudhuri, Swarat. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520984.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33170-1">https://doi.org/10.1007/978-3-031-33170-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210022024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521002.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36616-1">https://doi.org/10.1007/978-3-031-36616-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521004.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing Software and Systems 35th IFIP WG 6.1 International Conference, ICTSS 2023, Bergamo, Italy, September 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211572024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bonfanti, Silvia. editor. Gargantini, Angelo. editor. Salvaneschi, Paolo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521157.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43240-8">https://doi.org/10.1007/978-3-031-43240-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rigorous State-Based Methods 9th International Conference, ABZ 2023, Nancy, France, May 30-June 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212952024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Glässer, Uwe. editor. Creissac Campos, Jose. editor. Méry, Dominique. editor. Palanque, Philippe. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(521295.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33163-3">https://doi.org/10.1007/978-3-031-33163-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Performance Computing ISC High Performance 2023 International Workshops, Hamburg, Germany, May 21-25, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5213052024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bienz, Amanda. editor. Weiland, Michèle. editor. Baboulin, Marc. editor. Kruse, Carola. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521305.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40843-4">https://doi.org/10.1007/978-3-031-40843-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 22nd International Conference, ICAISC 2023, Zakopane, Poland, June 18-22, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213092024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(521309.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42505-9">https://doi.org/10.1007/978-3-031-42505-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Functional Neuroradiology Principles and Clinical Applicationsent://SD_ILS/0/SD_ILS:5215812024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Faro, Scott H. editor. Mohamed, Feroze B. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521581.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-10909-6">https://doi.org/10.1007/978-3-031-10909-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Occupational Dermatosesent://SD_ILS/0/SD_ILS:5216382024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Giménez-Arnau, Ana M. editor. Maibach, Howard I. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521638.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22727-1">https://doi.org/10.1007/978-3-031-22727-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Character Building and Competence Development in Medical and Health Professions Education The First Biennial Indonesian Medical and Health Professions Education Conferenceent://SD_ILS/0/SD_ILS:5219502024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Claramita, Mora. editor. Soemantri, Diantha. editor. Hidayah, Rachmadya Nur. editor. Findyartini, Ardi. editor. Samarasekera, Dujeepa D. editor.<br/>Yer Numarası XX(521950.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-4573-3">https://doi.org/10.1007/978-981-99-4573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Neuroanatomy for the Boards and the Clinic Finding the Lesionent://SD_ILS/0/SD_ILS:5219862024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Leo, Jonathan. author. SpringerLink (Online service)<br/>Yer Numarası XX(521986.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41123-6">https://doi.org/10.1007/978-3-031-41123-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical Guide to Hereditary Breast and Ovarian Cancer Annual Meeting of the Japanese Organization of Hereditary Breast and Ovarian Cancer 2021ent://SD_ILS/0/SD_ILS:5220122024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Aoki, Daisuke. editor. Nakamura, Seigo. editor. Miki, Yoshio. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522012.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5231-1">https://doi.org/10.1007/978-981-99-5231-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Sleep Medicineent://SD_ILS/0/SD_ILS:5220172024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Thomas, Robert J. editor. Bhat, Sushanth. editor. Chokroverty, Sudhansu. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522017.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34625-5">https://doi.org/10.1007/978-3-031-34625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point-of-care US for Acute Abdomenent://SD_ILS/0/SD_ILS:5220542024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Zago, Mauro. editor. Troian, Marina. editor. Mariani, Diego. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522054.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40231-9">https://doi.org/10.1007/978-3-031-40231-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Normal Pressure Hydrocephalus Pathophysiology, Diagnosis, Treatment and Outcomeent://SD_ILS/0/SD_ILS:5220692024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bradac, Ondrej. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522069.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36522-5">https://doi.org/10.1007/978-3-031-36522-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5201942024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520194.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23950-2">https://doi.org/10.1007/978-3-031-23950-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Cognitive Science and Communications Selected Articles from the 5th International Conference on Communications and Cyber-Physical Engineering (ICCCE 2022), Hyderabad, Indiaent://SD_ILS/0/SD_ILS:5202992024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kumar, Amit. editor. Mozar, Stefan. editor. Haase, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520299.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8086-2">https://doi.org/10.1007/978-981-19-8086-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206062024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Fernandes, José Maria. editor. Travassos, Guilherme H. editor. Lenarduzzi, Valentina. editor. Li, Xiaozhou. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520606.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Production Management Systems. Production Management Systems for Responsible Manufacturing, Service, and Logistics Futures IFIP WG 5.7 International Conference, APMS 2023, Trondheim, Norway, September 17-21, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5206112024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Alfnes, Erlend. editor. Romsdal, Anita. editor. Strandhagen, Jan Ola. editor. von Cieminski, Gregor. editor. Romero, David. editor.<br/>Yer Numarası XX(520611.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43666-6">https://doi.org/10.1007/978-3-031-43666-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Dynamic Data Driven Applications Systems Volume 2ent://SD_ILS/0/SD_ILS:5206142024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Darema, Frederica. editor. Blasch, Erik P. editor. Ravela, Sai. editor. Aved, Alex J. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520614.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27986-7">https://doi.org/10.1007/978-3-031-27986-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Science 9th International Conference of Pioneering Computer Scientists, Engineers and Educators, ICPCSEE 2023, Harbin, China, September 22-24, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5206882024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Yu, Zhiwen. editor. Han, Qilong. editor. Wang, Hongzhi. editor. Guo, Bin. editor. Zhou, Xiaokang. editor.<br/>Yer Numarası XX(520688.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5968-6">https://doi.org/10.1007/978-981-99-5968-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental Approaches to Software Engineering 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, Paris, France, April 22-27, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208412024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lambers, Leen. editor. Uchitel, Sebastián. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520841.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30826-0">https://doi.org/10.1007/978-3-031-30826-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Quality: Higher Software Quality through Zero Waste Development 15th International Conference, SWQD 2023, Munich, Germany, May 23-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5207662024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Mendez, Daniel. editor. Winkler, Dietmar. editor. Kross, Johannes. editor. Biffl, Stefan. editor. Bergsmann, Johannes. editor.<br/>Yer Numarası XX(520766.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31488-9">https://doi.org/10.1007/978-3-031-31488-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5207992024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(520799.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Interface and the Management of Information Thematic Area, HIMI 2023, Held as Part of the 25th HCI International Conference, HCII 2023, Copenhagen, Denmark, July 23-28, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5210332024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Mori, Hirohiko. editor. Asahi, Yumi. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521033.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35129-7">https://doi.org/10.1007/978-3-031-35129-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521134.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thyroid FNA Cytology Differential Diagnoses and Pitfallsent://SD_ILS/0/SD_ILS:5222622024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kakudo, Kennichi. editor. Liu, Zhiyan. editor. Jung, Chan Kwon. editor. Hirokawa, Mitsuyoshi. editor. Bychkov, Andrey. editor.<br/>Yer Numarası XX(522262.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6782-7">https://doi.org/10.1007/978-981-99-6782-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Helicobacter pylorient://SD_ILS/0/SD_ILS:5222792024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kim, Nayoung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522279.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0013-4">https://doi.org/10.1007/978-981-97-0013-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT Technologies for HealthCare 9th EAI International Conference, HealthyIoT 2022, Braga, Portugal, November 16-18, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5206672024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Spinsante, Susanna. editor. Iadarola, Grazia. editor. Paglialonga, Alessia. editor. Tramarin, Federico. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520667.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28663-6">https://doi.org/10.1007/978-3-031-28663-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Systems and Information Processing 7th International Conference, ICCSIP 2022, Fuzhou, China, December 17-18, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5207582024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Sun, Fuchun. editor. Cangelosi, Angelo. editor. Zhang, Jianwei. editor. Yu, Yuanlong. editor. Liu, Huaping. editor.<br/>Yer Numarası XX(520758.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0617-8">https://doi.org/10.1007/978-981-99-0617-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206822024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.<br/>Yer Numarası XX(520682.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36336-8">https://doi.org/10.1007/978-3-031-36336-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Intelligent Data Analysis XXI 21st International Symposium on Intelligent Data Analysis, IDA 2023, Louvain-la-Neuve, Belgium, April 12-14, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208372024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Crémilleux, Bruno. editor. Hess, Sibylle. editor. Nijssen, Siegfried. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520837.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30047-9">https://doi.org/10.1007/978-3-031-30047-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structured Object-Oriented Formal Language and Method 11th International Workshop, SOFL+MSVL 2022, Madrid, Spain, October 24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5209112024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Liu, Shaoying. editor. Duan, Zhenhua. editor. Liu, Ai. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520911.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29476-1">https://doi.org/10.1007/978-3-031-29476-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211022024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Prevosto, Virgile. editor. Seceleanu, Cristina. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521102.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-38828-6">https://doi.org/10.1007/978-3-031-38828-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Software Engineering 10th International Conference, FSEN 2023, Tehran, Iran, May 4-5, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5211202024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hojjat, Hossein. editor. Ábrahám, Erika. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521120.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42441-0">https://doi.org/10.1007/978-3-031-42441-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5211252024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar De Paolis, Lucio Tommaso. editor. Arpaia, Pasquale. editor. Sacco, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521125.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43404-4">https://doi.org/10.1007/978-3-031-43404-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Health Information Science 12th International Conference, HIS 2023, Melbourne, VIC, Australia, October 23-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212352024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Li, Yan. editor. Huang, Zhisheng. editor. Sharma, Manik. editor. Chen, Lu. editor. Zhou, Rui. editor.<br/>Yer Numarası XX(521235.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7108-4">https://doi.org/10.1007/978-981-99-7108-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Service-Oriented and Cloud Computing 10th IFIP WG 6.12 European Conference, ESOCC 2023, Larnaca, Cyprus, October 24-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212392024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Papadopoulos, George A. editor. (orcid) Rademacher, Florian. editor. Soldani, Jacopo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521239.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46235-1">https://doi.org/10.1007/978-3-031-46235-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information and Communications Security 25th International Conference, ICICS 2023, Tianjin, China, November 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212502024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Wang, Ding. editor. Yung, Moti. editor. (orcid) Liu, Zheli. editor. Chen, Xiaofeng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521250.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7356-9">https://doi.org/10.1007/978-981-99-7356-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Semantic Web: ESWC 2023 Satellite Events Hersonissos, Crete, Greece, May 28 - June 1, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212512024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Pesquita, Catia. editor. Skaf-Molli, Hala. editor. Efthymiou, Vasilis. editor. Kirrane, Sabrina. editor. Ngonga, Axel. editor.<br/>Yer Numarası XX(521251.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43458-7">https://doi.org/10.1007/978-3-031-43458-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Image and Graphics 12th International Conference, ICIG 2023, Nanjing, China, September 22-24, 2023, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5212682024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lu, Huchuan. editor. Ouyang, Wanli. editor. Huang, Hui. editor. Lu, Jiwen. editor. Liu, Risheng. editor.<br/>Yer Numarası XX(521268.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46311-2">https://doi.org/10.1007/978-3-031-46311-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mobile Web and Intelligent Information Systems 19th International Conference, MobiWIS 2023, Marrakech, Morocco, August 14-16, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213022024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Younas, Muhammad. editor. Awan, Irfan. editor. Grønli, Tor-Morten. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521302.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39764-6">https://doi.org/10.1007/978-3-031-39764-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Image Learning with Limited and Noisy Data Second International Workshop, MILLanD 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 8, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212262024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Xue, Zhiyun. editor. Antani, Sameer. editor. Zamzmi, Ghada. editor. Yang, Feng. editor. Rajaraman, Sivaramakrishnan. editor.<br/>Yer Numarası XX(521226.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44917-8">https://doi.org/10.1007/978-3-031-44917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in Artificial Intelligence 22nd EPIA Conference on Artificial Intelligence, EPIA 2023, Faial Island, Azores, September 5-8, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213632024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Moniz, Nuno. editor. Vale, Zita. editor. Cascalho, José. editor. Silva, Catarina. editor. Sebastião, Raquel. editor.<br/>Yer Numarası XX(521363.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-49008-8">https://doi.org/10.1007/978-3-031-49008-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evolutionary Multi-Criterion Optimization 12th International Conference, EMO 2023, Leiden, The Netherlands, March 20-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213852024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Emmerich, Michael. editor. Deutz, André. editor. Wang, Hao. editor. Kononova, Anna V. editor. Naujoks, Boris. editor.<br/>Yer Numarası XX(521385.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27250-9">https://doi.org/10.1007/978-3-031-27250-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence over Infrared Images for Medical Applications Second MICCAI Workshop, AIIIMA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214032024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kakileti, Siva Teja. editor. (orcid) Manjunath, Geetha. editor. Schwartz, Robert G. editor. Frangi, Alejandro F. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521403.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44511-8">https://doi.org/10.1007/978-3-031-44511-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphonomics in Human Body Movement. Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521404.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lipoprotein(a)ent://SD_ILS/0/SD_ILS:5215672024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kostner, Karam. editor. Kostner, Gerhard M. editor. Toth, Peter P. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521567.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24575-6">https://doi.org/10.1007/978-3-031-24575-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unlearn Pain The Successful Techniques And Exercises Of Psychological Pain Managementent://SD_ILS/0/SD_ILS:5216872024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Richter, Jutta. author. SpringerLink (Online service)<br/>Yer Numarası XX(521687.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65702-7">https://doi.org/10.1007/978-3-662-65702-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Down Syndrome Screening A Practical Guideent://SD_ILS/0/SD_ILS:5221832024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Kamat, Abhijit. author. SpringerLink (Online service)<br/>Yer Numarası XX(522183.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7758-1">https://doi.org/10.1007/978-981-99-7758-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Protocols in Endocrinologyent://SD_ILS/0/SD_ILS:5221852024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Bhadada, Sanjay. editor. Das, Liza. editor. Pal, Rimesh. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522185.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6653-8">https://doi.org/10.1007/978-981-19-6653-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensory evaluation practicesent://SD_ILS/0/SD_ILS:5224762024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Stone, Herbert, author. Bleibaum, Rebecca N., author. Thomas, Heather A., author.<br/>Yer Numarası XX(522476.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128153345">https://www.sciencedirect.com/science/book/9780128153345</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Influence of nutrients, bioactive compounds and plant extracts in liver diseasesent://SD_ILS/0/SD_ILS:5224932024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Alavian, Seyed Moayed.<br/>Yer Numarası XX(522493.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128164884">https://www.sciencedirect.com/science/book/9780128164884</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pocket guide to stress testingent://SD_ILS/0/SD_ILS:4245432024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Tighe, Dennis A., editor. Gentile, Bryon A., II, editor. Prededed by (work): Chung, Edward K. Pocket guide to stress testing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781119481737">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Curious about nature : a passion for fieldworkent://SD_ILS/0/SD_ILS:5062622024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Burt, Tim, 1951- editor. Thompson, D. B. A., 1958- editor.<br/>Yer Numarası LB2394 .C87 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781108552172">https://doi.org/10.1017/9781108552172</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Cambridge handbook of research methods in clinical psychologyent://SD_ILS/0/SD_ILS:5062582024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Wright, Aidan G. C., 1980- editor. Hallquist, Michael N., 1981- editor.<br/>Yer Numarası RC467.2 .C36 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781316995808">https://doi.org/10.1017/9781316995808</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Paediatric Radiology Rapid Reporting for FRCR Part 2Bent://SD_ILS/0/SD_ILS:4836942024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Paddock, Michael. author. Offiah, Amaka C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01965-5">https://doi.org/10.1007/978-3-030-01965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Law of remedies : a European perspectiveent://SD_ILS/0/SD_ILS:5062722024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Hofmann, Franz, 1981- editor. Kurz, Franziska (Writer on law), editor.<br/>Yer Numarası KJC4010 .L39 2019<br/>Elektronik Erişim <a href="https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK">https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modelling and Verification of Secure Examsent://SD_ILS/0/SD_ILS:4015712024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Giustolisi, Rosario. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67107-9">https://doi.org/10.1007/978-3-319-67107-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Creative teaching strategies for the nurse educatorent://SD_ILS/0/SD_ILS:3583632024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Herrman, Judith W., author.<br/>Yer Numarası RT71 .H47 2016<br/>Elektronik Erişim <a href="http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk">http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Process Mining Techniques in Business Environments Theoretical Aspects, Algorithms, Techniques and Open Challenges in Process Miningent://SD_ILS/0/SD_ILS:5183672024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Burattin, Andrea. author. SpringerLink (Online service)<br/>Yer Numarası XX(518367.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-17482-2">https://doi.org/10.1007/978-3-319-17482-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smart Cities, Green Technologies, and Intelligent Transport Systems 4th International Conference, SMARTGREENS 2015, and 1st International Conference VEHITS 2015, Lisbon, Portugal, May 20-22, 2015, Revised Selected Papersent://SD_ILS/0/SD_ILS:5183762024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Helfert, Markus. editor. Krempels, Karl-Heinz. editor. Klein, Cornel. editor. Donellan, Brian. editor. Guiskhin, Oleg. editor.<br/>Yer Numarası XX(518376.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-27753-0">https://doi.org/10.1007/978-3-319-27753-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Encyclopedia of Biometricsent://SD_ILS/0/SD_ILS:5184172024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Li, Stan Z. editor. Jain, Anil K. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518417.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4899-7488-4">https://doi.org/10.1007/978-1-4899-7488-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Internet of Things. IoT Infrastructures First International Summit, IoT360 2014, Rome, Italy, October 27-28, 2014, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5185342024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Giaffreda, Raffaele. editor. Cagáňová, Dagmar. editor. Li, Yong. editor. Riggio, Roberto. editor. Voisard, Agnès. editor.<br/>Yer Numarası XX(518534.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19743-2">https://doi.org/10.1007/978-3-319-19743-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Knowledge Management in Organizations 10th International Conference, KMO 2015, Maribor, Slovenia, August 24-28, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5186292024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Uden, Lorna. editor. Heričko, Marjan. editor. Ting, I-Hsien. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518629.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-21009-4">https://doi.org/10.1007/978-3-319-21009-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Agile Processes in Software Engineering and Extreme Programming 16th International Conference, XP 2015, Helsinki, Finland, May 25-29, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5186332024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lassenius, Casper. editor. Dingsøyr, Torgeir. editor. Paasivaara, Maria. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518633.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-18612-2">https://doi.org/10.1007/978-3-319-18612-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Privacy and Identity Management for the Future Internet in the Age of Globalisation 9th IFIP WG 9.2, 9.5, 9.6/11.7, 11.4, 11.6/SIG 9.2.2 International Summer School, Patras, Greece, September 7-12, 2014, Revised Selected Papersent://SD_ILS/0/SD_ILS:5186982024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Camenisch, Jan. editor. Fischer-Hübner, Simone. editor. Hansen, Marit. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518698.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-18621-4">https://doi.org/10.1007/978-3-319-18621-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Security Planning An Applied Approachent://SD_ILS/0/SD_ILS:5187202024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Lincke, Susan. author. SpringerLink (Online service)<br/>Yer Numarası XX(518720.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16027-6">https://doi.org/10.1007/978-3-319-16027-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Intelligent Computing Theories and Applications 11th International Conference, ICIC 2015, Fuzhou, China, August 20-23, 2015. Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5190342024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Huang, De-Shuang. editor. Han, Kyungsook. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519034.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22053-6">https://doi.org/10.1007/978-3-319-22053-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering Psychology and Cognitive Ergonomics 12th International Conference, EPCE 2015, Held as Part of HCI International 2015, Los Angeles, CA, USA, August 2-7, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5189352024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Harris, Don. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518935.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-20373-7">https://doi.org/10.1007/978-3-319-20373-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interactive Theorem Proving 6th International Conference, ITP 2015, Nanjing, China, August 24-27, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190432024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Urban, Christian. editor. Zhang, Xingyuan. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519043.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22102-1">https://doi.org/10.1007/978-3-319-22102-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 9th International Conference, TAP 2015, Held as Part of STAF 2015, L'Aquila, Italy, July 22-24, 2015. Proceedingsent://SD_ILS/0/SD_ILS:5191042024-11-11T01:41:37Z2024-11-11T01:41:37ZYazar Blanchette, Jasmin Christian. editor. Kosmatov, Nikolai. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519104.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-21215-9">https://doi.org/10.1007/978-3-319-21215-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>