Arama Sonuçları Test. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300$0026isd$003dtrue?2024-09-21T13:55:18ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:2895492024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Walton, William Clarence.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042931">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:2896732024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Ilgenfritz, Merle. Ilgenfritz, John. Powell, John Wesley, 1834-1902 Baca, Steven.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420066005">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:2756052024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Broemeling, Lyle D., 1939-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439838792">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete mix design and test methodsent://SD_ILS/0/SD_ILS:2906382024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kett, Irving.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420091175">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:2908792024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Gruijter, Dato N. de. Kamp, Leo J. Th. van der.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781584889595">Distributed by publisher. 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McGraw-Hill's SSAT/ISEE high school entrance exams.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-ssatisee-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940292024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. 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R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP statistics questions to know by test dayent://SD_ILS/0/SD_ILS:2938232024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Phan, Jennifer. Balachandran, Divya. Walker, Jerimi Ann.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-statistics-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP microeconomics/macroeconomics questions to know by test dayent://SD_ILS/0/SD_ILS:2938242024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Reddington, Brian.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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Chris. Gardner, Jane P. Richards, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-environmental-science-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's 500 MCAT general chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940122024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Moore, John T., 1947- Langley, Richard.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-general-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's 500 MCAT biology questions to know by test dayent://SD_ILS/0/SD_ILS:2940152024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Stewart, Robert.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a 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Math level 2ent://SD_ILS/0/SD_ILS:2940522024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-2-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940532024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940542024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Demeter, Scott E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level A test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940682024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Dutwin, Phyllis. Altreuter, Carol. Guglielmi, Kathy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940692024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level D test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940752024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Dutwin, Phyllis. Ku, Richard T. (Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Yer Numarası XX(520291.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Parsa, Saeed. author. SpringerLink (Online service)<br/>Yer Numarası XX(520377.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521852.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Larner, A. J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Irwing, Frederick Paul, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Roman, Adam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:3571002024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Yer Numarası ONLINE(357100.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781482225501">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Place and Health as Complex Systems A Case Study and Empirical Testent://SD_ILS/0/SD_ILS:5193872024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Castellani, Brian. author. Rajaram, Rajeev. author. Buckwalter, J. Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Yer Numarası XX(519387.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Larner, A.J. author. SpringerLink (Online service)<br/>Yer Numarası XX(519458.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bates, Jan Wheeler. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software test attacks to break mobile and embedded devicesent://SD_ILS/0/SD_ILS:3428682024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hagar, Jon Duncan, author.<br/>Yer Numarası ONLINE(342868.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466575318">Distributed by publisher. 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Approachent://SD_ILS/0/SD_ILS:3309862024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333066.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15772-1">http://dx.doi.org/10.1007/978-3-642-15772-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Psychiatric mental health nursing success a course review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2805972024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Curtis, Cathy Melfi. Fegley, Audra Baker. Tuzo, Carol Norton.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System-Level Validation High-Level Modeling and Directed Test Generation Techniquesent://SD_ILS/0/SD_ILS:3312652024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technologyent://SD_ILS/0/SD_ILS:3344202024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334420.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37398-5">http://dx.doi.org/10.1007/978-3-642-37398-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instant penetration testing setting up a test lab how-to : set up your own penetration testing lab using practical and precise recipesent://SD_ILS/0/SD_ILS:3130442024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Fadyushin, Vyacheslav.<br/>Yer Numarası ONLINE(313044.1)<br/>Elektronik Erişim Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Characteristics of Virtual Learning Environments A Theoretical Integration and Empirical Test of Technology Acceptance and IS Success Researchent://SD_ILS/0/SD_ILS:3352402024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Müller, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335240.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Families of the missing a test for contemporary approaches to transitional justiceent://SD_ILS/0/SD_ILS:3445352024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Robins, Simon.<br/>Yer Numarası ONLINE(344535.1)<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203517079">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methodsent://SD_ILS/0/SD_ILS:1686472024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Liu, Tao. author. Gao, Furong. author. SpringerLink (Online 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A Test Bench for International Justiceent://SD_ILS/0/SD_ILS:2056722024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Meloni, Chantal. editor. Tognoni, Gianni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-6704-820-0">http://dx.doi.org/10.1007/978-90-6704-820-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. 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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5207522024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520752.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23944-1">https://doi.org/10.1007/978-3-031-23944-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>6GN for Future Wireless Networks 5th EAI International Conference, 6GN 2022, Harbin, China, December 17-18, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5204902024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Li, Ao. editor. Shi, Yao. editor. Xi, Liang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520490.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36011-4">https://doi.org/10.1007/978-3-031-36011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Computing and Data Sciences 7th International Conference, ICACDS 2023, Kolkata, India, April 27-28, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205212024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Singh, Mayank. editor. Tyagi, Vipin. editor. Gupta, P.K. editor. Flusser, Jan. editor. Ören, Tuncer. editor.<br/>Yer Numarası XX(520521.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37940-6">https://doi.org/10.1007/978-3-031-37940-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unconventional Computation and Natural Computation 20th International Conference, UCNC 2023, Jacksonville, FL, USA, March 13-17, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209562024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Genova, Daniela. editor. Kari, Jarkko. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520956.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34034-5">https://doi.org/10.1007/978-3-031-34034-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structured Object-Oriented Formal Language and Method 11th International Workshop, SOFL+MSVL 2022, Madrid, Spain, October 24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5209112024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Liu, Shaoying. editor. Duan, Zhenhua. editor. Liu, Ai. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520911.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29476-1">https://doi.org/10.1007/978-3-031-29476-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>NASA Formal Methods 15th International Symposium, NFM 2023, Houston, TX, USA, May 16-18, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209842024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rozier, Kristin Yvonne. editor. Chaudhuri, Swarat. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520984.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33170-1">https://doi.org/10.1007/978-3-031-33170-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210022024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521002.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36616-1">https://doi.org/10.1007/978-3-031-36616-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521004.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Interface and the Management of Information Thematic Area, HIMI 2023, Held as Part of the 25th HCI International Conference, HCII 2023, Copenhagen, Denmark, July 23-28, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5210332024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Mori, Hirohiko. editor. Asahi, Yumi. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521033.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35129-7">https://doi.org/10.1007/978-3-031-35129-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211022024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Prevosto, Virgile. editor. Seceleanu, Cristina. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521102.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-38828-6">https://doi.org/10.1007/978-3-031-38828-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Software Engineering 10th International Conference, FSEN 2023, Tehran, Iran, May 4-5, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5211202024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hojjat, Hossein. editor. Ábrahám, Erika. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521120.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42441-0">https://doi.org/10.1007/978-3-031-42441-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5211252024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar De Paolis, Lucio Tommaso. editor. Arpaia, Pasquale. editor. Sacco, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521125.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43404-4">https://doi.org/10.1007/978-3-031-43404-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Health Information Science 12th International Conference, HIS 2023, Melbourne, VIC, Australia, October 23-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212352024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Li, Yan. editor. Huang, Zhisheng. editor. Sharma, Manik. editor. Chen, Lu. editor. Zhou, Rui. editor.<br/>Yer Numarası XX(521235.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7108-4">https://doi.org/10.1007/978-981-99-7108-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Service-Oriented and Cloud Computing 10th IFIP WG 6.12 European Conference, ESOCC 2023, Larnaca, Cyprus, October 24-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212392024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Papadopoulos, George A. editor. (orcid) Rademacher, Florian. editor. Soldani, Jacopo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521239.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46235-1">https://doi.org/10.1007/978-3-031-46235-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information and Communications Security 25th International Conference, ICICS 2023, Tianjin, China, November 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212502024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Wang, Ding. editor. Yung, Moti. editor. (orcid) Liu, Zheli. editor. Chen, Xiaofeng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521250.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7356-9">https://doi.org/10.1007/978-981-99-7356-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Semantic Web: ESWC 2023 Satellite Events Hersonissos, Crete, Greece, May 28 - June 1, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212512024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Pesquita, Catia. editor. Skaf-Molli, Hala. editor. Efthymiou, Vasilis. editor. Kirrane, Sabrina. editor. Ngonga, Axel. editor.<br/>Yer Numarası XX(521251.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43458-7">https://doi.org/10.1007/978-3-031-43458-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Image and Graphics 12th International Conference, ICIG 2023, Nanjing, China, September 22-24, 2023, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5212682024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lu, Huchuan. editor. Ouyang, Wanli. editor. Huang, Hui. editor. Lu, Jiwen. editor. Liu, Risheng. editor.<br/>Yer Numarası XX(521268.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46311-2">https://doi.org/10.1007/978-3-031-46311-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rigorous State-Based Methods 9th International Conference, ABZ 2023, Nancy, France, May 30-June 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212952024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Glässer, Uwe. editor. Creissac Campos, Jose. editor. Méry, Dominique. editor. Palanque, Philippe. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(521295.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33163-3">https://doi.org/10.1007/978-3-031-33163-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mobile Web and Intelligent Information Systems 19th International Conference, MobiWIS 2023, Marrakech, Morocco, August 14-16, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213022024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Younas, Muhammad. editor. Awan, Irfan. editor. Grønli, Tor-Morten. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521302.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39764-6">https://doi.org/10.1007/978-3-031-39764-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Performance Computing ISC High Performance 2023 International Workshops, Hamburg, Germany, May 21-25, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5213052024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bienz, Amanda. editor. Weiland, Michèle. editor. Baboulin, Marc. editor. Kruse, Carola. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521305.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40843-4">https://doi.org/10.1007/978-3-031-40843-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 22nd International Conference, ICAISC 2023, Zakopane, Poland, June 18-22, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213092024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(521309.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42505-9">https://doi.org/10.1007/978-3-031-42505-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unlearn Pain The Successful Techniques And Exercises Of Psychological Pain Managementent://SD_ILS/0/SD_ILS:5216872024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Richter, Jutta. author. SpringerLink (Online service)<br/>Yer Numarası XX(521687.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65702-7">https://doi.org/10.1007/978-3-662-65702-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Character Building and Competence Development in Medical and Health Professions Education The First Biennial Indonesian Medical and Health Professions Education Conferenceent://SD_ILS/0/SD_ILS:5219502024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Claramita, Mora. editor. Soemantri, Diantha. editor. Hidayah, Rachmadya Nur. editor. Findyartini, Ardi. editor. Samarasekera, Dujeepa D. editor.<br/>Yer Numarası XX(521950.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-4573-3">https://doi.org/10.1007/978-981-99-4573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Neuroanatomy for the Boards and the Clinic Finding the Lesionent://SD_ILS/0/SD_ILS:5219862024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Leo, Jonathan. author. SpringerLink (Online service)<br/>Yer Numarası XX(521986.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41123-6">https://doi.org/10.1007/978-3-031-41123-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical Guide to Hereditary Breast and Ovarian Cancer Annual Meeting of the Japanese Organization of Hereditary Breast and Ovarian Cancer 2021ent://SD_ILS/0/SD_ILS:5220122024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Aoki, Daisuke. editor. Nakamura, Seigo. editor. Miki, Yoshio. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522012.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5231-1">https://doi.org/10.1007/978-981-99-5231-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Sleep Medicineent://SD_ILS/0/SD_ILS:5220172024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Thomas, Robert J. editor. Bhat, Sushanth. editor. Chokroverty, Sudhansu. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522017.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34625-5">https://doi.org/10.1007/978-3-031-34625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thyroid FNA Cytology Differential Diagnoses and Pitfallsent://SD_ILS/0/SD_ILS:5222622024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kakudo, Kennichi. editor. Liu, Zhiyan. editor. Jung, Chan Kwon. editor. Hirokawa, Mitsuyoshi. editor. Bychkov, Andrey. editor.<br/>Yer Numarası XX(522262.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6782-7">https://doi.org/10.1007/978-981-99-6782-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Down Syndrome Screening A Practical Guideent://SD_ILS/0/SD_ILS:5221832024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kamat, Abhijit. author. SpringerLink (Online service)<br/>Yer Numarası XX(522183.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7758-1">https://doi.org/10.1007/978-981-99-7758-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Protocols in Endocrinologyent://SD_ILS/0/SD_ILS:5221852024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bhadada, Sanjay. editor. Das, Liza. editor. Pal, Rimesh. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522185.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6653-8">https://doi.org/10.1007/978-981-19-6653-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5201942024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520194.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23950-2">https://doi.org/10.1007/978-3-031-23950-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Cognitive Science and Communications Selected Articles from the 5th International Conference on Communications and Cyber-Physical Engineering (ICCCE 2022), Hyderabad, Indiaent://SD_ILS/0/SD_ILS:5202992024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kumar, Amit. editor. Mozar, Stefan. editor. Haase, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520299.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8086-2">https://doi.org/10.1007/978-981-19-8086-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nature of Computation and Communication 8th EAI International Conference, ICTCC 2022, Vinh Long, Vietnam, October 27-28, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203732024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Phan, Cong Vinh. editor. (orcid) Nguyen, Thanh Dung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520373.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28790-9">https://doi.org/10.1007/978-3-031-28790-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Enterprise, Business-Process and Information Systems Modeling 24th International Conference, BPMDS 2023, and 28th International Conference, EMMSAD 2023, Zaragoza, Spain, June 12-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5204212024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar van der Aa, Han. editor. Bork, Dominik. editor. (orcid) Proper, Henderik A. editor. Schmidt, Rainer. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520421.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34241-7">https://doi.org/10.1007/978-3-031-34241-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Supported Education 14th International Conference, CSEDU 2022, Virtual Event, April 22-24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5204462024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Uhomoibhi, James. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520446.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40501-3">https://doi.org/10.1007/978-3-031-40501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pervasive Computing Technologies for Healthcare 16th EAI International Conference, PervasiveHealth 2022, Thessaloniki, Greece, December 12-14, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204582024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Tsanas, Athanasios. editor. Triantafyllidis, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520458.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34586-9">https://doi.org/10.1007/978-3-031-34586-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Systems and Information Processing 7th International Conference, ICCSIP 2022, Fuzhou, China, December 17-18, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5207582024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Sun, Fuchun. editor. Cangelosi, Angelo. editor. Zhang, Jianwei. editor. Yu, Yuanlong. editor. Liu, Huaping. editor.<br/>Yer Numarası XX(520758.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0617-8">https://doi.org/10.1007/978-981-99-0617-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Quality: Higher Software Quality through Zero Waste Development 15th International Conference, SWQD 2023, Munich, Germany, May 23-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5207662024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Mendez, Daniel. editor. Winkler, Dietmar. editor. Kross, Johannes. editor. Biffl, Stefan. editor. Bergsmann, Johannes. editor.<br/>Yer Numarası XX(520766.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31488-9">https://doi.org/10.1007/978-3-031-31488-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT Technologies for HealthCare 9th EAI International Conference, HealthyIoT 2022, Braga, Portugal, November 16-18, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5206672024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Spinsante, Susanna. editor. Iadarola, Grazia. editor. Paglialonga, Alessia. editor. Tramarin, Federico. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520667.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28663-6">https://doi.org/10.1007/978-3-031-28663-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Intelligence 8th International Conference, CBI 2023, Istanbul, Turkey, July 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205962024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar El Ayachi, Rachid. editor. Fakir, Mohamed. editor. Baslam, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520596.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37872-0">https://doi.org/10.1007/978-3-031-37872-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206062024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Fernandes, José Maria. editor. Travassos, Guilherme H. editor. Lenarduzzi, Valentina. editor. Li, Xiaozhou. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520606.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5207992024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(520799.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Intelligent Data Analysis XXI 21st International Symposium on Intelligent Data Analysis, IDA 2023, Louvain-la-Neuve, Belgium, April 12-14, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208372024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Crémilleux, Bruno. editor. Hess, Sibylle. editor. Nijssen, Siegfried. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520837.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30047-9">https://doi.org/10.1007/978-3-031-30047-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental Approaches to Software Engineering 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, Paris, France, April 22-27, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208412024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lambers, Leen. editor. Uchitel, Sebastián. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520841.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30826-0">https://doi.org/10.1007/978-3-031-30826-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analysis, Verification and Transformation for Declarative Programming and Intelligent Systems Essays Dedicated to Manuel Hermenegildo on the Occasion of His 60th Birthdayent://SD_ILS/0/SD_ILS:5208642024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lopez-Garcia, Pedro. editor. Gallagher, John P. editor. Giacobazzi, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520864.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31476-6">https://doi.org/10.1007/978-3-031-31476-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovative Technologies and Learning 6th International Conference, ICITL 2023, Porto, Portugal, August 28-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209652024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Huang, Yueh-Min. editor. (orcid) Rocha, Tânia. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520965.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40113-8">https://doi.org/10.1007/978-3-031-40113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521134.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing Software and Systems 35th IFIP WG 6.1 International Conference, ICTSS 2023, Bergamo, Italy, September 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211572024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bonfanti, Silvia. editor. Gargantini, Angelo. editor. Salvaneschi, Paolo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521157.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43240-8">https://doi.org/10.1007/978-3-031-43240-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Occupational Dermatosesent://SD_ILS/0/SD_ILS:5216382024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Giménez-Arnau, Ana M. editor. Maibach, Howard I. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521638.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22727-1">https://doi.org/10.1007/978-3-031-22727-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lipoprotein(a)ent://SD_ILS/0/SD_ILS:5215672024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kostner, Karam. editor. Kostner, Gerhard M. editor. Toth, Peter P. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521567.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24575-6">https://doi.org/10.1007/978-3-031-24575-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Functional Neuroradiology Principles and Clinical Applicationsent://SD_ILS/0/SD_ILS:5215812024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Faro, Scott H. editor. Mohamed, Feroze B. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521581.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-10909-6">https://doi.org/10.1007/978-3-031-10909-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point-of-care US for Acute Abdomenent://SD_ILS/0/SD_ILS:5220542024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Zago, Mauro. editor. Troian, Marina. editor. Mariani, Diego. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522054.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40231-9">https://doi.org/10.1007/978-3-031-40231-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human-Technology Interaction Shaping the Future of Industrial User Interfacesent://SD_ILS/0/SD_ILS:5202532024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Röcker, Carsten. editor. Büttner, Sebastian. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520253.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-99235-4">https://doi.org/10.1007/978-3-030-99235-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5203192024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520319.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2446-2">https://doi.org/10.1007/978-981-99-2446-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT and Big Data Technologies for Health Care Third EAI International Conference, IoTCare 2022, Virtual Event, December 12-13, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203252024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Wang, Shuihua. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520325.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33545-7">https://doi.org/10.1007/978-3-031-33545-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Research Challenges in Information Science: Information Science and the Connected World 17th International Conference, RCIS 2023, Corfu, Greece, May 23-26, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205802024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Nurcan, Selmin. editor. Opdahl, Andreas L. editor. Mouratidis, Haralambos. editor. Tsohou, Aggeliki. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520580.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33080-3">https://doi.org/10.1007/978-3-031-33080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Production Management Systems. Production Management Systems for Responsible Manufacturing, Service, and Logistics Futures IFIP WG 5.7 International Conference, APMS 2023, Trondheim, Norway, September 17-21, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5206112024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Alfnes, Erlend. editor. Romsdal, Anita. editor. Strandhagen, Jan Ola. editor. von Cieminski, Gregor. editor. Romero, David. editor.<br/>Yer Numarası XX(520611.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43666-6">https://doi.org/10.1007/978-3-031-43666-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Dynamic Data Driven Applications Systems Volume 2ent://SD_ILS/0/SD_ILS:5206142024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Darema, Frederica. editor. Blasch, Erik P. editor. Ravela, Sai. editor. Aved, Alex J. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520614.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27986-7">https://doi.org/10.1007/978-3-031-27986-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in Artificial Intelligence 22nd EPIA Conference on Artificial Intelligence, EPIA 2023, Faial Island, Azores, September 5-8, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213632024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Moniz, Nuno. editor. Vale, Zita. editor. Cascalho, José. editor. Silva, Catarina. editor. Sebastião, Raquel. editor.<br/>Yer Numarası XX(521363.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-49008-8">https://doi.org/10.1007/978-3-031-49008-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evolutionary Multi-Criterion Optimization 12th International Conference, EMO 2023, Leiden, The Netherlands, March 20-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213852024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Emmerich, Michael. editor. Deutz, André. editor. Wang, Hao. editor. Kononova, Anna V. editor. Naujoks, Boris. editor.<br/>Yer Numarası XX(521385.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27250-9">https://doi.org/10.1007/978-3-031-27250-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence over Infrared Images for Medical Applications Second MICCAI Workshop, AIIIMA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214032024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kakileti, Siva Teja. editor. (orcid) Manjunath, Geetha. editor. Schwartz, Robert G. editor. Frangi, Alejandro F. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521403.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44511-8">https://doi.org/10.1007/978-3-031-44511-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphonomics in Human Body Movement. Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521404.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Normal Pressure Hydrocephalus Pathophysiology, Diagnosis, Treatment and Outcomeent://SD_ILS/0/SD_ILS:5220692024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Bradac, Ondrej. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522069.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36522-5">https://doi.org/10.1007/978-3-031-36522-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Helicobacter pylorient://SD_ILS/0/SD_ILS:5222792024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Kim, Nayoung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522279.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0013-4">https://doi.org/10.1007/978-981-97-0013-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206822024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.<br/>Yer Numarası XX(520682.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36336-8">https://doi.org/10.1007/978-3-031-36336-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Science 9th International Conference of Pioneering Computer Scientists, Engineers and Educators, ICPCSEE 2023, Harbin, China, September 22-24, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5206882024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Yu, Zhiwen. editor. Han, Qilong. editor. Wang, Hongzhi. editor. Guo, Bin. editor. Zhou, Xiaokang. editor.<br/>Yer Numarası XX(520688.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5968-6">https://doi.org/10.1007/978-981-99-5968-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Image Learning with Limited and Noisy Data Second International Workshop, MILLanD 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 8, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212262024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Xue, Zhiyun. editor. Antani, Sameer. editor. Zamzmi, Ghada. editor. Yang, Feng. editor. Rajaraman, Sivaramakrishnan. editor.<br/>Yer Numarası XX(521226.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44917-8">https://doi.org/10.1007/978-3-031-44917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensory evaluation practicesent://SD_ILS/0/SD_ILS:5224762024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Stone, Herbert, author. Bleibaum, Rebecca N., author. Thomas, Heather A., author.<br/>Yer Numarası XX(522476.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128153345">https://www.sciencedirect.com/science/book/9780128153345</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Influence of nutrients, bioactive compounds and plant extracts in liver diseasesent://SD_ILS/0/SD_ILS:5224932024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Alavian, Seyed Moayed.<br/>Yer Numarası XX(522493.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128164884">https://www.sciencedirect.com/science/book/9780128164884</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pocket guide to stress testingent://SD_ILS/0/SD_ILS:4245432024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Tighe, Dennis A., editor. Gentile, Bryon A., II, editor. Prededed by (work): Chung, Edward K. Pocket guide to stress testing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781119481737">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Cambridge handbook of research methods in clinical psychologyent://SD_ILS/0/SD_ILS:5062582024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Wright, Aidan G. C., 1980- editor. Hallquist, Michael N., 1981- editor.<br/>Yer Numarası RC467.2 .C36 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781316995808">https://doi.org/10.1017/9781316995808</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Curious about nature : a passion for fieldworkent://SD_ILS/0/SD_ILS:5062622024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Burt, Tim, 1951- editor. Thompson, D. B. A., 1958- editor.<br/>Yer Numarası LB2394 .C87 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781108552172">https://doi.org/10.1017/9781108552172</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Paediatric Radiology Rapid Reporting for FRCR Part 2Bent://SD_ILS/0/SD_ILS:4836942024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Paddock, Michael. author. Offiah, Amaka C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01965-5">https://doi.org/10.1007/978-3-030-01965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Law of remedies : a European perspectiveent://SD_ILS/0/SD_ILS:5062722024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Hofmann, Franz, 1981- editor. Kurz, Franziska (Writer on law), editor.<br/>Yer Numarası KJC4010 .L39 2019<br/>Elektronik Erişim <a href="https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK">https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modelling and Verification of Secure Examsent://SD_ILS/0/SD_ILS:4015712024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Giustolisi, Rosario. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67107-9">https://doi.org/10.1007/978-3-319-67107-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Creative teaching strategies for the nurse educatorent://SD_ILS/0/SD_ILS:3583632024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Herrman, Judith W., author.<br/>Yer Numarası RT71 .H47 2016<br/>Elektronik Erişim <a href="http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk">http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Technological Innovation for Cloud-Based Engineering Systems 6th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2015, Costa de Caparica, Portugal, April 13-15, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185712024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Camarinha-Matos, Luis M. editor. Baldissera, Thais A. editor. Di Orio, Giovanni. editor. Marques, Francisco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518571.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16766-4">https://doi.org/10.1007/978-3-319-16766-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nordic Contributions in IS Research 6th Scandinavian Conference on Information Systems, SCIS 2015, Oulu, Finland, August 9-12, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185832024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Oinas-Kukkonen, Harri. editor. Iivari, Netta. editor. Kuutti, Kari. editor. Öörni, Anssi. editor. Rajanen, Mikko. editor.<br/>Yer Numarası XX(518583.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-21783-3">https://doi.org/10.1007/978-3-319-21783-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Security Planning An Applied Approachent://SD_ILS/0/SD_ILS:5187202024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Lincke, Susan. author. SpringerLink (Online service)<br/>Yer Numarası XX(518720.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16027-6">https://doi.org/10.1007/978-3-319-16027-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantum Interaction 8th International Conference, QI 2014, Filzbach, Switzerland, June 30 -- July 3, 2014. Revised Selected Papersent://SD_ILS/0/SD_ILS:5189542024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Atmanspacher, Harald. editor. Bergomi, Claudia. editor. Filk, Thomas. editor. Kitto, Kirsty. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518954.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-15931-7">https://doi.org/10.1007/978-3-319-15931-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interactive Theorem Proving 6th International Conference, ITP 2015, Nanjing, China, August 24-27, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190432024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Urban, Christian. editor. Zhang, Xingyuan. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519043.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22102-1">https://doi.org/10.1007/978-3-319-22102-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Agents and Artificial Intelligence 7th International Conference, ICAART 2015, Lisbon, Portugal, January 10-12, 2015, Revised Selected Papersent://SD_ILS/0/SD_ILS:5191192024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Duval, Béatrice. editor. van den Herik, Jaap. editor. Loiseau, Stephane. editor. Filipe, Joaquim. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519119.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-27947-3">https://doi.org/10.1007/978-3-319-27947-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental Approaches to Software Engineering 18th International Conference, FASE 2015, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2015, London, UK, April 11-18, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5191362024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Egyed, Alexander. editor. Schaefer, Ina. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519136.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-46675-9">https://doi.org/10.1007/978-3-662-46675-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Genetic Programming 18th European Conference, EuroGP 2015, Copenhagen, Denmark, April 8-10, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5193442024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Machado, Penousal. editor. Heywood, Malcolm I. editor. McDermott, James. editor. Castelli, Mauro. editor. García-Sánchez, Pablo. editor.<br/>Yer Numarası XX(519344.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16501-1">https://doi.org/10.1007/978-3-319-16501-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Cleveland Clinic Manual of Dynamic Endocrine Testingent://SD_ILS/0/SD_ILS:5194172024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Ergin, Ahmet Bahadir. author. Kennedy, A. Laurence. author. Gupta, Manjula K. author. Hamrahian, Amir H. author. SpringerLink (Online service)<br/>Yer Numarası XX(519417.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-13048-4">https://doi.org/10.1007/978-3-319-13048-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Intelligence in Digital and Network Designs and Applicationsent://SD_ILS/0/SD_ILS:5183382024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518338.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-20071-2">https://doi.org/10.1007/978-3-319-20071-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Process Mining Techniques in Business Environments Theoretical Aspects, Algorithms, Techniques and Open Challenges in Process Miningent://SD_ILS/0/SD_ILS:5183672024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Burattin, Andrea. author. SpringerLink (Online service)<br/>Yer Numarası XX(518367.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-17482-2">https://doi.org/10.1007/978-3-319-17482-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Smart Cities, Green Technologies, and Intelligent Transport Systems 4th International Conference, SMARTGREENS 2015, and 1st International Conference VEHITS 2015, Lisbon, Portugal, May 20-22, 2015, Revised Selected Papersent://SD_ILS/0/SD_ILS:5183762024-09-21T13:55:18Z2024-09-21T13:55:18ZYazar Helfert, Markus. editor. Krempels, Karl-Heinz. editor. Klein, Cornel. editor. Donellan, Brian. editor. Guiskhin, Oleg. editor.<br/>Yer Numarası XX(518376.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-27753-0">https://doi.org/10.1007/978-3-319-27753-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>