Arama Sonuçları Test. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-27T14:56:32ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Yer Numarası R834.5<br/>Elektronik Erişim Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lowenthal, Michael. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Dietel, Ron. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:2895492024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Walton, William Clarence.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420042931">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Nas, Vasfi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rogers, Katherine M. A. Scott, William N.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rogers, Katherine. Scott, William.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Scheiber, Stephen F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Yer Numarası ONLINE(321406.1)<br/>Elektronik Erişim <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Durdu, Murat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Barnum, Carol M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:2896732024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Ilgenfritz, Merle. Ilgenfritz, John. Powell, John Wesley, 1834-1902 Baca, Steven.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420066005">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Baker, Mark.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Jackson, MacDonald P. (MacDonald Pairman)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar McDonald, Roderick P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kilbey, B. J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Caputo, Christine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Evangelist, Thomas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Muntone, Stephanie.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Harris, Noel. Shearer, Diane.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:2756052024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Broemeling, Lyle D., 1939-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439838792">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineered concrete mix design and test methodsent://SD_ILS/0/SD_ILS:2906382024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kett, Irving.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420091175">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:2908792024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Gruijter, Dato N. de. Kamp, Leo J. Th. van der.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781584889595">Distributed by publisher. 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McGraw-Hill's SSAT/ISEE high school entrance exams.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-ssatisee-3rd-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English literature questions to know by test dayent://SD_ILS/0/SD_ILS:2938352024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Miller, Shveta Verma.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Ambrose, Allyson.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Stevens, Adam.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Demeter, Scott E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP psychology questions to know by test dayent://SD_ILS/0/SD_ILS:2938512024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Williams, Lauren.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-psychology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>5 steps to a 5. 500 AP biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lebitz, Mina.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level A test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940682024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Dutwin, Phyllis. Altreuter, Carol. Guglielmi, Kathy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940692024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>TABE level D test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940752024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Dutwin, Phyllis. Ku, Richard T. (Richard Tse-Min)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 2ent://SD_ILS/0/SD_ILS:2940522024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-2-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940532024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Diehl, John. Joyce, Christine E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940542024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Tarasen, Nick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-2e">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Parsa, Saeed. author. SpringerLink (Online service)<br/>Yer Numarası XX(520377.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Yer Numarası XX(520291.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521852.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Larner, A. J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer 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Proceedingsent://SD_ILS/0/SD_ILS:1970902024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals success a Q & A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803162024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Secure and resilient software requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:2907992024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Merkow, Mark S. Raghavan, Lakshmikanth.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439866221">Distributed by publisher. 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A.. Tzavalis, Elias.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511493157">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical models for test equating, scaling, and linkingent://SD_ILS/0/SD_ILS:1446462024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Davier, Alina A. von.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Streamline numerical well test interpretation theory and methodent://SD_ILS/0/SD_ILS:1485172024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Jun, Yao. Wu, Minglu.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a 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Validation and Debug of High Speed Serial Interfacesent://SD_ILS/0/SD_ILS:2054842024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibrationent://SD_ILS/0/SD_ILS:2055722024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Detect and Deter: Can Countries Verify the Nuclear Test Ban?ent://SD_ILS/0/SD_ILS:2061392024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Dahlman, Ola. author. Mackby, Jenifer. author. Mykkeltveit, Svein. author. Haak, Hein. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-1676-6">http://dx.doi.org/10.1007/978-94-007-1676-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Med-surg success a Q&A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803132024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Colgrove, Kathryn Cadenhead. Hargrove-Huttel, Ray A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495462">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495462</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test success test-taking techniques for beginning nursing studentsent://SD_ILS/0/SD_ILS:2803172024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495470">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495470</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Allgemeinbildung in Deutschland Erkenntnisse aus dem SPIEGEL-Studentenpisa-Testent://SD_ILS/0/SD_ILS:1797132024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Verbeet, Markus. editor. Trepte, Sabine. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-531-92543-1">http://dx.doi.org/10.1007/978-3-531-92543-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power-Aware Testing and Test Strategies for Low Power 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Systemsent://SD_ILS/0/SD_ILS:2480512024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar McShea, Robert E.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA033E">http://dx.doi.org/10.1049/SBRA033E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and test technology for dependable systems-on-chipent://SD_ILS/0/SD_ILS:2780432024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Ubar, Raimund, 1941- Raik, Jaan, 1972- Vierhaus, Heinrich Theodor, 1951-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test-Driven Development An Empirical Evaluation of Agile Practiceent://SD_ILS/0/SD_ILS:1908992024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Madeyski, Lech. author. SpringerLink (Online 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href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test ride on the Sunnyland bus a daughter's civil rights journeyent://SD_ILS/0/SD_ILS:2463942024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Spagna, Ana Maria. Project Muse.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://muse.jhu.edu/books/9780803233928/">Full text available: </a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A sound engineer's guide to audio test and measurementent://SD_ILS/0/SD_ILS:1485612024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Ballou, Glen.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780240812656">http://www.sciencedirect.com/science/book/9780240812656</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nuclear Test Ban Converting Political Visions to Realityent://SD_ILS/0/SD_ILS:1699802024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Haak, Hein. author. Mykkeltveit, S. author. Dahlman, Ola. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6885-0">http://dx.doi.org/10.1007/978-1-4020-6885-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Parsing the Turing Test Philosophical and Methodological Issues in the Quest for the Thinking Computerent://SD_ILS/0/SD_ILS:1699082024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Epstein, Robert. editor. Roberts, Gary. editor. Beber, Grace. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6710-5">http://dx.doi.org/10.1007/978-1-4020-6710-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Principles of CNS drug development from test tube to patientent://SD_ILS/0/SD_ILS:2981602024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kelly, John, 1961-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470682920">http://dx.doi.org/10.1002/9780470682920</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CliffsNotes Praxis II elementary education (0011, 0012, 0014) test prepent://SD_ILS/0/SD_ILS:3031352024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Paris, Jocelyn L., 1977- Paris, Judy L., 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.contentreserve.com/TitleInfo.asp?ID={D543705F-1C10-4261-A363-4F008A8C0222}&Format=50">Click for information</a>
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href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Testent://SD_ILS/0/SD_ILS:1701352024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Yichuang Sun, ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Elektrnik 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Chip: Design and Testent://SD_ILS/0/SD_ILS:1658572024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interpreting standardized test scores strategies for data-driven instructional decision makingent://SD_ILS/0/SD_ILS:3685952024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Mertler, Craig A.<br/>Yer Numarası ONLINE(368595.1)<br/>Elektronik Erişim SAGE knowledge <a href="http://sk.sagepub.com/books/interpreting-standardized-test-scores">http://sk.sagepub.com/books/interpreting-standardized-test-scores</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Make and Test Projects in Engineering Design Creativity, Engagement and Learningent://SD_ILS/0/SD_ILS:1753612024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Samuel, Andrew Emery. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-285-3">http://dx.doi.org/10.1007/1-84628-285-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™ent://SD_ILS/0/SD_ILS:1660492024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>.NET Test Automation Recipes A Problem-Solution Approachent://SD_ILS/0/SD_ILS:1708682024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar McCaffrey, James D. author. SpringerLink (Online service)<br/>Yer 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P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126897500">http://www.sciencedirect.com/science/book/9780126897500</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The science of sound recordingent://SD_ILS/0/SD_ILS:2671032024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CE marking handbook a practical approach to global safety certificationent://SD_ILS/0/SD_ILS:2543652024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lohbeck, David, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750698191">http://www.sciencedirect.com/science/book/9780750698191</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mcgraw-Hill's DATent://SD_ILS/0/SD_ILS:2940062024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Evangelist, Thomas A. Hanks, Wendy.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-dat-cdrom">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's GMATent://SD_ILS/0/SD_ILS:2940422024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hasik, James. Rudnick, Stacey. Hackney, Ryan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-gmat-2011-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's CBESTent://SD_ILS/0/SD_ILS:2940442024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar McGraw-Hill Companies.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-cbest">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>McGraw-Hill's MCATent://SD_ILS/0/SD_ILS:2940562024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hademenos, George J. McCloskey, Candice J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/mcgrawhills-mcat-cdrom-second-edition">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First aid for the Emergency Medicine Oral Boardsent://SD_ILS/0/SD_ILS:2937212024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Howes, David S. Gupta, Rohit. Waples-Trefil, Flora J. Pillow, M. 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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5201942024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520194.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23950-2">https://doi.org/10.1007/978-3-031-23950-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nature of Computation and Communication 8th EAI International Conference, ICTCC 2022, Vinh Long, Vietnam, October 27-28, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203732024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Phan, Cong Vinh. editor. (orcid) Nguyen, Thanh Dung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520373.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28790-9">https://doi.org/10.1007/978-3-031-28790-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Supported Education 14th International Conference, CSEDU 2022, Virtual Event, April 22-24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5204462024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Uhomoibhi, James. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520446.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40501-3">https://doi.org/10.1007/978-3-031-40501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pervasive Computing Technologies for Healthcare 16th EAI International Conference, PervasiveHealth 2022, Thessaloniki, Greece, December 12-14, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5204582024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Tsanas, Athanasios. editor. Triantafyllidis, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520458.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34586-9">https://doi.org/10.1007/978-3-031-34586-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT and Big Data Technologies for Health Care Third EAI International Conference, IoTCare 2022, Virtual Event, December 12-13, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5203252024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Wang, Shuihua. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520325.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33545-7">https://doi.org/10.1007/978-3-031-33545-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>6GN for Future Wireless Networks 5th EAI International Conference, 6GN 2022, Harbin, China, December 17-18, 2022, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5204902024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Li, Ao. editor. Shi, Yao. editor. Xi, Liang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520490.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36011-4">https://doi.org/10.1007/978-3-031-36011-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Computing and Data Sciences 7th International Conference, ICACDS 2023, Kolkata, India, April 27-28, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205212024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Singh, Mayank. editor. Tyagi, Vipin. editor. Gupta, P.K. editor. Flusser, Jan. editor. Ören, Tuncer. editor.<br/>Yer Numarası XX(520521.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37940-6">https://doi.org/10.1007/978-3-031-37940-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>IoT Technologies for HealthCare 9th EAI International Conference, HealthyIoT 2022, Braga, Portugal, November 16-18, 2022, Proceedingsent://SD_ILS/0/SD_ILS:5206672024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Spinsante, Susanna. editor. Iadarola, Grazia. editor. Paglialonga, Alessia. editor. Tramarin, Federico. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520667.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-28663-6">https://doi.org/10.1007/978-3-031-28663-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence in Education. Posters and Late Breaking Results, Workshops and Tutorials, Industry and Innovation Tracks, Practitioners, Doctoral Consortium and Blue Sky 24th International Conference, AIED 2023, Tokyo, Japan, July 3-7, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206822024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Wang, Ning. editor. Rebolledo-Mendez, Genaro. editor. Dimitrova, Vania. editor. Matsuda, Noboru. editor. Santos, Olga C. editor.<br/>Yer Numarası XX(520682.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36336-8">https://doi.org/10.1007/978-3-031-36336-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Science 9th International Conference of Pioneering Computer Scientists, Engineers and Educators, ICPCSEE 2023, Harbin, China, September 22-24, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5206882024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Yu, Zhiwen. editor. Han, Qilong. editor. Wang, Hongzhi. editor. Guo, Bin. editor. Zhou, Xiaokang. editor.<br/>Yer Numarası XX(520688.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5968-6">https://doi.org/10.1007/978-981-99-5968-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Application of Big Data, Blockchain, and Internet of Things for Education Informatization Second EAI International Conference, BigIoT-EDU 2022, Virtual Event, July 29-31, 2022, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5207522024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Jan, Mian Ahmad. editor. Khan, Fazlullah. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520752.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23944-1">https://doi.org/10.1007/978-3-031-23944-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Systems and Information Processing 7th International Conference, ICCSIP 2022, Fuzhou, China, December 17-18, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5207582024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Sun, Fuchun. editor. Cangelosi, Angelo. editor. Zhang, Jianwei. editor. Yu, Yuanlong. editor. Liu, Huaping. editor.<br/>Yer Numarası XX(520758.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0617-8">https://doi.org/10.1007/978-981-99-0617-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software Quality: Higher Software Quality through Zero Waste Development 15th International Conference, SWQD 2023, Munich, Germany, May 23-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5207662024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Mendez, Daniel. editor. Winkler, Dietmar. editor. Kross, Johannes. editor. Biffl, Stefan. editor. Bergsmann, Johannes. editor.<br/>Yer Numarası XX(520766.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31488-9">https://doi.org/10.1007/978-3-031-31488-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 21st International Conference, ICAISC 2022, Zakopane, Poland, June 19-23, 2022, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5207992024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(520799.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23480-4">https://doi.org/10.1007/978-3-031-23480-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structured Object-Oriented Formal Language and Method 11th International Workshop, SOFL+MSVL 2022, Madrid, Spain, October 24, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5209112024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Liu, Shaoying. editor. Duan, Zhenhua. editor. Liu, Ai. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520911.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-29476-1">https://doi.org/10.1007/978-3-031-29476-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Tests and Proofs 17th International Conference, TAP 2023, Leicester, UK, July 18-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211022024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Prevosto, Virgile. editor. Seceleanu, Cristina. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521102.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-38828-6">https://doi.org/10.1007/978-3-031-38828-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5203192024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520319.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2446-2">https://doi.org/10.1007/978-981-99-2446-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Research Challenges in Information Science: Information Science and the Connected World 17th International Conference, RCIS 2023, Corfu, Greece, May 23-26, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205802024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Nurcan, Selmin. editor. Opdahl, Andreas L. editor. Mouratidis, Haralambos. editor. Tsohou, Aggeliki. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520580.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33080-3">https://doi.org/10.1007/978-3-031-33080-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Business Intelligence 8th International Conference, CBI 2023, Istanbul, Turkey, July 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5205962024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar El Ayachi, Rachid. editor. Fakir, Mohamed. editor. Baslam, Mohamed. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520596.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37872-0">https://doi.org/10.1007/978-3-031-37872-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality of Information and Communications Technology 16th International Conference, QUATIC 2023, Aveiro, Portugal, September 11-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5206062024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Fernandes, José Maria. editor. Travassos, Guilherme H. editor. Lenarduzzi, Valentina. editor. Li, Xiaozhou. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520606.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43703-8">https://doi.org/10.1007/978-3-031-43703-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Production Management Systems. Production Management Systems for Responsible Manufacturing, Service, and Logistics Futures IFIP WG 5.7 International Conference, APMS 2023, Trondheim, Norway, September 17-21, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5206112024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Alfnes, Erlend. editor. Romsdal, Anita. editor. Strandhagen, Jan Ola. editor. von Cieminski, Gregor. editor. Romero, David. editor.<br/>Yer Numarası XX(520611.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43666-6">https://doi.org/10.1007/978-3-031-43666-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Dynamic Data Driven Applications Systems Volume 2ent://SD_ILS/0/SD_ILS:5206142024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Darema, Frederica. editor. Blasch, Erik P. editor. Ravela, Sai. editor. Aved, Alex J. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520614.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27986-7">https://doi.org/10.1007/978-3-031-27986-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Intelligent Data Analysis XXI 21st International Symposium on Intelligent Data Analysis, IDA 2023, Louvain-la-Neuve, Belgium, April 12-14, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208372024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Crémilleux, Bruno. editor. Hess, Sibylle. editor. Nijssen, Siegfried. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520837.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30047-9">https://doi.org/10.1007/978-3-031-30047-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental Approaches to Software Engineering 26th International Conference, FASE 2023, Held as Part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2023, Paris, France, April 22-27, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5208412024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lambers, Leen. editor. Uchitel, Sebastián. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520841.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-30826-0">https://doi.org/10.1007/978-3-031-30826-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analysis, Verification and Transformation for Declarative Programming and Intelligent Systems Essays Dedicated to Manuel Hermenegildo on the Occasion of His 60th Birthdayent://SD_ILS/0/SD_ILS:5208642024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lopez-Garcia, Pedro. editor. Gallagher, John P. editor. Giacobazzi, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520864.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-31476-6">https://doi.org/10.1007/978-3-031-31476-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unconventional Computation and Natural Computation 20th International Conference, UCNC 2023, Jacksonville, FL, USA, March 13-17, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209562024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Genova, Daniela. editor. Kari, Jarkko. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520956.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34034-5">https://doi.org/10.1007/978-3-031-34034-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovative Technologies and Learning 6th International Conference, ICITL 2023, Porto, Portugal, August 28-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209652024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Huang, Yueh-Min. editor. (orcid) Rocha, Tânia. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520965.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40113-8">https://doi.org/10.1007/978-3-031-40113-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing Software and Systems 35th IFIP WG 6.1 International Conference, ICTSS 2023, Bergamo, Italy, September 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211572024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Bonfanti, Silvia. editor. Gargantini, Angelo. editor. Salvaneschi, Paolo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521157.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43240-8">https://doi.org/10.1007/978-3-031-43240-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Image Learning with Limited and Noisy Data Second International Workshop, MILLanD 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 8, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212262024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Xue, Zhiyun. editor. Antani, Sameer. editor. Zamzmi, Ghada. editor. Yang, Feng. editor. Rajaraman, Sivaramakrishnan. editor.<br/>Yer Numarası XX(521226.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44917-8">https://doi.org/10.1007/978-3-031-44917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Service-Oriented and Cloud Computing 10th IFIP WG 6.12 European Conference, ESOCC 2023, Larnaca, Cyprus, October 24-25, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212392024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Papadopoulos, George A. editor. (orcid) Rademacher, Florian. editor. Soldani, Jacopo. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521239.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46235-1">https://doi.org/10.1007/978-3-031-46235-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information and Communications Security 25th International Conference, ICICS 2023, Tianjin, China, November 18-20, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212502024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Wang, Ding. editor. Yung, Moti. editor. (orcid) Liu, Zheli. editor. Chen, Xiaofeng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521250.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7356-9">https://doi.org/10.1007/978-981-99-7356-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Semantic Web: ESWC 2023 Satellite Events Hersonissos, Crete, Greece, May 28 - June 1, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212512024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Pesquita, Catia. editor. Skaf-Molli, Hala. editor. Efthymiou, Vasilis. editor. Kirrane, Sabrina. editor. Ngonga, Axel. editor.<br/>Yer Numarası XX(521251.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43458-7">https://doi.org/10.1007/978-3-031-43458-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Image and Graphics 12th International Conference, ICIG 2023, Nanjing, China, September 22-24, 2023, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:5212682024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lu, Huchuan. editor. Ouyang, Wanli. editor. Huang, Hui. editor. Lu, Jiwen. editor. Liu, Risheng. editor.<br/>Yer Numarası XX(521268.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-46311-2">https://doi.org/10.1007/978-3-031-46311-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rigorous State-Based Methods 9th International Conference, ABZ 2023, Nancy, France, May 30-June 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212952024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Glässer, Uwe. editor. Creissac Campos, Jose. editor. Méry, Dominique. editor. Palanque, Philippe. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(521295.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33163-3">https://doi.org/10.1007/978-3-031-33163-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mobile Web and Intelligent Information Systems 19th International Conference, MobiWIS 2023, Marrakech, Morocco, August 14-16, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213022024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Younas, Muhammad. editor. Awan, Irfan. editor. Grønli, Tor-Morten. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521302.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-39764-6">https://doi.org/10.1007/978-3-031-39764-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lipoprotein(a)ent://SD_ILS/0/SD_ILS:5215672024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kostner, Karam. editor. Kostner, Gerhard M. editor. Toth, Peter P. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521567.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24575-6">https://doi.org/10.1007/978-3-031-24575-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Character Building and Competence Development in Medical and Health Professions Education The First Biennial Indonesian Medical and Health Professions Education Conferenceent://SD_ILS/0/SD_ILS:5219502024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Claramita, Mora. editor. Soemantri, Diantha. editor. Hidayah, Rachmadya Nur. editor. Findyartini, Ardi. editor. Samarasekera, Dujeepa D. editor.<br/>Yer Numarası XX(521950.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-4573-3">https://doi.org/10.1007/978-981-99-4573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical Neuroanatomy for the Boards and the Clinic Finding the Lesionent://SD_ILS/0/SD_ILS:5219862024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Leo, Jonathan. author. SpringerLink (Online service)<br/>Yer Numarası XX(521986.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41123-6">https://doi.org/10.1007/978-3-031-41123-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical Guide to Hereditary Breast and Ovarian Cancer Annual Meeting of the Japanese Organization of Hereditary Breast and Ovarian Cancer 2021ent://SD_ILS/0/SD_ILS:5220122024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Aoki, Daisuke. editor. Nakamura, Seigo. editor. Miki, Yoshio. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522012.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-5231-1">https://doi.org/10.1007/978-981-99-5231-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Sleep Medicineent://SD_ILS/0/SD_ILS:5220172024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Thomas, Robert J. editor. Bhat, Sushanth. editor. Chokroverty, Sudhansu. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522017.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34625-5">https://doi.org/10.1007/978-3-031-34625-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Down Syndrome Screening A Practical Guideent://SD_ILS/0/SD_ILS:5221832024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kamat, Abhijit. author. SpringerLink (Online service)<br/>Yer Numarası XX(522183.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7758-1">https://doi.org/10.1007/978-981-99-7758-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diagnostic Protocols in Endocrinologyent://SD_ILS/0/SD_ILS:5221852024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Bhadada, Sanjay. editor. Das, Liza. editor. Pal, Rimesh. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522185.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-6653-8">https://doi.org/10.1007/978-981-19-6653-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Thyroid FNA Cytology Differential Diagnoses and Pitfallsent://SD_ILS/0/SD_ILS:5222622024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kakudo, Kennichi. editor. Liu, Zhiyan. editor. Jung, Chan Kwon. editor. Hirokawa, Mitsuyoshi. editor. Bychkov, Andrey. editor.<br/>Yer Numarası XX(522262.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6782-7">https://doi.org/10.1007/978-981-99-6782-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Helicobacter pylorient://SD_ILS/0/SD_ILS:5222792024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kim, Nayoung. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522279.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0013-4">https://doi.org/10.1007/978-981-97-0013-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of Software Engineering 10th International Conference, FSEN 2023, Tehran, Iran, May 4-5, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5211202024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hojjat, Hossein. editor. Ábrahám, Erika. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521120.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42441-0">https://doi.org/10.1007/978-3-031-42441-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Extended Reality International Conference, XR Salento 2023, Lecce, Italy, September 6-9, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5211252024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar De Paolis, Lucio Tommaso. editor. Arpaia, Pasquale. editor. Sacco, Marco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521125.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-43404-4">https://doi.org/10.1007/978-3-031-43404-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human-Technology Interaction Shaping the Future of Industrial User Interfacesent://SD_ILS/0/SD_ILS:5202532024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Röcker, Carsten. editor. Büttner, Sebastian. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520253.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-99235-4">https://doi.org/10.1007/978-3-030-99235-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Cognitive Science and Communications Selected Articles from the 5th International Conference on Communications and Cyber-Physical Engineering (ICCCE 2022), Hyderabad, Indiaent://SD_ILS/0/SD_ILS:5202992024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kumar, Amit. editor. Mozar, Stefan. editor. Haase, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520299.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-8086-2">https://doi.org/10.1007/978-981-19-8086-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Enterprise, Business-Process and Information Systems Modeling 24th International Conference, BPMDS 2023, and 28th International Conference, EMMSAD 2023, Zaragoza, Spain, June 12-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5204212024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar van der Aa, Han. editor. Bork, Dominik. editor. (orcid) Proper, Henderik A. editor. Schmidt, Rainer. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520421.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34241-7">https://doi.org/10.1007/978-3-031-34241-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Interface and the Management of Information Thematic Area, HIMI 2023, Held as Part of the 25th HCI International Conference, HCII 2023, Copenhagen, Denmark, July 23-28, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5210332024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Mori, Hirohiko. editor. Asahi, Yumi. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521033.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35129-7">https://doi.org/10.1007/978-3-031-35129-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Safety, Reliability, and Security 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20-22, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5211342024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Guiochet, Jérémie. editor. Tonetta, Stefano. editor. Bitsch, Friedemann. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521134.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40923-3">https://doi.org/10.1007/978-3-031-40923-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>NASA Formal Methods 15th International Symposium, NFM 2023, Houston, TX, USA, May 16-18, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5209842024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rozier, Kristin Yvonne. editor. Chaudhuri, Swarat. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520984.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-33170-1">https://doi.org/10.1007/978-3-031-33170-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210022024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521002.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36616-1">https://doi.org/10.1007/978-3-031-36616-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Theoretical Aspects of Software Engineering 17th International Symposium, TASE 2023, Bristol, UK, July 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210042024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar David, Cristina. editor. Sun, Meng. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521004.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-35257-7">https://doi.org/10.1007/978-3-031-35257-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Health Information Science 12th International Conference, HIS 2023, Melbourne, VIC, Australia, October 23-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5212352024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Li, Yan. editor. Huang, Zhisheng. editor. Sharma, Manik. editor. Chen, Lu. editor. Zhou, Rui. editor.<br/>Yer Numarası XX(521235.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-7108-4">https://doi.org/10.1007/978-981-99-7108-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Progress in Artificial Intelligence 22nd EPIA Conference on Artificial Intelligence, EPIA 2023, Faial Island, Azores, September 5-8, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213632024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Moniz, Nuno. editor. Vale, Zita. editor. Cascalho, José. editor. Silva, Catarina. editor. Sebastião, Raquel. editor.<br/>Yer Numarası XX(521363.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-49008-8">https://doi.org/10.1007/978-3-031-49008-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Performance Computing ISC High Performance 2023 International Workshops, Hamburg, Germany, May 21-25, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5213052024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Bienz, Amanda. editor. Weiland, Michèle. editor. Baboulin, Marc. editor. Kruse, Carola. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521305.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40843-4">https://doi.org/10.1007/978-3-031-40843-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evolutionary Multi-Criterion Optimization 12th International Conference, EMO 2023, Leiden, The Netherlands, March 20-24, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213852024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Emmerich, Michael. editor. Deutz, André. editor. Wang, Hao. editor. Kononova, Anna V. editor. Naujoks, Boris. editor.<br/>Yer Numarası XX(521385.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-27250-9">https://doi.org/10.1007/978-3-031-27250-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence and Soft Computing 22nd International Conference, ICAISC 2023, Zakopane, Poland, June 18-22, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5213092024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Rutkowski, Leszek. editor. Scherer, Rafał. editor. Korytkowski, Marcin. editor. Pedrycz, Witold. editor. Tadeusiewicz, Ryszard. editor.<br/>Yer Numarası XX(521309.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42505-9">https://doi.org/10.1007/978-3-031-42505-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Artificial Intelligence over Infrared Images for Medical Applications Second MICCAI Workshop, AIIIMA 2023, Held in Conjunction with MICCAI 2023, Vancouver, BC, Canada, October 2, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214032024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Kakileti, Siva Teja. editor. (orcid) Manjunath, Geetha. editor. Schwartz, Robert G. editor. Frangi, Alejandro F. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521403.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-44511-8">https://doi.org/10.1007/978-3-031-44511-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphonomics in Human Body Movement. Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521404.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Functional Neuroradiology Principles and Clinical Applicationsent://SD_ILS/0/SD_ILS:5215812024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Faro, Scott H. editor. Mohamed, Feroze B. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521581.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-10909-6">https://doi.org/10.1007/978-3-031-10909-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Occupational Dermatosesent://SD_ILS/0/SD_ILS:5216382024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Giménez-Arnau, Ana M. editor. Maibach, Howard I. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521638.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-22727-1">https://doi.org/10.1007/978-3-031-22727-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Unlearn Pain The Successful Techniques And Exercises Of Psychological Pain Managementent://SD_ILS/0/SD_ILS:5216872024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Richter, Jutta. author. SpringerLink (Online service)<br/>Yer Numarası XX(521687.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-65702-7">https://doi.org/10.1007/978-3-662-65702-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Point-of-care US for Acute Abdomenent://SD_ILS/0/SD_ILS:5220542024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Zago, Mauro. editor. Troian, Marina. editor. Mariani, Diego. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522054.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-40231-9">https://doi.org/10.1007/978-3-031-40231-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Normal Pressure Hydrocephalus Pathophysiology, Diagnosis, Treatment and Outcomeent://SD_ILS/0/SD_ILS:5220692024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Bradac, Ondrej. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522069.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36522-5">https://doi.org/10.1007/978-3-031-36522-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensory evaluation practicesent://SD_ILS/0/SD_ILS:5224762024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Stone, Herbert, author. Bleibaum, Rebecca N., author. Thomas, Heather A., author.<br/>Yer Numarası XX(522476.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128153345">https://www.sciencedirect.com/science/book/9780128153345</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Influence of nutrients, bioactive compounds and plant extracts in liver diseasesent://SD_ILS/0/SD_ILS:5224932024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Alavian, Seyed Moayed.<br/>Yer Numarası XX(522493.1)<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128164884">https://www.sciencedirect.com/science/book/9780128164884</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pocket guide to stress testingent://SD_ILS/0/SD_ILS:4245432024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Tighe, Dennis A., editor. Gentile, Bryon A., II, editor. Prededed by (work): Chung, Edward K. Pocket guide to stress testing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9781119481737">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Cambridge handbook of research methods in clinical psychologyent://SD_ILS/0/SD_ILS:5062582024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Wright, Aidan G. C., 1980- editor. Hallquist, Michael N., 1981- editor.<br/>Yer Numarası RC467.2 .C36 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781316995808">https://doi.org/10.1017/9781316995808</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Curious about nature : a passion for fieldworkent://SD_ILS/0/SD_ILS:5062622024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Burt, Tim, 1951- editor. Thompson, D. B. A., 1958- editor.<br/>Yer Numarası LB2394 .C87 2020<br/>Elektronik Erişim <a href="https://doi.org/10.1017/9781108552172">https://doi.org/10.1017/9781108552172</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Law of remedies : a European perspectiveent://SD_ILS/0/SD_ILS:5062722024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Hofmann, Franz, 1981- editor. Kurz, Franziska (Writer on law), editor.<br/>Yer Numarası KJC4010 .L39 2019<br/>Elektronik Erişim <a href="https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK">https://www.cambridge.org/core/product/identifier/9781780689449/type/BOOK</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Paediatric Radiology Rapid Reporting for FRCR Part 2Bent://SD_ILS/0/SD_ILS:4836942024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Paddock, Michael. author. Offiah, Amaka C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-01965-5">https://doi.org/10.1007/978-3-030-01965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modelling and Verification of Secure Examsent://SD_ILS/0/SD_ILS:4015712024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Giustolisi, Rosario. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67107-9">https://doi.org/10.1007/978-3-319-67107-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Creative teaching strategies for the nurse educatorent://SD_ILS/0/SD_ILS:3583632024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Herrman, Judith W., author.<br/>Yer Numarası RT71 .H47 2016<br/>Elektronik Erişim <a href="http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk">http://eds.b.ebscohost.com/eds/detail/detail?sid=0f2021f9-c6fc-4534-babe-0c8e7824aec0%40sessionmgr120&crlhashurl=login.aspx%253fdirect%253dtrue%2526hid%253d4208%2526AN%253d966835%2526db%253dnlebk%2526lang%253dtr%2526site%253deds-live&hid=120&vid=0&bdata=Jmxhbmc9dHImc2l0ZT1lZHMtbGl2ZQ%3d%3d#AN=966835&db=nlebk</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Its Applications 5th IFIP TC 5 International Conference, CIIA 2015, Saida, Algeria, May 20-21, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185032024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Amine, Abdelmalek. editor. Bellatreche, Ladjel. editor. Elberrichi, Zakaria. editor. Neuhold, Erich J. editor. Wrembel, Robert. editor.<br/>Yer Numarası XX(518503.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19578-0">https://doi.org/10.1007/978-3-319-19578-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Internet of Things. IoT Infrastructures First International Summit, IoT360 2014, Rome, Italy, October 27-28, 2014, Revised Selected Papers, Part IIent://SD_ILS/0/SD_ILS:5185342024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Giaffreda, Raffaele. editor. Cagáňová, Dagmar. editor. Li, Yong. editor. Riggio, Roberto. editor. Voisard, Agnès. editor.<br/>Yer Numarası XX(518534.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19743-2">https://doi.org/10.1007/978-3-319-19743-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical Approaches to Causal Relationship Explorationent://SD_ILS/0/SD_ILS:5185232024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Li, Jiuyong. author. Liu, Lin. author. Le, Thuc Duy. author. SpringerLink (Online service)<br/>Yer Numarası XX(518523.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-14433-7">https://doi.org/10.1007/978-3-319-14433-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evaluation of Novel Approaches to Software Engineering 9th International Conference, ENASE 2014, Lisbon, Portugal, April 28-30, 2014. Revised Selected Papersent://SD_ILS/0/SD_ILS:5185252024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Maciaszek, Leszek A. editor. Filipe, Joaquim. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518525.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-27218-4">https://doi.org/10.1007/978-3-319-27218-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Formal Modeling and Verification of Cyber-Physical Systems 1st International Summer School on Methods and Tools for the Design of Digital Systems, Bremen, Germany, September 2015ent://SD_ILS/0/SD_ILS:5185282024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Drechsler, Rolf. editor. Kühne, Ulrich. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518528.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-09994-7">https://doi.org/10.1007/978-3-658-09994-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Parallel Scientific Computing Theory, Algorithms, and Applications of Mesh Based and Meshless Methodsent://SD_ILS/0/SD_ILS:5185572024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Trobec, Roman. author. Kosec, Gregor. author. SpringerLink (Online service)<br/>Yer Numarası XX(518557.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-17073-2">https://doi.org/10.1007/978-3-319-17073-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Technological Innovation for Cloud-Based Engineering Systems 6th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2015, Costa de Caparica, Portugal, April 13-15, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185712024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Camarinha-Matos, Luis M. editor. Baldissera, Thais A. editor. Di Orio, Giovanni. editor. Marques, Francisco. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518571.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16766-4">https://doi.org/10.1007/978-3-319-16766-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nordic Contributions in IS Research 6th Scandinavian Conference on Information Systems, SCIS 2015, Oulu, Finland, August 9-12, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5185832024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Oinas-Kukkonen, Harri. editor. Iivari, Netta. editor. Kuutti, Kari. editor. Öörni, Anssi. editor. Rajanen, Mikko. editor.<br/>Yer Numarası XX(518583.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-21783-3">https://doi.org/10.1007/978-3-319-21783-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Knowledge Management in Organizations 10th International Conference, KMO 2015, Maribor, Slovenia, August 24-28, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5186292024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Uden, Lorna. editor. Heričko, Marjan. editor. Ting, I-Hsien. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518629.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-21009-4">https://doi.org/10.1007/978-3-319-21009-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Agile Processes in Software Engineering and Extreme Programming 16th International Conference, XP 2015, Helsinki, Finland, May 25-29, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5186332024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lassenius, Casper. editor. Dingsøyr, Torgeir. editor. Paasivaara, Maria. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518633.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-18612-2">https://doi.org/10.1007/978-3-319-18612-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Cognitive Wireless Networksent://SD_ILS/0/SD_ILS:5187172024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Feng, Zhiyong. author. Zhang, Qixun. author. Zhang, Ping. author. SpringerLink (Online service)<br/>Yer Numarası XX(518717.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-15768-9">https://doi.org/10.1007/978-3-319-15768-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Security Planning An Applied Approachent://SD_ILS/0/SD_ILS:5187202024-12-27T14:56:32Z2024-12-27T14:56:32ZYazar Lincke, Susan. author. SpringerLink (Online service)<br/>Yer Numarası XX(518720.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-16027-6">https://doi.org/10.1007/978-3-319-16027-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>