Arama Sonuçları Test. - Daraltılmış: 1988SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091988$0025091988$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-10-19T11:43:26ZTest validityent://SD_ILS/0/SD_ILS:2684272024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Wainer, Howard. Braun, Henry I., 1949-<br/>Yer Numarası LB3060.7 T47 1988<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Rorschach's testent://SD_ILS/0/SD_ILS:17872024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Beck, Samuel Jacob, 1896-<br/>Yer Numarası BF 431 B3887 1945-61 V.1<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~3<br/>The concept of Jacksonian democracy : New York as a test caseent://SD_ILS/0/SD_ILS:58652024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Benson, Lee.<br/>Yer Numarası F 123 B49 1961<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Structure and sentiment : a test case in social anthropologyent://SD_ILS/0/SD_ILS:718082024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Needham, Rodney.<br/>Yer Numarası GN 480 N43 1962<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Mobilyada test teknikleri ve kalite kontrol üzerine araştırmalar.ent://SD_ILS/0/SD_ILS:243702024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Güray, Arif.<br/>Yer Numarası TEZ 1309 .G87 1988<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>İngilizce test kılavuzu = A Guidebook for English testsent://SD_ILS/0/SD_ILS:284492024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Kocaman, Ahmet. Aksoy, Ziya, ort. yaz. Boztaş, İsmail, ort. yaz.<br/>Yer Numarası PE 1498 K81 1988<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~3<br/>Directory of nuclear reactors.ent://SD_ILS/0/SD_ILS:858822024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar International Atomic Energy Agency.<br/>Yer Numarası TK 9202 I57 V.101976<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>The Amylograph handbookent://SD_ILS/0/SD_ILS:580772024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Shuey, William C., ed. Tipples, Keith H., ed.<br/>Yer Numarası TX 769 A65 1980<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Advanced research in VLSI proceedings of the fifth MIT conference, March 1988ent://SD_ILS/0/SD_ILS:2202762024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Adhesively bonded joints : testing, analysis and designent://SD_ILS/0/SD_ILS:472582024-10-19T11:43:26Z2024-10-19T11:43:26ZYazar Johnson, W. S. , ed.<br/>Yer Numarası TA 492.A3 A34 1988<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>