Arama Sonu&ccedil;lar&#305; Test. - Daralt&#305;lm&#305;&#351;: Computer aided design. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Computer$002baided$002bdesign.$002509Computer$002baided$002bdesign.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-27T00:05:11Z Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration ent://SD_ILS/0/SD_ILS:205572 2024-12-27T00:05:11Z 2024-12-27T00:05:11Z Yazar&#160;Zjajo, Amir. author.&#160;Pineda de Gyvez, Jos&eacute;. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power-Aware Testing and Test Strategies for Low Power Devices ent://SD_ILS/0/SD_ILS:172100 2024-12-27T00:05:11Z 2024-12-27T00:05:11Z Yazar&#160;Girard, Patrick. editor.&#160;Nicolici, Nicola. editor.&#160;Wen, Xiaoqing. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies ent://SD_ILS/0/SD_ILS:172103 2024-12-27T00:05:11Z 2024-12-27T00:05:11Z Yazar&#160;Bosio, Alberto. author.&#160;Dilillo, Luigi. author.&#160;Girard, Patrick. author.&#160;Pravossoudovitch, Serge. author.&#160;Virazel, Arnaud. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500&trade; ent://SD_ILS/0/SD_ILS:166049 2024-12-27T00:05:11Z 2024-12-27T00:05:11Z Yazar&#160;Silva, Francisco. author.&#160;McLaurin, Teresa. author.&#160;Waayers, Tom. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>