Arama Sonuçları Test. - Daraltılmış: Computer engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ic$003dtrue$0026ps$003d300?dt=list2026-04-11T17:39:15ZEmerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Song, Zhengyu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023ent://SD_ILS/0/SD_ILS:6057702026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-3756-7">https://doi.org/10.1007/978-981-97-3756-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fostering Machine Learning and IoT for Blockchain Technology Smart Cities Applications, Volume 2ent://SD_ILS/0/SD_ILS:6091922026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Ahmad, Khaleel. editor. Dulhare, Uma N. editor. Badar, Mohammad Sufian. editor. Ahamed, Jameel. editor. Rizvi, M. A. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-96-4074-4">https://doi.org/10.1007/978-981-96-4074-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023ent://SD_ILS/0/SD_ILS:6055992026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-5269-0">https://doi.org/10.1007/978-981-97-5269-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fostering Machine Learning and IoT for Blockchain Technology Smart Cities Applications, Volume 1ent://SD_ILS/0/SD_ILS:6096462026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Ahmad, Khaleel. editor. Dulhare, Uma N. editor. Badar, Mohammad Sufian. editor. Ahamed, Jameel. editor. Rizvi, M. A. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-96-4078-2">https://doi.org/10.1007/978-981-96-4078-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Attacks, Defenses and Testing for Deep Learningent://SD_ILS/0/SD_ILS:6038312026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Chen, Jinyin. author. (orcid)0000-0002-7153-2755 Zhang, Ximin. author. Zheng, Haibin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-0425-5">https://doi.org/10.1007/978-981-97-0425-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papersent://SD_ILS/0/SD_ILS:6182932026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-46097-0">https://doi.org/10.1007/978-3-319-46097-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Signal Integrity Applied Electromagnetics and Professional Practiceent://SD_ILS/0/SD_ILS:6150852026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Russ, Samuel H. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-29758-3">https://doi.org/10.1007/978-3-319-29758-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Convertersent://SD_ILS/0/SD_ILS:5303242026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Ohnhäuser, Frank. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47020-6">https://doi.org/10.1007/978-3-662-47020-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital design and fabricationent://SD_ILS/0/SD_ILS:5405042026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Oklobdzija, Vojin G.<br/>Yer Numarası TK7885 .D54 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932026-04-11T17:39:15Z2026-04-11T17:39:15ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>