Arama Sonuçları Test. - Daraltılmış: Computer hardware.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bhardware.$002509Computer$002bhardware.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2024-09-21T14:19:23ZTest und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Dateent://SD_ILS/0/SD_ILS:1698262024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System-level Test and Validation of Hardware/Software Systemsent://SD_ILS/0/SD_ILS:1752722024-09-21T14:19:23Z2024-09-21T14:19:23ZYazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>