Arama Sonuçları Test. - Daraltılmış: Computer science.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bscience.$002509Computer$002bscience.$0026te$003dILS$0026ps$003d300?dt=list
2024-12-27T01:13:48Z
Test und Verlässlichkeit von Rechnern
ent://SD_ILS/0/SD_ILS:186260
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Kemnitz, Günter. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test and Analysis of Web Services
ent://SD_ILS/0/SD_ILS:186686
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design Driven Testing Test Smarter, Not Harder
ent://SD_ILS/0/SD_ILS:171408
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:335156
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Yer Numarası ONLINE(335156.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmen
ent://SD_ILS/0/SD_ILS:338309
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Kleuker, Stephan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(338309.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
ent://SD_ILS/0/SD_ILS:331265
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Quality Test Pattern Generation and Boolean Satisfiability
ent://SD_ILS/0/SD_ILS:173360
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197090
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test-Driven Development An Empirical Evaluation of Agile Practice
ent://SD_ILS/0/SD_ILS:190899
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Madeyski, Lech. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-04288-1">http://dx.doi.org/10.1007/978-3-642-04288-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Efficient Test Methodologies for High-Speed Serial Links
ent://SD_ILS/0/SD_ILS:205084
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-3443-4">http://dx.doi.org/10.1007/978-90-481-3443-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Parsing the Turing Test Philosophical and Methodological Issues in the Quest for the Thinking Computer
ent://SD_ILS/0/SD_ILS:169908
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Epstein, Robert. editor. Roberts, Gary. editor. Beber, Grace. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6710-5">http://dx.doi.org/10.1007/978-1-4020-6710-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Testing Network An Integral Approach to Test Activities in Large Software Projects
ent://SD_ILS/0/SD_ILS:188154
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Henry, Pierre. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-78504-0">http://dx.doi.org/10.1007/978-3-540-78504-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
.NET Test Automation Recipes A Problem-Solution Approach
ent://SD_ILS/0/SD_ILS:170868
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar McCaffrey, James D. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4302-0163-2">http://dx.doi.org/10.1007/978-1-4302-0163-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modelling and Verification of Secure Exams
ent://SD_ILS/0/SD_ILS:401571
2024-12-27T01:13:48Z
2024-12-27T01:13:48Z
Yazar Giustolisi, Rosario. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67107-9">https://doi.org/10.1007/978-3-319-67107-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>