Arama Sonuçları Test. - Daraltılmış: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?
2024-11-13T07:37:27Z
VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Asai, Shojiro. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques
ent://SD_ILS/0/SD_ILS:484884
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
ent://SD_ILS/0/SD_ILS:487405
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The science of sound recording
ent://SD_ILS/0/SD_ILS:267103
2024-11-13T07:37:27Z
2024-11-13T07:37:27Z
Yazar Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>