Arama Sonuçları Test. - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300?
2026-02-20T16:26:09Z
Microelectronic Test Structures for CMOS Technology
ent://SD_ILS/0/SD_ILS:173193
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Yazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Circuit Test Engineering Modern Techniques
ent://SD_ILS/0/SD_ILS:175290
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electrical connectors : design, manufacture, test, and selection
ent://SD_ILS/0/SD_ILS:596172
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Pecht, Michael, editor. Kyeong, San, editor.<br/>Yer Numarası TK3521<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Pattern Generation using Boolean Proof Engines
ent://SD_ILS/0/SD_ILS:204765
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of 3D integration. Volume 4, Design, test, and thermal management
ent://SD_ILS/0/SD_ILS:595051
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Yer Numarası TK7874.893 .H36 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Critical mm-Wave Components for Synthetic Automatic Test Systems
ent://SD_ILS/0/SD_ILS:529644
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Hrobak, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
ent://SD_ILS/0/SD_ILS:331265
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Quality Test Pattern Generation and Boolean Satisfiability
ent://SD_ILS/0/SD_ILS:173360
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
ent://SD_ILS/0/SD_ILS:205484
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
ent://SD_ILS/0/SD_ILS:205572
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
ent://SD_ILS/0/SD_ILS:166333
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Liu, Ai-Qun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
ent://SD_ILS/0/SD_ILS:169826
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Systems on a Chip: Design and Test
ent://SD_ILS/0/SD_ILS:165857
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
ent://SD_ILS/0/SD_ILS:176933
2026-02-20T16:26:09Z
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Yazar Weinmann, Alexander. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-37139-8">http://dx.doi.org/10.1007/978-3-211-37139-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
2026-02-20T16:26:09Z
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Yazar Larsson, Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pi
ent://SD_ILS/0/SD_ILS:599880
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Arif, Tariq M., author. John Wiley & Sons, publisher.<br/>Yer Numarası Q325.73 .A75 2025<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of VHDL for FPGA programming using Vivado
ent://SD_ILS/0/SD_ILS:600313
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Pakdel, Majid, author.<br/>Yer Numarası TK7885.7<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analog devices and circuits. 2, Analog devices
ent://SD_ILS/0/SD_ILS:598976
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Gontrand, Christian, author.<br/>Yer Numarası TK7867 .G65 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394276769">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394276769</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
ent://SD_ILS/0/SD_ILS:597980
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Yer Numarası TK7876 .D83 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital system design using FSMs : a practical learning approach
ent://SD_ILS/0/SD_ILS:596738
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Minns, Peter D., author.<br/>Yer Numarası QA267.5 .S4 M56 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782735">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119782735</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The ESD control program handbook
ent://SD_ILS/0/SD_ILS:595961
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Smallwood, J. M. (Jeremy M.), author.<br/>Yer Numarası TK7870<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wearable computing : from modelling to implementation of wearable systems based on body sensor networks
ent://SD_ILS/0/SD_ILS:594235
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Fortino, Giancarlo, 1971- author. Gravina, Raffaele, 1982- author. Galzarano, Stefano, 1984- author.<br/>Yer Numarası QA76.592 .F67 2018<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119078807">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119078807</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Yer Numarası TA169.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Real-time embedded systems
ent://SD_ILS/0/SD_ILS:593770
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Wang, Jiacun, 1963- author.<br/>Yer Numarası TK7895 .E42<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
ent://SD_ILS/0/SD_ILS:530324
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Ohnhäuser, Frank. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-47020-6">https://doi.org/10.1007/978-3-662-47020-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:530446
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06986-9">https://doi.org/10.1007/978-3-319-06986-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
ent://SD_ILS/0/SD_ILS:530077
2026-02-20T16:26:09Z
2026-02-20T16:26:09Z
Yazar Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-1556-9">https://doi.org/10.1007/978-1-4939-1556-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>