Arama Sonuçları Test. - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list
2024-12-27T15:44:12Z
Microelectronic Test Structures for CMOS Technology
ent://SD_ILS/0/SD_ILS:173193
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Circuit Test Engineering Modern Techniques
ent://SD_ILS/0/SD_ILS:175290
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Pattern Generation using Boolean Proof Engines
ent://SD_ILS/0/SD_ILS:204765
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
ent://SD_ILS/0/SD_ILS:331265
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Quality Test Pattern Generation and Boolean Satisfiability
ent://SD_ILS/0/SD_ILS:173360
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
ent://SD_ILS/0/SD_ILS:205484
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
ent://SD_ILS/0/SD_ILS:205572
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
ent://SD_ILS/0/SD_ILS:166333
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Liu, Ai-Qun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
ent://SD_ILS/0/SD_ILS:169826
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
ent://SD_ILS/0/SD_ILS:176933
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Weinmann, Alexander. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-37139-8">http://dx.doi.org/10.1007/978-3-211-37139-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Systems on a Chip: Design and Test
ent://SD_ILS/0/SD_ILS:165857
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Larsson, Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
2024-12-27T15:44:12Z
2024-12-27T15:44:12Z
Yazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>