Arama Sonuçları Test. - Daraltılmış: Engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Engineering.$002509Engineering.$0026ps$003d300$0026isd$003dtrue?
2024-09-21T14:20:23Z
Microelectronic Test Structures for CMOS Technology
ent://SD_ILS/0/SD_ILS:173193
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Circuit Test Engineering Modern Techniques
ent://SD_ILS/0/SD_ILS:175290
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Grout, Ian A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test and Diagnosis for Small-Delay Defects
ent://SD_ILS/0/SD_ILS:173108
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Pattern Generation using Boolean Proof Engines
ent://SD_ILS/0/SD_ILS:204765
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approach
ent://SD_ILS/0/SD_ILS:330986
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Boiko, Igor. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(330986.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Analysis and Test of Logic Circuits Under Uncertainty
ent://SD_ILS/0/SD_ILS:335669
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335669.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Data
ent://SD_ILS/0/SD_ILS:333195
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Yer Numarası ONLINE(333195.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
ent://SD_ILS/0/SD_ILS:331265
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(331265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technology
ent://SD_ILS/0/SD_ILS:334420
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334420.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37398-5">http://dx.doi.org/10.1007/978-3-642-37398-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
ent://SD_ILS/0/SD_ILS:168647
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-977-2">http://dx.doi.org/10.1007/978-0-85729-977-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High Quality Test Pattern Generation and Boolean Satisfiability
ent://SD_ILS/0/SD_ILS:173360
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
ent://SD_ILS/0/SD_ILS:173242
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9548-3">http://dx.doi.org/10.1007/978-1-4419-9548-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
ent://SD_ILS/0/SD_ILS:205572
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
ent://SD_ILS/0/SD_ILS:205484
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Power-Aware Testing and Test Strategies for Low Power Devices
ent://SD_ILS/0/SD_ILS:172100
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
ent://SD_ILS/0/SD_ILS:172103
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Efficient Test Methodologies for High-Speed Serial Links
ent://SD_ILS/0/SD_ILS:205084
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-3443-4">http://dx.doi.org/10.1007/978-90-481-3443-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
ent://SD_ILS/0/SD_ILS:166333
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Liu, Ai-Qun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
ent://SD_ILS/0/SD_ILS:169826
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
ent://SD_ILS/0/SD_ILS:170135
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design of Systems on a Chip: Design and Test
ent://SD_ILS/0/SD_ILS:165857
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
ent://SD_ILS/0/SD_ILS:176933
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Weinmann, Alexander. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-37139-8">http://dx.doi.org/10.1007/978-3-211-37139-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Make and Test Projects in Engineering Design Creativity, Engagement and Learning
ent://SD_ILS/0/SD_ILS:175361
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Samuel, Andrew Emery. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-285-3">http://dx.doi.org/10.1007/1-84628-285-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Larsson, Erik. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
2024-09-21T14:20:23Z
2024-09-21T14:20:23Z
Yazar Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>