Arama Sonuçları Test. - Daraltılmış: Microprocessors.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Microprocessors.$002509Microprocessors.$0026ps$003d300?
2025-12-25T09:05:54Z
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
2025-12-25T09:05:54Z
2025-12-25T09:05:54Z
Yazar Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques
ent://SD_ILS/0/SD_ILS:484884
2025-12-25T09:05:54Z
2025-12-25T09:05:54Z
Yazar Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
ent://SD_ILS/0/SD_ILS:487405
2025-12-25T09:05:54Z
2025-12-25T09:05:54Z
Yazar Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Machine Learning Support for Fault Diagnosis of System-on-Chip
ent://SD_ILS/0/SD_ILS:527527
2025-12-25T09:05:54Z
2025-12-25T09:05:54Z
Yazar Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Counterfeit Integrated Circuits Detection and Avoidance
ent://SD_ILS/0/SD_ILS:530174
2025-12-25T09:05:54Z
2025-12-25T09:05:54Z
Yazar Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>