Arama Sonu&ccedil;lar&#305; Test. - Daralt&#305;lm&#305;&#351;: Processor Architectures. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTest.$0026qf$003dSUBJECT$002509Konu$002509Processor$002bArchitectures.$002509Processor$002bArchitectures.$0026ps$003d300? 2026-03-01T15:53:28Z System-Level Validation High-Level Modeling and Directed Test Generation Techniques ent://SD_ILS/0/SD_ILS:331265 2026-03-01T15:53:28Z 2026-03-01T15:53:28Z Yazar&#160;Chen, Mingsong. author.&#160;Qin, Xiaoke. author.&#160;Koo, Heon-Mo. author.&#160;Mishra, Prabhat. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331265.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:335156 2026-03-01T15:53:28Z 2026-03-01T15:53:28Z Yazar&#160;Gaur, Manoj Singh. editor.&#160;Zwolinski, Mark. editor.&#160;Laxmi, Vijay. editor.&#160;Boolchandani, Dharmendra. editor.&#160;Sing, Virendra. editor.<br/>Yer Numaras&#305;&#160;ONLINE(335156.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Machine Learning Support for Fault Diagnosis of System-on-Chip ent://SD_ILS/0/SD_ILS:527527 2026-03-01T15:53:28Z 2026-03-01T15:53:28Z Yazar&#160;Girard, Patrick. editor.&#160;Blanton, Shawn. editor.&#160;Wang, Li-C. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Counterfeit Integrated Circuits Detection and Avoidance ent://SD_ILS/0/SD_ILS:530174 2026-03-01T15:53:28Z 2026-03-01T15:53:28Z Yazar&#160;Tehranipoor, Mark (Mohammad). author.&#160;Guin, Ujjwal. author.&#160;Forte, Domenic. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>