Arama Sonuçları Testen. - Daraltılmış: English
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesten.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?dt=list
2026-01-15T22:59:59Z
VLSI test principles and architectures design for testability
ent://SD_ILS/0/SD_ILS:253779
2026-01-15T22:59:59Z
2026-01-15T22:59:59Z
Yazar Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Assessing Speaking
ent://SD_ILS/0/SD_ILS:236742
2026-01-15T22:59:59Z
2026-01-15T22:59:59Z
Yazar Luoma, Sari.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511733017">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
2026-01-15T22:59:59Z
2026-01-15T22:59:59Z
Yazar Wang, Francis C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>