Arama Sonu&ccedil;lar&#305; Testing. - Daralt&#305;lm&#305;&#351;: SpringerLink (Online service) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dAUTHOR$002509Yazar$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026ps$003d300?dt=list 2026-06-05T02:09:58Z Thyroid Function Testing ent://SD_ILS/0/SD_ILS:172262 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Brent, Gregory A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-1485-9">http://dx.doi.org/10.1007/978-1-4419-1485-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic Endocrine Testing ent://SD_ILS/0/SD_ILS:607387 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Sch&auml;ffler, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-70260-4">https://doi.org/10.1007/978-3-662-70260-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Basic Serological Testing ent://SD_ILS/0/SD_ILS:401194 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Alhabbab, Rowa Yousef. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-77694-1">https://doi.org/10.1007/978-3-319-77694-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-Driven Testing ent://SD_ILS/0/SD_ILS:186585 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Baker, Paul. author.&#160;Dai, Zhen Ru. author.&#160;Grabowski, Jens. author.&#160;Haugen, &Oslash;ystein. author.&#160;Schieferdecker, Ina. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72563-3">http://dx.doi.org/10.1007/978-3-540-72563-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Statistical Hypotheses ent://SD_ILS/0/SD_ILS:165411 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Lehmann, E. 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Laurence. author.&#160;Gupta, Manjula K. author.&#160;Hamrahian, Amir H. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-13048-4">https://doi.org/10.1007/978-3-319-13048-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Informed Consent in Predictive Genetic Testing A Revised Model ent://SD_ILS/0/SD_ILS:519858 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Minor, Jessica. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-17416-7">https://doi.org/10.1007/978-3-319-17416-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Molecular Oncology Testing for Solid Tumors A Pragmatic Approach ent://SD_ILS/0/SD_ILS:520056 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Idowu, Michael Ola. editor.&#160;Dumur, Catherine Isabelle. editor.&#160;Garrett, Carleton Theodore. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-16304-8">https://doi.org/10.1007/978-3-319-16304-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The ISRM Suggested Methods for Rock Characterization, Testing and Monitoring: 2007-2014 ent://SD_ILS/0/SD_ILS:529625 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Ulusay, R. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07713-0">https://doi.org/10.1007/978-3-319-07713-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 11th International Haifa Verification 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editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-11340-1">https://doi.org/10.1007/978-3-319-11340-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Future Internet Testing First International Workshop, FITTEST 2013, Istanbul, Turkey, November 12, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:488988 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Vos, Tanja E.J. editor.&#160;Lakhotia, Kiran. editor.&#160;Bauersfeld, Sebastian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07785-7">https://doi.org/10.1007/978-3-319-07785-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Molecular Diagnostics for Dermatology Practical Applications of Molecular Testing for the Diagnosis and Management of the Dermatology Patient ent://SD_ILS/0/SD_ILS:489210 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Hosler, Gregory A. author.&#160;Murphy, Kathleen M. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-54066-0">https://doi.org/10.1007/978-3-642-54066-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 26th IFIP WG 6.1 International Conference, ICTSS 2014, Madrid, Spain, September 23-25, 2014. Proceedings ent://SD_ILS/0/SD_ILS:489402 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Merayo, Mercedes G. editor.&#160;Montes de Oca, Edgardo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-44857-1">https://doi.org/10.1007/978-3-662-44857-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Agile Methods. Large-Scale Development, Refactoring, Testing, and Estimation XP 2014 International Workshops, Rome, Italy, May 26-30, 2014, Revised Selected Papers ent://SD_ILS/0/SD_ILS:489435 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Dings&oslash;yr, Torgeir. editor.&#160;Moe, Nils Brede. editor.&#160;Tonelli, Roberto. editor.&#160;Counsell, Steve. editor.&#160;Gencel, Cigdem. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-14358-3">https://doi.org/10.1007/978-3-319-14358-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 10th International Haifa Verification Conference, HVC 2014, Haifa, Israel, November 18-20, 2014, Proceedings ent://SD_ILS/0/SD_ILS:489622 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yahav, Eran. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-13338-6">https://doi.org/10.1007/978-3-319-13338-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing - SAT 2014 17th International Conference, Held as Part of the Vienna Summer of Logic, VSL 2014, Vienna, Austria, July 14-17, 2014, Proceedings ent://SD_ILS/0/SD_ILS:485622 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Sinz, Carsten. editor.&#160;Egly, Uwe. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-09284-3">https://doi.org/10.1007/978-3-319-09284-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk Assessment and Risk-Driven Testing First International Workshop, RISK 2013, Held in Conjunction with ICTSS 2013, Istanbul, Turkey, November 12, 2013. Revised Selected Papers ent://SD_ILS/0/SD_ILS:487821 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bauer, Thomas. editor.&#160;Gro&szlig;mann, J&uuml;rgen. editor.&#160;Seehusen, Fredrik. editor.&#160;St&oslash;len, Ketil. editor.&#160;Wendland, Marc-Florian. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07076-6">https://doi.org/10.1007/978-3-319-07076-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flexural Testing of Weld Site and HVOF Coating Characteristics ent://SD_ILS/0/SD_ILS:488629 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yilbas, Bekir Sami. author.&#160;Al-Zaharnah, Iyad. author.&#160;Sahin, Ahmet. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-54977-9">https://doi.org/10.1007/978-3-642-54977-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A Multiple-Testing Approach to the Multivariate Behrens-Fisher Problem with Simulations and Examples in SAS&reg; ent://SD_ILS/0/SD_ILS:332032 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Desai, Tejas. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332032.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6443-3">http://dx.doi.org/10.1007/978-1-4614-6443-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 9th International Haifa Verification Conference, HVC 2013, Haifa, Israel, November 5-7, 2013, Proceedings ent://SD_ILS/0/SD_ILS:332962 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bertacco, Valeria. editor.&#160;Legay, Axel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332962.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-03077-7">http://dx.doi.org/10.1007/978-3-319-03077-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Flight Testing Results of the Closing Symposium of the German Research Initiative ComFliTe, Braunschweig, Germany, June 11th-12th, 2012 ent://SD_ILS/0/SD_ILS:334689 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Kroll, Norbert. editor.&#160;Radespiel, Rolf. editor.&#160;Burg, Jan Willem. editor.&#160;S&oslash;rensen, Kaare. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334689.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-38877-4">http://dx.doi.org/10.1007/978-3-642-38877-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2013 16th International Conference, Helsinki, Finland, July 8-12, 2013. Proceedings ent://SD_ILS/0/SD_ILS:334724 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;J&auml;rvisalo, Matti. editor.&#160;Van Gelder, Allen. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334724.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-39071-5">http://dx.doi.org/10.1007/978-3-642-39071-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 8th International Haifa Verification Conference, HVC 2012, Haifa, Israel, November 6-8, 2012. Revised Selected Papers ent://SD_ILS/0/SD_ILS:334820 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Biere, Armin. editor.&#160;Nahir, Amir. editor.&#160;Vos, Tanja. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334820.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-39611-3">http://dx.doi.org/10.1007/978-3-642-39611-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 25th IFIP WG 6.1 International Conference, ICTSS 2013, Istanbul, Turkey, November 13-15, 2013, Proceedings ent://SD_ILS/0/SD_ILS:335141 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yenig&uuml;n, H&uuml;sn&uuml;. editor.&#160;Yilmaz, Cemal. editor.&#160;Ulrich, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335141.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-41707-8">http://dx.doi.org/10.1007/978-3-642-41707-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Interlaboratory Testing and Evaluation of Bituminous Materials State-of-the-Art Report of the RILEM Technical Committee 206-ATB ent://SD_ILS/0/SD_ILS:335888 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Partl, Manfred N. editor.&#160;Bahia, Hussain U. editor.&#160;Canestrari, Francesco. editor.&#160;de la Roche, Chantal. editor.&#160;Di Benedetto, Herv&eacute;. editor.<br/>Yer Numaras&#305;&#160;ONLINE(335888.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-5104-0">http://dx.doi.org/10.1007/978-94-007-5104-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Times A History of Vocational, Civil Service and Secondary Examinations in England since 1850 ent://SD_ILS/0/SD_ILS:336482 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Willis, Richard. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(336482.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-6209-482-6">http://dx.doi.org/10.1007/978-94-6209-482-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical Patch Testing and Chemical Allergens in Contact Dermatitis ent://SD_ILS/0/SD_ILS:331016 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Jacob, Sharon E. author.&#160;Herro, Elise M. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331016.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4585-1">http://dx.doi.org/10.1007/978-1-4471-4585-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Finite Element Analysis for Satellite Structures Applications to Their Design, Manufacture and Testing ent://SD_ILS/0/SD_ILS:331031 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Abdelal, Gasser F. author.&#160;Abuelfoutouh, Nader. author.&#160;Gad, Ahmed H. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331031.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-4637-7">http://dx.doi.org/10.1007/978-1-4471-4637-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Global Approach in Safety Testing ICH Guidelines Explained ent://SD_ILS/0/SD_ILS:331908 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;van der Laan, Jan Willem. editor.&#160;DeGeorge, Joseph J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(331908.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-5950-7">http://dx.doi.org/10.1007/978-1-4614-5950-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II). ent://SD_ILS/0/SD_ILS:333744 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;SAE-China. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333744.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33738-3">http://dx.doi.org/10.1007/978-3-642-33738-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I). ent://SD_ILS/0/SD_ILS:333763 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;SAE-China. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333763.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33835-9">http://dx.doi.org/10.1007/978-3-642-33835-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Testing in the Cloud Migration and Execution ent://SD_ILS/0/SD_ILS:197182 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Tilley, Scott. author.&#160;Parveen, Tauhida. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32122-1">http://dx.doi.org/10.1007/978-3-642-32122-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 7th International Haifa Verification Conference, HVC 2011, Haifa, Israel, December 6-8, 2011, Revised Selected Papers ent://SD_ILS/0/SD_ILS:197489 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Eder, Kerstin. editor.&#160;Louren&ccedil;o, Jo&atilde;o. editor.&#160;Shehory, Onn. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik 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Proceedings ent://SD_ILS/0/SD_ILS:197540 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Nielsen, Brian. editor.&#160;Weise, Carsten. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34691-0">http://dx.doi.org/10.1007/978-3-642-34691-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Patch Testing and Prick Testing A Practical Guide Official Publication of the ICDRG ent://SD_ILS/0/SD_ILS:195959 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Lachapelle, Jean-Marie. author.&#160;Maibach, Howard I. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25492-5">http://dx.doi.org/10.1007/978-3-642-25492-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2012 15th International Conference, Trento, Italy, June 17-20, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197115 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Cimatti, Alessandro. editor.&#160;Sebastiani, Roberto. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-31612-8">http://dx.doi.org/10.1007/978-3-642-31612-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Innovation in Vaccinology from design, through to delivery and testing ent://SD_ILS/0/SD_ILS:206676 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Baschieri, Selene. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-4543-8">http://dx.doi.org/10.1007/978-94-007-4543-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> 7th RILEM International Conference on Cracking in Pavements Mechanisms, Modeling, Testing, Detection and Prevention Case Histories ent://SD_ILS/0/SD_ILS:206679 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Scarpas, A. editor.&#160;Kringos, N. editor.&#160;Al-Qadi, I. editor.&#160;A., Loizos. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-4566-7">http://dx.doi.org/10.1007/978-94-007-4566-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Materials Challenges and Testing for Supply of Energy and Resources ent://SD_ILS/0/SD_ILS:195317 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;B&ouml;llinghaus, Thomas. editor.&#160;Lexow, J&uuml;rgen. editor.&#160;Kishi, Teruo. editor.&#160;Kitagawa, Masaki. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23348-7">http://dx.doi.org/10.1007/978-3-642-23348-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop ent://SD_ILS/0/SD_ILS:206228 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Fardis, Michael N. editor.&#160;Rakicevic, Zoran T. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-94-007-1977-4">http://dx.doi.org/10.1007/978-94-007-1977-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Group Testing Theory in Network Security An Advanced Solution ent://SD_ILS/0/SD_ILS:173597 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Thai, My T. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0128-5">http://dx.doi.org/10.1007/978-1-4614-0128-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Genetically Engineered Mice for Cancer Research design, analysis, pathways, validation and pre-clinical testing ent://SD_ILS/0/SD_ILS:166738 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Green, Jeffrey E. editor.&#160;Ried, Thomas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-69805-2">http://dx.doi.org/10.1007/978-0-387-69805-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Basel II Risk Parameters Estimation, Validation, Stress Testing - with Applications to Loan Risk Management ent://SD_ILS/0/SD_ILS:193189 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Engelmann, Bernd. editor.&#160;Rauhmeier, Robert. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16114-8">http://dx.doi.org/10.1007/978-3-642-16114-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 5th International Haifa Verification Conference, HVC 2009, Haifa, Israel, October 19-22, 2009, Revised Selected Papers ent://SD_ILS/0/SD_ILS:193978 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Namjoshi, Kedar. editor.&#160;Zeller, Andreas. editor.&#160;Ziv, Avi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-19237-1">http://dx.doi.org/10.1007/978-3-642-19237-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Permutation Testing for Isotonic Inference on Association Studies in Genetics ent://SD_ILS/0/SD_ILS:194422 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Salmaso, Luigi.&#160;Arboretti, Rosa.&#160;Corain, Livio.&#160;Mazzaro, Dario.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20584-2">http://dx.doi.org/10.1007/978-3-642-20584-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Pharmacogenomic Testing in Current Clinical Practice Implementation in the Clinical Laboratory ent://SD_ILS/0/SD_ILS:175000 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Wu, Alan H. B. editor.&#160;Yeo, Kiang-Teck J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-60761-283-4">http://dx.doi.org/10.1007/978-1-60761-283-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers ent://SD_ILS/0/SD_ILS:194090 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Barner, Sharon. editor.&#160;Harris, Ian. editor.&#160;Kroening, Daniel. editor.&#160;Raz, Orna. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-19583-9">http://dx.doi.org/10.1007/978-3-642-19583-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing - SAT 2011 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedings ent://SD_ILS/0/SD_ILS:194747 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Sakallah, Karem A. editor.&#160;Simon, Laurent. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-21581-0">http://dx.doi.org/10.1007/978-3-642-21581-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 23rd IFIP WG 6.1 International Conference, ICTSS 2011, Paris, France, November 7-10, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195681 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Wolff, Burkhart. editor.&#160;Za&iuml;di, Fatiha. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24580-0">http://dx.doi.org/10.1007/978-3-642-24580-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical Aspects of Cosmetic Testing How to Set up a Scientific Study in Skin Physiology ent://SD_ILS/0/SD_ILS:191145 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Fluhr, Joachim. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05067-1">http://dx.doi.org/10.1007/978-3-642-05067-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Split Hopkinson (Kolsky) Bar Design, Testing and Applications ent://SD_ILS/0/SD_ILS:173034 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Chen, Weinong. author.&#160;Song, Bo. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7982-7">http://dx.doi.org/10.1007/978-1-4419-7982-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Materials with Complex Behaviour Modelling, Simulation, Testing, and Applications ent://SD_ILS/0/SD_ILS:192070 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;&Ouml;chsner, Andreas. editor.&#160;Silva, Lucas Filipe Martins. editor.&#160;Altenbach, Holm. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-12667-3">http://dx.doi.org/10.1007/978-3-642-12667-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing &ndash; Practice and Research Techniques 5th International Academic and Industrial Conference, TAIC PART 2010, Windsor, UK, September 3-5, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193017 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bottaci, Leonardo. editor.&#160;Fraser, Gordon. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15585-7">http://dx.doi.org/10.1007/978-3-642-15585-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2010 13th International Conference, SAT 2010, Edinburgh, UK, July 11-14, 2010. Proceedings ent://SD_ILS/0/SD_ILS:192572 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Strichman, Ofer. editor.&#160;Szeider, Stefan. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14186-7">http://dx.doi.org/10.1007/978-3-642-14186-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Techniques in Software Engineering Second Pernambuco Summer School on Software Engineering, PSSE 2007, Recife, Brazil, December 3-7, 2007, Revised Lectures ent://SD_ILS/0/SD_ILS:192618 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Borba, Paulo. editor.&#160;Cavalcanti, Ana. editor.&#160;Sampaio, Augusto. editor.&#160;Woodcook, Jim. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14335-9">http://dx.doi.org/10.1007/978-3-642-14335-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Molecular Wires A Photophysical and Quantum Chemical Assay ent://SD_ILS/0/SD_ILS:192753 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Wielopolski, Mateusz. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14740-1">http://dx.doi.org/10.1007/978-3-642-14740-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 22nd IFIP WG 6.1 International Conference, ICTSS 2010, Natal, Brazil, November 8-10, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193340 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Petrenko, Alexandre. editor.&#160;Sim&atilde;o, Adenilso. editor.&#160;Maldonado, Jos&eacute; Carlos. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16573-3">http://dx.doi.org/10.1007/978-3-642-16573-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Psychology of Driving on Rural Roads Development and Testing of a Model ent://SD_ILS/0/SD_ILS:179586 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Weller, Gert. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-531-92414-4">http://dx.doi.org/10.1007/978-3-531-92414-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power-Aware Testing and Test Strategies for Low Power Devices ent://SD_ILS/0/SD_ILS:172100 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Girard, Patrick. editor.&#160;Nicolici, Nicola. editor.&#160;Wen, Xiaoqing. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Patch Testing and Prick Testing A Practical Guide Official Publication of the ICDRG ent://SD_ILS/0/SD_ILS:189463 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Lachapelle, Jean-Marie. author.&#160;Maibach, Howard I. author.&#160;Ring, Johannes. author.&#160;Darsow, Ulf. author.&#160;Rustemeyer, Thomas. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-92806-5">http://dx.doi.org/10.1007/978-3-540-92806-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing - SAT 2009 12th International Conference, SAT 2009, Swansea, UK, June 30 - July 3, 2009. Proceedings ent://SD_ILS/0/SD_ILS:190421 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Kullmann, Oliver. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-02777-2">http://dx.doi.org/10.1007/978-3-642-02777-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings ent://SD_ILS/0/SD_ILS:190091 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Chockler, Hana. editor.&#160;Hu, Alan J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-01702-5">http://dx.doi.org/10.1007/978-3-642-01702-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communication Systems 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings ent://SD_ILS/0/SD_ILS:191134 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;N&uacute;&ntilde;ez, Manuel. editor.&#160;Baker, Paul. editor.&#160;Merayo, Mercedes G. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05031-2">http://dx.doi.org/10.1007/978-3-642-05031-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Exercise Stress Testing for Primary Care and Sports Medicine ent://SD_ILS/0/SD_ILS:167379 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Evans, Corey H. editor.&#160;White, Russell D. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-76597-6">http://dx.doi.org/10.1007/978-0-387-76597-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Primality Testing and Integer Factorization in Public-Key Cryptography ent://SD_ILS/0/SD_ILS:167452 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yan, Song Y. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-77268-4">http://dx.doi.org/10.1007/978-0-387-77268-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Stability Testing in Pharmaceutical Development Regulations, Methodologies, and Best Practices ent://SD_ILS/0/SD_ILS:167784 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Huynh-Ba, Kim. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-85627-8">http://dx.doi.org/10.1007/978-0-387-85627-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables ent://SD_ILS/0/SD_ILS:168058 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Farahmand, Bahram. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-95924-5">http://dx.doi.org/10.1007/978-0-387-95924-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Data Modeling for Metrology and Testing in Measurement Science ent://SD_ILS/0/SD_ILS:168295 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Pavese, Franco. editor.&#160;Forbes, Alistair B. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007. Proceedings ent://SD_ILS/0/SD_ILS:188031 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yorav, Karen. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77966-7">http://dx.doi.org/10.1007/978-3-540-77966-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2008 11th International Conference, SAT 2008, Guangzhou, China, May 12-15, 2008. Proceedings ent://SD_ILS/0/SD_ILS:188500 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Kleine B&uuml;ning, Hans. editor.&#160;Zhao, Xishun. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-79719-7">http://dx.doi.org/10.1007/978-3-540-79719-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Modern Testing Techniques for Structural Systems Dynamics and Control ent://SD_ILS/0/SD_ILS:176809 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bursi, Oreste S. editor.&#160;Wagg, David. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-211-09445-7">http://dx.doi.org/10.1007/978-3-211-09445-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings ent://SD_ILS/0/SD_ILS:185500 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Suzuki, Kenji. editor.&#160;Higashino, Teruo. editor.&#160;Ulrich, Andreas. editor.&#160;Hasegawa, Toru. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68524-1">http://dx.doi.org/10.1007/978-3-540-68524-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Testing Network An Integral Approach to Test Activities in Large Software Projects ent://SD_ILS/0/SD_ILS:188154 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Henry, Pierre. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78504-0">http://dx.doi.org/10.1007/978-3-540-78504-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Methods and Testing An Outcome of the FORTEST Network, Revised Selected Papers ent://SD_ILS/0/SD_ILS:188277 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Hierons, Robert M. editor.&#160;Bowen, Jonathan P. editor.&#160;Harman, Mark. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78917-8">http://dx.doi.org/10.1007/978-3-540-78917-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Acoustic Emission Testing Basics for Research - Applications in Civil Engineering ent://SD_ILS/0/SD_ILS:185959 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Grosse, Christian. editor.&#160;Ohtsu, Masayasu. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-69972-9">http://dx.doi.org/10.1007/978-3-540-69972-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Micro and Nano Mechanical Testing of Materials and Devices ent://SD_ILS/0/SD_ILS:167605 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Yang, Fuqian. editor.&#160;Li, James C.M. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-78701-5">http://dx.doi.org/10.1007/978-0-387-78701-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, Life Testing and the Prediction of Service Lives For Engineers and Scientists ent://SD_ILS/0/SD_ILS:166411 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Saunders, Sam C. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-48538-6">http://dx.doi.org/10.1007/978-0-387-48538-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software, Verification and Testing Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papers ent://SD_ILS/0/SD_ILS:186088 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bin, Eyal. editor.&#160;Ziv, Avi. editor.&#160;Ur, Shmuel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-70889-6">http://dx.doi.org/10.1007/978-3-540-70889-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2007 10th International Conference, Lisbon, Portugal, May 28-31, 2007. Proceedings ent://SD_ILS/0/SD_ILS:186652 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Marques-Silva, Jo&atilde;o. editor.&#160;Sakallah, Karem A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72788-0">http://dx.doi.org/10.1007/978-3-540-72788-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communicating Systems 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings ent://SD_ILS/0/SD_ILS:186733 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Petrenko, Alexandre. editor.&#160;Veanes, Margus. editor.&#160;Tretmans, Jan. editor.&#160;Grieskamp, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73066-8">http://dx.doi.org/10.1007/978-3-540-73066-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of Psychodiagnostic Testing Analysis of Personality in the Psychological Report ent://SD_ILS/0/SD_ILS:166830 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Kellerman, Henry. editor.&#160;Burry, Anthony. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-71370-0">http://dx.doi.org/10.1007/978-0-387-71370-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:183445 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Ur, Shmuel. editor.&#160;Bin, Eyal. editor.&#160;Wolfsthal, Yaron. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11678779">http://dx.doi.org/10.1007/11678779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Basel II Risk Parameters Estimation, Validation, and Stress Testing ent://SD_ILS/0/SD_ILS:183613 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Engelmann, Bernd. editor.&#160;Rauhmeier, Robert. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-33087-9">http://dx.doi.org/10.1007/3-540-33087-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings ent://SD_ILS/0/SD_ILS:183961 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Uyar, M. &Uuml;mit. editor.&#160;Duale, Ali Y. editor.&#160;Fecko, Mariusz A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11754008">http://dx.doi.org/10.1007/11754008</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:184062 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Grieskamp, Wolfgang. editor.&#160;Weise, Carsten. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11759744">http://dx.doi.org/10.1007/11759744</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Moral, Social, and Commercial Imperatives of Genetic Testing and Screening The Australian Case ent://SD_ILS/0/SD_ILS:169234 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Betta, Michela. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-4619-3">http://dx.doi.org/10.1007/978-1-4020-4619-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing - SAT 2006 9th International Conference, Seattle, WA, USA, August 12-15, 2006. Proceedings ent://SD_ILS/0/SD_ILS:184496 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Biere, Armin. editor.&#160;Gomes, Carla P. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11814948">http://dx.doi.org/10.1007/11814948</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing and Runtime Verification First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers ent://SD_ILS/0/SD_ILS:185247 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Havelund, Klaus. editor.&#160;N&uacute;&ntilde;ez, Manuel. editor.&#160;Ro&#351;u, Grigore. editor.&#160;Wolff, Burkhart. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11940197">http://dx.doi.org/10.1007/11940197</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Commercial-off-the-Shelf Components and Systems ent://SD_ILS/0/SD_ILS:181188 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Beydeda, Sami. editor.&#160;Gruhn, Volker. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138567">http://dx.doi.org/10.1007/b138567</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing 7th International Conference, SAT 2004, Vancouver, BC, Canada, May 10-13, 2004, Revised Selected Papers ent://SD_ILS/0/SD_ILS:182752 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Hoos, Holger H. editor.&#160;Mitchell, David G. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11527695">http://dx.doi.org/10.1007/11527695</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers ent://SD_ILS/0/SD_ILS:182934 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Grabowski, Jens. editor.&#160;Nielsen, Brian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b106767">http://dx.doi.org/10.1007/b106767</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing 8th International Conference, SAT 2005, St Andrews, UK, June 19-23, 2005. Proceedings ent://SD_ILS/0/SD_ILS:182826 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Bacchus, Fahiem. editor.&#160;Walsh, Toby. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b137280">http://dx.doi.org/10.1007/b137280</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Communicating Systems 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005, Montreal, Canada, May 31 - June, 2005. Proceedings ent://SD_ILS/0/SD_ILS:183140 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Khendek, Ferhat. editor.&#160;Dssouli, Rachida. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b136676">http://dx.doi.org/10.1007/b136676</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-Based Testing of Reactive Systems Advanced Lectures ent://SD_ILS/0/SD_ILS:183102 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Broy, Manfred. editor.&#160;Jonsson, Bengt. editor.&#160;Katoen, Joost-Pieter. editor.&#160;Leucker, Martin. editor.&#160;Pretschner, Alexander. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b137241">http://dx.doi.org/10.1007/b137241</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Timing Performance of Nanometer Digital Circuits Under Process Variations ent://SD_ILS/0/SD_ILS:400723 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Champac, Victor. author.&#160;Garcia Gervacio, Jose. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-75465-9">https://doi.org/10.1007/978-3-319-75465-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Soft Errors in Modern Electronic Systems ent://SD_ILS/0/SD_ILS:172744 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Nicolaidis, Michael. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6993-4">http://dx.doi.org/10.1007/978-1-4419-6993-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test ent://SD_ILS/0/SD_ILS:170135 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Pavlov, Andrei. author.&#160;Sachdev, Manoj. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> New Methods of Concurrent Checking ent://SD_ILS/0/SD_ILS:170162 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;G&ouml;essel, Michael. author.&#160;Ocheretny, Vitaly. author.&#160;Sogomonyan, Egor. author.&#160;Marienfeld, Daniel. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8420-1">http://dx.doi.org/10.1007/978-1-4020-8420-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Oscillation-Based Test in Mixed-Signal Circuits ent://SD_ILS/0/SD_ILS:169432 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;S&aacute;nchez, Gloria Huertas. author.&#160;Garc&iacute;a de la Vega, Diego V&aacute;zquez. author.&#160;Rueda, Adoraci&oacute;n Rueda. author.&#160;D&iacute;az, Jos&eacute; 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(orcid)0000-0003-3369-0012&#160;Rab, Shanay. editor. (orcid)0000-0003-1203-6492&#160;Wan, Meher. editor.&#160;Agarwal, Ravinder. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-97-8100-3">https://doi.org/10.1007/978-981-97-8100-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Proceedings of MPCPE 2024 Selected Papers ent://SD_ILS/0/SD_ILS:606739 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Vatin, Nikolai. editor. (orcid)0000-0002-1196-8004&#160;Roschina, Svetlana. editor.&#160;Dixit, Saurav. editor. (orcid)0000-0002-6959-0008&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-81635-2">https://doi.org/10.1007/978-3-031-81635-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A Concise Introduction to Software Engineering With Open Source and GenAI ent://SD_ILS/0/SD_ILS:607111 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Jalote, Pankaj. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-74318-4">https://doi.org/10.1007/978-3-031-74318-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Impact of the Digitalization on the Human Resource Management ent://SD_ILS/0/SD_ILS:607140 2026-06-05T02:09:58Z 2026-06-05T02:09:58Z Yazar&#160;Mazurchenko, Anastasiia. author. 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