Arama Sonuçları Testing. - Daraltılmış: Accelerated life testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Accelerated$002blife$002btesting.$002509Accelerated$002blife$002btesting.$0026ic$003dtrue$0026ps$003d300?2026-02-12T14:34:20ZReliability prediction and testing textbookent://SD_ILS/0/SD_ILS:5942092026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Klyatis, Lev M., author. Anderson, Edward, 1945- author.<br/>Yer Numarası TA169.3 .K5964 2018<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Voltage Engineering and Testingent://SD_ILS/0/SD_ILS:2478962026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Ryan, Hugh M., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPO032E">http://dx.doi.org/10.1049/PBPO032E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated life testing of one-shot devices : data collection and analysisent://SD_ILS/0/SD_ILS:5963402026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.<br/>Yer Numarası TA169.3 .B35 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated quality and reliability solutionsent://SD_ILS/0/SD_ILS:2544152026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar Klyatis, Lev M. Klyatis, Eugene L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080449241">http://www.sciencedirect.com/science/book/9780080449241</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542026-02-12T14:34:20Z2026-02-12T14:34:20ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>