Arama Sonuçları Testing. - Daraltılmış: Logic design.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Logic$002bdesign.$002509Logic$002bdesign.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list
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Digital and Analogue Instrumentation Testing and measurement
ent://SD_ILS/0/SD_ILS:247771
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Yazar Kularatna, Nihal<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL011E">http://dx.doi.org/10.1049/PBEL011E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Software and Systems 30th IFIP WG 6.1 International Conference, ICTSS 2018, Cádiz, Spain, October 1-3, 2018, Proceedings
ent://SD_ILS/0/SD_ILS:399422
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Yazar Medina-Bulo, Inmaculada. editor. Merayo, Mercedes G. editor. Hierons, Robert. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-99927-2">https://doi.org/10.1007/978-3-319-99927-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 9th International Haifa Verification Conference, HVC 2013, Haifa, Israel, November 5-7, 2013, Proceedings
ent://SD_ILS/0/SD_ILS:332962
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Yazar Bertacco, Valeria. editor. Legay, Axel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332962.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-319-03077-7">http://dx.doi.org/10.1007/978-3-319-03077-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Software and Systems 25th IFIP WG 6.1 International Conference, ICTSS 2013, Istanbul, Turkey, November 13-15, 2013, Proceedings
ent://SD_ILS/0/SD_ILS:335141
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Yazar Yenigün, Hüsnü. editor. Yilmaz, Cemal. editor. Ulrich, Andreas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(335141.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-41707-8">http://dx.doi.org/10.1007/978-3-642-41707-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Theory and Applications of Satisfiability Testing – SAT 2013 16th International Conference, Helsinki, Finland, July 8-12, 2013. Proceedings
ent://SD_ILS/0/SD_ILS:334724
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Yazar Järvisalo, Matti. editor. Van Gelder, Allen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334724.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-39071-5">http://dx.doi.org/10.1007/978-3-642-39071-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 8th International Haifa Verification Conference, HVC 2012, Haifa, Israel, November 6-8, 2012. Revised Selected Papers
ent://SD_ILS/0/SD_ILS:334820
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Yazar Biere, Armin. editor. Nahir, Amir. editor. Vos, Tanja. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334820.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-39611-3">http://dx.doi.org/10.1007/978-3-642-39611-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Theory and Applications of Satisfiability Testing – SAT 2012 15th International Conference, Trento, Italy, June 17-20, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197115
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Yazar Cimatti, Alessandro. editor. Sebastiani, Roberto. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-31612-8">http://dx.doi.org/10.1007/978-3-642-31612-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 7th International Haifa Verification Conference, HVC 2011, Haifa, Israel, December 6-8, 2011, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:197489
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Yazar Eder, Kerstin. editor. Lourenço, João. editor. Shehory, Onn. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-34188-5">http://dx.doi.org/10.1007/978-3-642-34188-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Software and Systems 24th IFIP WG 6.1 International Conference, ICTSS 2012, Aalborg, Denmark, November 19-21, 2012. Proceedings
ent://SD_ILS/0/SD_ILS:197540
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Yazar Nielsen, Brian. editor. Weise, Carsten. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-34691-0">http://dx.doi.org/10.1007/978-3-642-34691-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 5th International Haifa Verification Conference, HVC 2009, Haifa, Israel, October 19-22, 2009, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:193978
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Yazar Namjoshi, Kedar. editor. Zeller, Andreas. editor. Ziv, Avi. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-19237-1">http://dx.doi.org/10.1007/978-3-642-19237-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Software and Systems 23rd IFIP WG 6.1 International Conference, ICTSS 2011, Paris, France, November 7-10, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:195681
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Yazar Wolff, Burkhart. editor. Zaïdi, Fatiha. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-24580-0">http://dx.doi.org/10.1007/978-3-642-24580-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers
ent://SD_ILS/0/SD_ILS:194090
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Yazar Barner, Sharon. editor. Harris, Ian. editor. Kroening, Daniel. editor. Raz, Orna. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-19583-9">http://dx.doi.org/10.1007/978-3-642-19583-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Theory and Applications of Satisfiability Testing - SAT 2011 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedings
ent://SD_ILS/0/SD_ILS:194747
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Yazar Sakallah, Karem A. editor. Simon, Laurent. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-21581-0">http://dx.doi.org/10.1007/978-3-642-21581-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Theory and Applications of Satisfiability Testing – SAT 2010 13th International Conference, SAT 2010, Edinburgh, UK, July 11-14, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:192572
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Yazar Strichman, Ofer. editor. Szeider, Stefan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-14186-7">http://dx.doi.org/10.1007/978-3-642-14186-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Techniques in Software Engineering Second Pernambuco Summer School on Software Engineering, PSSE 2007, Recife, Brazil, December 3-7, 2007, Revised Lectures
ent://SD_ILS/0/SD_ILS:192618
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Yazar Borba, Paulo. editor. Cavalcanti, Ana. editor. Sampaio, Augusto. editor. Woodcook, Jim. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-14335-9">http://dx.doi.org/10.1007/978-3-642-14335-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing – Practice and Research Techniques 5th International Academic and Industrial Conference, TAIC PART 2010, Windsor, UK, September 3-5, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193017
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Yazar Bottaci, Leonardo. editor. Fraser, Gordon. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15585-7">http://dx.doi.org/10.1007/978-3-642-15585-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Software and Systems 22nd IFIP WG 6.1 International Conference, ICTSS 2010, Natal, Brazil, November 8-10, 2010. Proceedings
ent://SD_ILS/0/SD_ILS:193340
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Yazar Petrenko, Alexandre. editor. Simão, Adenilso. editor. Maldonado, José Carlos. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-16573-3">http://dx.doi.org/10.1007/978-3-642-16573-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing of Software and Communication Systems 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings
ent://SD_ILS/0/SD_ILS:191134
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Yazar Núñez, Manuel. editor. Baker, Paul. editor. Merayo, Mercedes G. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-05031-2">http://dx.doi.org/10.1007/978-3-642-05031-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings
ent://SD_ILS/0/SD_ILS:190091
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Yazar Chockler, Hana. editor. Hu, Alan J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-01702-5">http://dx.doi.org/10.1007/978-3-642-01702-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings
ent://SD_ILS/0/SD_ILS:185500
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Yazar Suzuki, Kenji. editor. Higashino, Teruo. editor. Ulrich, Andreas. editor. Hasegawa, Toru. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-68524-1">http://dx.doi.org/10.1007/978-3-540-68524-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software: Verification and Testing Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007. Proceedings
ent://SD_ILS/0/SD_ILS:188031
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Yazar Yorav, Karen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-77966-7">http://dx.doi.org/10.1007/978-3-540-77966-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Formal Methods and Testing An Outcome of the FORTEST Network, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:188277
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Yazar Hierons, Robert M. editor. Bowen, Jonathan P. editor. Harman, Mark. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-78917-8">http://dx.doi.org/10.1007/978-3-540-78917-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing of Software and Communicating Systems 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings
ent://SD_ILS/0/SD_ILS:186733
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Yazar Petrenko, Alexandre. editor. Veanes, Margus. editor. Tretmans, Jan. editor. Grieskamp, Wolfgang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73066-8">http://dx.doi.org/10.1007/978-3-540-73066-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software, Verification and Testing Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papers
ent://SD_ILS/0/SD_ILS:186088
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Yazar Bin, Eyal. editor. Ziv, Avi. editor. Ur, Shmuel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-70889-6">http://dx.doi.org/10.1007/978-3-540-70889-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:184062
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Yazar Grieskamp, Wolfgang. editor. Weise, Carsten. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11759744">http://dx.doi.org/10.1007/11759744</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:183445
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Yazar Ur, Shmuel. editor. Bin, Eyal. editor. Wolfsthal, Yaron. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11678779">http://dx.doi.org/10.1007/11678779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Formal Approaches to Software Testing and Runtime Verification First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:185247
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Yazar Havelund, Klaus. editor. Núñez, Manuel. editor. Roşu, Grigore. editor. Wolff, Burkhart. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/11940197">http://dx.doi.org/10.1007/11940197</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Model-Based Testing of Reactive Systems Advanced Lectures
ent://SD_ILS/0/SD_ILS:183102
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Yazar Broy, Manfred. editor. Jonsson, Bengt. editor. Katoen, Joost-Pieter. editor. Leucker, Martin. editor. Pretschner, Alexander. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137241">http://dx.doi.org/10.1007/b137241</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Formal Approaches to Software Testing 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:182934
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Yazar Grabowski, Jens. editor. Nielsen, Brian. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b106767">http://dx.doi.org/10.1007/b106767</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Algorithmic and Knowledge-based CAD for VLSI
ent://SD_ILS/0/SD_ILS:247743
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Yazar Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analogue-digital ASICs Circuit techniques, design tools and applications
ent://SD_ILS/0/SD_ILS:247742
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Yazar Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS003E">http://dx.doi.org/10.1049/PBCS003E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>