Arama Sonuçları Testing. - Daraltılmış: Microprocessors.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Microprocessors.$002509Microprocessors.$0026ps$003d300$0026isd$003dtrue?dt=list
2026-03-20T13:41:13Z
Digital and Analogue Instrumentation Testing and measurement
ent://SD_ILS/0/SD_ILS:247771
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Kularatna, Nihal<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL011E">http://dx.doi.org/10.1049/PBEL011E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microprocessor. 5, Software and hardware aspects of development, debugging and testing -- the microcomputer
ent://SD_ILS/0/SD_ILS:596483
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Darche, Philippe.<br/>Yer Numarası QA76.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801740">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119801740</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing of Interposer-Based 2.5D Integrated Circuits
ent://SD_ILS/0/SD_ILS:616892
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Wang, Ran. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-54714-5">https://doi.org/10.1007/978-3-319-54714-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips Design Automation, Testing, and Design-for-Testability
ent://SD_ILS/0/SD_ILS:612513
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Hu, Kai. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-56255-1">https://doi.org/10.1007/978-3-319-56255-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
ent://SD_ILS/0/SD_ILS:527384
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-16-7487-7">https://doi.org/10.1007/978-981-16-7487-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part II
ent://SD_ILS/0/SD_ILS:616016
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Squillero, Giovanni. editor. Sim, Kevin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-55792-2">https://doi.org/10.1007/978-3-319-55792-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment
ent://SD_ILS/0/SD_ILS:616798
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Sklavos, Nicolas. editor. Chaves, Ricardo. editor. Di Natale, Giorgio. editor. Regazzoni, Francesco. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-44318-8">https://doi.org/10.1007/978-3-319-44318-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part I
ent://SD_ILS/0/SD_ILS:616071
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Squillero, Giovanni. editor. Sim, Kevin. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-55849-3">https://doi.org/10.1007/978-3-319-55849-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:613347
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Kaushik, Brajesh Kumar. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. (orcid)0000-0002-9113-5167 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-7470-7">https://doi.org/10.1007/978-981-10-7470-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Distributed Simulation A Model Driven Engineering Approach
ent://SD_ILS/0/SD_ILS:611189
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Topçu, Okan. author. Durak, Umut. author. Oğuztüzün, Halit. author. Yilmaz, Levent. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-03050-0">https://doi.org/10.1007/978-3-319-03050-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Boundary-Scan Handbook
ent://SD_ILS/0/SD_ILS:614731
2026-03-20T13:41:13Z
2026-03-20T13:41:13Z
Yazar Parker, Kenneth P. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-01174-5">https://doi.org/10.1007/978-3-319-01174-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>