Arama Sonu&ccedil;lar&#305; Testing. - Daralt&#305;lm&#305;&#351;: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300? 2026-02-12T08:27:48Z Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Klyatis, Lev M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Yer Numaras&#305;&#160;TA169.5<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated testing and validation testing, engineering, and management tools for lean development ent://SD_ILS/0/SD_ILS:254184 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Porter, Alex.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Viewpoints and controversies in sensory science and consumer product testing ent://SD_ILS/0/SD_ILS:296001 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Moskowitz, Howard R.&#160;Mu&ntilde;oz, Alejandra M., 1957-&#160;Gacula, Maximo C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability verification, testing and analysis in engineering design ent://SD_ILS/0/SD_ILS:547339 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Wasserman, Gary S., 1951, author.<br/>Yer Numaras&#305;&#160;TA169 .W37 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Yer Numaras&#305;&#160;TA169 L778 2003<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598326 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Yer Numaras&#305;&#160;TA169 .A67 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Yer Numaras&#305;&#160;TA169 .E515 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability culture : how leaders build organizations that create reliable products ent://SD_ILS/0/SD_ILS:596268 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Bahret, Adam P., 1973- author.<br/>Yer Numaras&#305;&#160;TS156 .B335 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Wohlgemuth, J. (John), 1946- author.<br/>Yer Numaras&#305;&#160;TK8322<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering and services ent://SD_ILS/0/SD_ILS:594657 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Jin, Tongdan, author.<br/>Yer Numaras&#305;&#160;TS173 .J56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability and software quality : strategies, tools, process and implementation ent://SD_ILS/0/SD_ILS:595034 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Levin, Mark, 1959- author.&#160;Kalal, Ted T., author.&#160;Rodin, Jonathan, 1957- author.<br/>Yer Numaras&#305;&#160;TS173 .L48 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for Laboratory Quality Auditing ent://SD_ILS/0/SD_ILS:539624 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Singer, author.<br/>Yer Numaras&#305;&#160;R850 .S564 2014<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781498710527">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, quality, and safety for engineers ent://SD_ILS/0/SD_ILS:547810 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;TS173 .D495 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:546254 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;LuValle, Michael J., author.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Yer Numaras&#305;&#160;TA169.3 .L88 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Medical device reliability and associated areas ent://SD_ILS/0/SD_ILS:540912 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numaras&#305;&#160;R855.3 .D47 2000<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-02-12T08:27:48Z 2026-02-12T08:27:48Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>