Arama Sonuçları Testing. - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2025-12-26T14:56:20ZAccelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Viewpoints and controversies in sensory science and consumer product testingent://SD_ILS/0/SD_ILS:2960012025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Moskowitz, Howard R. Muñoz, Alejandra M., 1957- Gacula, Maximo C. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mechanical reliability improvement : probability and statistics for experimental testingent://SD_ILS/0/SD_ILS:5412972025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Yer Numarası TA169 L778 2003<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability verification, testing and analysis in engineering designent://SD_ILS/0/SD_ILS:5473392025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Wasserman, Gary S., 1951, author.<br/>Yer Numarası TA169 .W37 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135551483">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Guidelines for Laboratory Quality Auditingent://SD_ILS/0/SD_ILS:5396242025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Singer, author.<br/>Yer Numarası R850 .S564 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781498710527">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability, quality, and safety for engineersent://SD_ILS/0/SD_ILS:5478102025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası TS173 .D495 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135484071">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:5409122025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası R855.3 .D47 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design reliability : fundamentals and applicationsent://SD_ILS/0/SD_ILS:5405722025-12-26T14:56:20Z2025-12-26T14:56:20ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası TA174 .D4929 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>