Arama Sonuçları Testing. - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list2024-12-25T15:47:45ZAccelerated reliability and durability testing technologyent://SD_ILS/0/SD_ILS:2978272024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar Klyatis, Lev M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mechanical reliability improvement probability and statistics for experimental testingent://SD_ILS/0/SD_ILS:2864602024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar Little, R. E. (Robert Eugene), 1933- Kosikowski, D. M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910993">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Viewpoints and controversies in sensory science and consumer product testingent://SD_ILS/0/SD_ILS:2960012024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar Moskowitz, Howard R. Muñoz, Alejandra M., 1957- Gacula, Maximo C. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability verification, testing and analysis in engineering designent://SD_ILS/0/SD_ILS:2856232024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar Wasserman, Gary S., 1951-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910443">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:2882352024-12-25T15:47:45Z2024-12-25T15:47:45ZYazar LuValle, Michael J. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203492031">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>