Arama Sonu&ccedil;lar&#305; Testing. - Daralt&#305;lm&#305;&#351;: Software engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dTesting.$0026qf$003dSUBJECT$002509Konu$002509Software$002bengineering.$002509Software$002bengineering.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-25T17:18:32Z Model-Driven Testing ent://SD_ILS/0/SD_ILS:186585 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Baker, Paul. author.&#160;Dai, Zhen Ru. author.&#160;Grabowski, Jens. author.&#160;Haugen, &Oslash;ystein. author.&#160;Schieferdecker, Ina. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72563-3">http://dx.doi.org/10.1007/978-3-540-72563-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> TestGoal Result-Driven Testing ent://SD_ILS/0/SD_ILS:188255 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;De Grood, Derk-Jan. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78829-4">http://dx.doi.org/10.1007/978-3-540-78829-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Concise Guide to Software Testing ent://SD_ILS/0/SD_ILS:485710 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;O'Regan, Gerard. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-28494-7">https://doi.org/10.1007/978-3-030-28494-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Component-Based Software Testing with UML ent://SD_ILS/0/SD_ILS:180937 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Gross, Hans-Gerhard. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138012">http://dx.doi.org/10.1007/b138012</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving Software Testing Technical and Organizational Developments ent://SD_ILS/0/SD_ILS:196203 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Majchrzak, Tim A. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27464-0">http://dx.doi.org/10.1007/978-3-642-27464-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Composing Software Components A Software-testing Perspective ent://SD_ILS/0/SD_ILS:172786 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Hamlet, Dick. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7148-7">http://dx.doi.org/10.1007/978-1-4419-7148-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 31st IFIP WG 6.1 International Conference, ICTSS 2019, Paris, France, October 15&ndash;17, 2019, Proceedings ent://SD_ILS/0/SD_ILS:486130 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Gaston, Christophe. editor. (orcid)0000-0001-6865-5108&#160;Kosmatov, Nikolai. editor. (orcid)0000-0003-1557-2813&#160;Le Gall, Pascale. editor. (orcid)0000-0002-8955-6835&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-31280-0">https://doi.org/10.1007/978-3-030-31280-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2019 22nd International Conference, SAT 2019, Lisbon, Portugal, July 9&ndash;12, 2019, Proceedings ent://SD_ILS/0/SD_ILS:484655 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Janota, Mikol&aacute;&scaron;. editor. (orcid)0000-0003-3487-784X&#160;Lynce, In&ecirc;s. editor. (orcid)0000-0003-4868-415X&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-24258-9">https://doi.org/10.1007/978-3-030-24258-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2018 21st International Conference, SAT 2018, Held as Part of the Federated Logic Conference, FloC 2018, Oxford, UK, July 9&ndash;12, 2018, Proceedings ent://SD_ILS/0/SD_ILS:401714 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Beyersdorff, Olaf. editor.&#160;Wintersteiger, Christoph M. editor. (orcid)0000-0003-0102-4381&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-94144-8">https://doi.org/10.1007/978-3-319-94144-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Analysis, Testing, and Evolution 8th International Conference, SATE 2018, Shenzhen, Guangdong, China, November 23&ndash;24, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399416 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Bu, Lei. editor. (orcid)0000-0003-0517-7801&#160;Xiong, Yingfei. editor. (orcid)0000-0001-8991-747X&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-04272-1">https://doi.org/10.1007/978-3-030-04272-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 30th IFIP WG 6.1 International Conference, ICTSS 2018, C&aacute;diz, Spain, October 1-3, 2018, Proceedings ent://SD_ILS/0/SD_ILS:399422 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Medina-Bulo, Inmaculada. editor.&#160;Merayo, Mercedes G. editor.&#160;Hierons, Robert. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-99927-2">https://doi.org/10.1007/978-3-319-99927-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Thinking-Driven Testing The Most Reasonable Approach to Quality Control ent://SD_ILS/0/SD_ILS:401650 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Roman, Adam. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-73195-7">https://doi.org/10.1007/978-3-319-73195-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 10th International Haifa Verification Conference, HVC 2014, Haifa, Israel, November 18-20, 2014, Proceedings ent://SD_ILS/0/SD_ILS:489622 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Yahav, Eran. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-13338-6">https://doi.org/10.1007/978-3-319-13338-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Risk Assessment and Risk-Driven Testing First International Workshop, RISK 2013, Held in Conjunction with ICTSS 2013, Istanbul, Turkey, November 12, 2013. Revised Selected Papers ent://SD_ILS/0/SD_ILS:487821 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Bauer, Thomas. editor.&#160;Gro&szlig;mann, J&uuml;rgen. editor.&#160;Seehusen, Fredrik. editor.&#160;St&oslash;len, Ketil. editor.&#160;Wendland, Marc-Florian. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07076-6">https://doi.org/10.1007/978-3-319-07076-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Future Internet Testing First International Workshop, FITTEST 2013, Istanbul, Turkey, November 12, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:488988 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Vos, Tanja E.J. editor.&#160;Lakhotia, Kiran. editor.&#160;Bauersfeld, Sebastian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07785-7">https://doi.org/10.1007/978-3-319-07785-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 26th IFIP WG 6.1 International Conference, ICTSS 2014, Madrid, Spain, September 23-25, 2014. Proceedings ent://SD_ILS/0/SD_ILS:489402 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Merayo, Mercedes G. editor.&#160;Montes de Oca, Edgardo. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-662-44857-1">https://doi.org/10.1007/978-3-662-44857-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Agile Methods. Large-Scale Development, Refactoring, Testing, and Estimation XP 2014 International Workshops, Rome, Italy, May 26-30, 2014, Revised Selected Papers ent://SD_ILS/0/SD_ILS:489435 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Dings&oslash;yr, Torgeir. editor.&#160;Moe, Nils Brede. editor.&#160;Tonelli, Roberto. editor.&#160;Counsell, Steve. editor.&#160;Gencel, Cigdem. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-14358-3">https://doi.org/10.1007/978-3-319-14358-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 9th International Haifa Verification Conference, HVC 2013, Haifa, Israel, November 5-7, 2013, Proceedings ent://SD_ILS/0/SD_ILS:332962 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Bertacco, Valeria. editor.&#160;Legay, Axel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332962.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-319-03077-7">http://dx.doi.org/10.1007/978-3-319-03077-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 25th IFIP WG 6.1 International Conference, ICTSS 2013, Istanbul, Turkey, November 13-15, 2013, Proceedings ent://SD_ILS/0/SD_ILS:335141 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Yenig&uuml;n, H&uuml;sn&uuml;. editor.&#160;Yilmaz, Cemal. editor.&#160;Ulrich, Andreas. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(335141.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-41707-8">http://dx.doi.org/10.1007/978-3-642-41707-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 8th International Haifa Verification Conference, HVC 2012, Haifa, Israel, November 6-8, 2012. Revised Selected Papers ent://SD_ILS/0/SD_ILS:334820 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Biere, Armin. editor.&#160;Nahir, Amir. editor.&#160;Vos, Tanja. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(334820.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-39611-3">http://dx.doi.org/10.1007/978-3-642-39611-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software Testing in the Cloud Migration and Execution ent://SD_ILS/0/SD_ILS:197182 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Tilley, Scott. author.&#160;Parveen, Tauhida. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32122-1">http://dx.doi.org/10.1007/978-3-642-32122-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 7th International Haifa Verification Conference, HVC 2011, Haifa, Israel, December 6-8, 2011, Revised Selected Papers ent://SD_ILS/0/SD_ILS:197489 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Eder, Kerstin. editor.&#160;Louren&ccedil;o, Jo&atilde;o. editor.&#160;Shehory, Onn. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34188-5">http://dx.doi.org/10.1007/978-3-642-34188-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 24th IFIP WG 6.1 International Conference, ICTSS 2012, Aalborg, Denmark, November 19-21, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197540 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Nielsen, Brian. editor.&#160;Weise, Carsten. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34691-0">http://dx.doi.org/10.1007/978-3-642-34691-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 5th International Haifa Verification Conference, HVC 2009, Haifa, Israel, October 19-22, 2009, Revised Selected Papers ent://SD_ILS/0/SD_ILS:193978 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Namjoshi, Kedar. editor.&#160;Zeller, Andreas. editor.&#160;Ziv, Avi. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-19237-1">http://dx.doi.org/10.1007/978-3-642-19237-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 23rd IFIP WG 6.1 International Conference, ICTSS 2011, Paris, France, November 7-10, 2011. Proceedings ent://SD_ILS/0/SD_ILS:195681 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Wolff, Burkhart. editor.&#160;Za&iuml;di, Fatiha. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-24580-0">http://dx.doi.org/10.1007/978-3-642-24580-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 6th International Haifa Verification Conference, HVC 2010, Haifa, Israel, October 4-7, 2010. Revised Selected Papers ent://SD_ILS/0/SD_ILS:194090 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Barner, Sharon. editor.&#160;Harris, Ian. editor.&#160;Kroening, Daniel. editor.&#160;Raz, Orna. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-19583-9">http://dx.doi.org/10.1007/978-3-642-19583-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Theory and Applications of Satisfiability Testing &ndash; SAT 2010 13th International Conference, SAT 2010, Edinburgh, UK, July 11-14, 2010. Proceedings ent://SD_ILS/0/SD_ILS:192572 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Strichman, Ofer. editor.&#160;Szeider, Stefan. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14186-7">http://dx.doi.org/10.1007/978-3-642-14186-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Techniques in Software Engineering Second Pernambuco Summer School on Software Engineering, PSSE 2007, Recife, Brazil, December 3-7, 2007, Revised Lectures ent://SD_ILS/0/SD_ILS:192618 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Borba, Paulo. editor.&#160;Cavalcanti, Ana. editor.&#160;Sampaio, Augusto. editor.&#160;Woodcook, Jim. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14335-9">http://dx.doi.org/10.1007/978-3-642-14335-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing &ndash; Practice and Research Techniques 5th International Academic and Industrial Conference, TAIC PART 2010, Windsor, UK, September 3-5, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193017 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Bottaci, Leonardo. editor.&#160;Fraser, Gordon. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-15585-7">http://dx.doi.org/10.1007/978-3-642-15585-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Software and Systems 22nd IFIP WG 6.1 International Conference, ICTSS 2010, Natal, Brazil, November 8-10, 2010. Proceedings ent://SD_ILS/0/SD_ILS:193340 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Petrenko, Alexandre. editor.&#160;Sim&atilde;o, Adenilso. editor.&#160;Maldonado, Jos&eacute; Carlos. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16573-3">http://dx.doi.org/10.1007/978-3-642-16573-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communication Systems 21st IFIP WG 6.1 International Conference, TESTCOM 2009 and 9th International Workshop, FATES 2009, Eindhoven, The Netherlands, November 2-4, 2009. Proceedings ent://SD_ILS/0/SD_ILS:191134 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;N&uacute;&ntilde;ez, Manuel. editor.&#160;Baker, Paul. editor.&#160;Merayo, Mercedes G. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05031-2">http://dx.doi.org/10.1007/978-3-642-05031-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing 4th International Haifa Verification Conference, HVC 2008, Haifa, Israel, October 27-30, 2008. Proceedings ent://SD_ILS/0/SD_ILS:190091 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Chockler, Hana. editor.&#160;Hu, Alan J. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-01702-5">http://dx.doi.org/10.1007/978-3-642-01702-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings ent://SD_ILS/0/SD_ILS:185500 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Suzuki, Kenji. editor.&#160;Higashino, Teruo. editor.&#160;Ulrich, Andreas. editor.&#160;Hasegawa, Toru. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68524-1">http://dx.doi.org/10.1007/978-3-540-68524-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software: Verification and Testing Third International Haifa Verification Conference, HVC 2007, Haifa, Israel, October 23-25, 2007. Proceedings ent://SD_ILS/0/SD_ILS:188031 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Yorav, Karen. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-77966-7">http://dx.doi.org/10.1007/978-3-540-77966-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Testing Network An Integral Approach to Test Activities in Large Software Projects ent://SD_ILS/0/SD_ILS:188154 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Henry, Pierre. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78504-0">http://dx.doi.org/10.1007/978-3-540-78504-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Methods and Testing An Outcome of the FORTEST Network, Revised Selected Papers ent://SD_ILS/0/SD_ILS:188277 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Hierons, Robert M. editor.&#160;Bowen, Jonathan P. editor.&#160;Harman, Mark. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78917-8">http://dx.doi.org/10.1007/978-3-540-78917-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Software and Communicating Systems 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings ent://SD_ILS/0/SD_ILS:186733 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Petrenko, Alexandre. editor.&#160;Veanes, Margus. editor.&#160;Tretmans, Jan. editor.&#160;Grieskamp, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73066-8">http://dx.doi.org/10.1007/978-3-540-73066-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software, Verification and Testing Second International Haifa Verification Conference, HVC 2006, Haifa, Israel, October 23-26, 2006. Revised Selected Papers ent://SD_ILS/0/SD_ILS:186088 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Bin, Eyal. editor.&#160;Ziv, Avi. editor.&#160;Ur, Shmuel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-70889-6">http://dx.doi.org/10.1007/978-3-540-70889-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:184062 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Grieskamp, Wolfgang. editor.&#160;Weise, Carsten. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11759744">http://dx.doi.org/10.1007/11759744</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers ent://SD_ILS/0/SD_ILS:183445 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Ur, Shmuel. editor.&#160;Bin, Eyal. editor.&#160;Wolfsthal, Yaron. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11678779">http://dx.doi.org/10.1007/11678779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings ent://SD_ILS/0/SD_ILS:183961 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Uyar, M. &Uuml;mit. editor.&#160;Duale, Ali Y. editor.&#160;Fecko, Mariusz A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11754008">http://dx.doi.org/10.1007/11754008</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing and Runtime Verification First Combined International Workshops, FATES 2006 and RV 2006, Seattle, WA, USA, August 15-16, 2006, Revised Selected Papers ent://SD_ILS/0/SD_ILS:185247 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Havelund, Klaus. editor.&#160;N&uacute;&ntilde;ez, Manuel. editor.&#160;Ro&#351;u, Grigore. editor.&#160;Wolff, Burkhart. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/11940197">http://dx.doi.org/10.1007/11940197</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Model-Based Testing of Reactive Systems Advanced Lectures ent://SD_ILS/0/SD_ILS:183102 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Broy, Manfred. editor.&#160;Jonsson, Bengt. editor.&#160;Katoen, Joost-Pieter. editor.&#160;Leucker, Martin. editor.&#160;Pretschner, Alexander. editor.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b137241">http://dx.doi.org/10.1007/b137241</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing Commercial-off-the-Shelf Components and Systems ent://SD_ILS/0/SD_ILS:181188 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Beydeda, Sami. editor.&#160;Gruhn, Volker. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b138567">http://dx.doi.org/10.1007/b138567</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Formal Approaches to Software Testing 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers ent://SD_ILS/0/SD_ILS:182934 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Grabowski, Jens. editor.&#160;Nielsen, Brian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b106767">http://dx.doi.org/10.1007/b106767</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Testing of Communicating Systems 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005, Montreal, Canada, May 31 - June, 2005. Proceedings ent://SD_ILS/0/SD_ILS:183140 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Khendek, Ferhat. editor.&#160;Dssouli, Rachida. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b136676">http://dx.doi.org/10.1007/b136676</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Data structure and software engineering challenges and improvements ent://SD_ILS/0/SD_ILS:287161 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Antonakos, James L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781466562608">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software engineering for image processing systems ent://SD_ILS/0/SD_ILS:286473 2024-12-25T17:18:32Z 2024-12-25T17:18:32Z Yazar&#160;Laplante, Phillip A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203496107">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>