Arama Sonuçları Thin films -- Surfaces -- Analysis.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dThin$002bfilms$002b--$002bSurfaces$002b--$002bAnalysis.$0026ps$003d300?dt=list2026-06-02T08:40:17ZLaser Induced Breakdown Spectroscopy (LIBS) : concepts, instrumentation, data analysis and applicationsent://SD_ILS/0/SD_ILS:5983232026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Singh, Vivek K., editor.<br/>Yer Numarası QD96 .A8 L37 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119758396">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119758396</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Apparent and microscopic contact anglesent://SD_ILS/0/SD_ILS:5416362026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Drelich, J., editor. Laskowski, J. (Janusz), 1936- editor. Mittal, Kash L., 1945- editor. Taylor and Francis.<br/>Yer Numarası QC183 .A673 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466562172">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Adhesion measurement of films and coatings. Volume 2ent://SD_ILS/0/SD_ILS:5475662026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Mittal, Kash L., 1945- editor. Taylor and Francis.<br/>Yer Numarası QC183<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466562233">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Surface and thin film analysis a compendium of principles, instrumentation, and applicationsent://SD_ILS/0/SD_ILS:3061182026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Friedbacher, Gernot. Bubert, H. (Henning) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527636921">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reflection High-Energy Electron Diffractionent://SD_ILS/0/SD_ILS:2373102026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Ichimiya, Ayahiko. Cohen, Philip I..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511735097">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Surface and thin film analysis principles, instrumentation, applicationsent://SD_ILS/0/SD_ILS:3019422026-06-02T08:40:17Z2026-06-02T08:40:17ZYazar Bubert, H. (Henning) Jenett, H. (Holger) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527600167">http://dx.doi.org/10.1002/3527600167</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>