Arama Sonuçları VLSI. - Daraltılmış: Microprogramming .SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dVLSI.$0026qf$003dSUBJECT$002509Konu$002509Microprogramming$0025C2$0025A0.$002509Microprogramming$0025C2$0025A0.$0026ic$003dtrue$0026ps$003d300?2025-12-30T20:53:26ZDigital Design from the VLSI Perspective Concepts for VLSI Beginnersent://SD_ILS/0/SD_ILS:5268912025-12-30T20:53:26Z2025-12-30T20:53:26ZYazar Taraate, Vaibbhav. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-4652-3">https://doi.org/10.1007/978-981-19-4652-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, Abu Dhabi, United Arab Emirates, October 23–25, 2017, Revised and Extended Selected Papersent://SD_ILS/0/SD_ILS:4868672025-12-30T20:53:26Z2025-12-30T20:53:26ZYazar Maniatakos, Michail. editor. (orcid)0000-0001-6899-0651 Elfadel, Ibrahim (Abe) M. editor. (orcid)0000-0003-3220-9987 Sonza Reorda, Matteo. editor. (orcid)0000-0003-2899-7669 Ugurdag, H. Fatih. editor. (orcid)0000-0002-6256-0850 Monteiro, José. editor. (orcid)0000-0003-0603-2268<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-15663-3">https://doi.org/10.1007/978-3-030-15663-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152025-12-30T20:53:26Z2025-12-30T20:53:26ZYazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>