Arama Sonu&ccedil;lar&#305; Vuorinen, Vesa. - Daralt&#305;lm&#305;&#351;: &Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dVuorinen$00252C$002bVesa.$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253AONLINE$002509$0025C3$002587evrimi$0025C3$0025A7i$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300? 2024-09-20T19:20:44Z Thermodynamics, Diffusion and the Kirkendall Effect in Solids ent://SD_ILS/0/SD_ILS:488865 2024-09-20T19:20:44Z 2024-09-20T19:20:44Z Yazar&#160;Paul, Aloke. author.&#160;Laurila, Tomi. author.&#160;Vuorinen, Vesa. author.&#160;Divinski, Sergiy V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-07461-0">https://doi.org/10.1007/978-3-319-07461-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach ent://SD_ILS/0/SD_ILS:173452 2024-09-20T19:20:44Z 2024-09-20T19:20:44Z Yazar&#160;Laurila, Tomi. author.&#160;Vuorinen, Vesa. author.&#160;Paulasto-Kr&ouml;ckel, Mervi. author.&#160;Turunen, Markus. author.&#160;Mattila, Toni T. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2470-2">http://dx.doi.org/10.1007/978-1-4471-2470-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>