Arama Sonuçları Weirich, Thomas.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dWeirich$00252C$002bThomas.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-06-02T05:43:45Z
Electron Crystallography Novel Approaches for Structure Determination of Nanosized Materials
ent://SD_ILS/0/SD_ILS:169035
2026-06-02T05:43:45Z
2026-06-02T05:43:45Z
Yazar Weirich, Thomas E. editor. Lábár, János L. editor. Zou, Xiaodong. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3920-4">http://dx.doi.org/10.1007/1-4020-3920-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 1: Instrumentation and Methods
ent://SD_ILS/0/SD_ILS:188617
2026-06-02T05:43:45Z
2026-06-02T05:43:45Z
Yazar Luysberg, Martina. editor. Tillmann, Karsten. editor. Weirich, Thomas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85156-1">http://dx.doi.org/10.1007/978-3-540-85156-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>