Arama Sonu&ccedil;lar&#305; Wiley - Daralt&#305;lm&#305;&#351;: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dWiley$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300? 2026-02-22T20:54:09Z Multistate systems reliability theory with applications ent://SD_ILS/0/SD_ILS:298781 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Natvig, Bent, 1946-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470977088">http://dx.doi.org/10.1002/9780470977088</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10469650">http://site.ebrary.com/lib/alltitles/Doc?id=10469650</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Accelerated reliability and durability testing technology ent://SD_ILS/0/SD_ILS:297827 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Klyatis, Lev M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470541609">An electronic book accessible through the World Wide Web; click for information</a> ebrary <a href="http://site.ebrary.com/id/10592157">http://site.ebrary.com/id/10592157</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=693204">http://swb.eblib.com/patron/FullRecord.aspx?p=693204</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Architecting resilient systems accident avoidance and survival and recovery from disruptions ent://SD_ILS/0/SD_ILS:297830 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Jackson, Scott.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability strategies and implementation ent://SD_ILS/0/SD_ILS:295695 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Levin, Mark, 1959-&#160;Kalal, Ted T.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://ezproxy.lib.monash.edu.au/login?url=http://catdir.loc.gov/catdir/description/wiley039/2003045083.html">Full text available from Wiley InterScience</a> <a href="http://ezproxy.lib.monash.edu.au/login?url=http://dx.doi.org/10.1002/0470014024">Authentication may be required</a> John Wiley <a href="http://dx.doi.org/10.1002/0470014024">http://dx.doi.org/10.1002/0470014024</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932">http://www3.interscience.wiley.com/cgi-bin/bookhome/109870932</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied life data analysis ent://SD_ILS/0/SD_ILS:300248 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Nelson, Wayne, 1936-&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability modeling, prediction, and optimization ent://SD_ILS/0/SD_ILS:300337 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Blischke, W. R., 1934-&#160;Murthy, D. N. P.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150481">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818798">Click here to view book</a> <a href="http://proquest.safaribooksonline.com/?fpi=9780471184508">Available by subscription from Safari Books Online</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley043/99053029.html">http://catdir.loc.gov/catdir/bios/wiley043/99053029.html</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/42708105.html">http://catalog.hathitrust.org/api/volumes/oclc/42708105.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis, safety assessment and 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Yazar&#160;Raheja, Dev.&#160;Gullo, Louis J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability ent://SD_ILS/0/SD_ILS:297978 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Lemaire, Maurice.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477683</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611708">http://dx.doi.org/10.1002/9780470611708</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=216540&ref=toc">http://www.myilibrary.com?id=216540&ref=toc</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361215">http://site.ebrary.com/lib/alltitles/Doc?id=10361215</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Life cycle reliability engineering ent://SD_ILS/0/SD_ILS:296926 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Yang, Guangbin, 1964-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470117880">http://dx.doi.org/10.1002/9780470117880</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fault trees ent://SD_ILS/0/SD_ILS:302359 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Limnios, N. (Nikolaos)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html">http://catdir.loc.gov/catdir/enhancements/fy0702/2006033027-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612484">http://dx.doi.org/10.1002/9780470612484</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical reliability engineering ent://SD_ILS/0/SD_ILS:305563 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;O'Connor, Patrick P.&#160;Kleyner, Andre.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119961260">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of reliability engineering ent://SD_ILS/0/SD_ILS:295100 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Harrison, Robert A.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172414">http://dx.doi.org/10.1002/9780470172414</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examples ent://SD_ILS/0/SD_ILS:365001 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Taylor, Zachary, 1959-&#160;Ranganathan, Subramanyam.&#160;IEEE Xplore (Online Service), distributor.&#160;Wiley, publisher.<br/>Yer Numaras&#305;&#160;ONLINE(365001.1)<br/>Elektronik Eri&#351;im&#160;Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Viewpoints and controversies in sensory science and consumer product testing ent://SD_ILS/0/SD_ILS:296001 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Moskowitz, Howard R.&#160;Mu&ntilde;oz, Alejandra M., 1957-&#160;Gacula, Maximo C.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470385128">http://dx.doi.org/10.1002/9780470385128</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic reliability engineering ent://SD_ILS/0/SD_ILS:295101 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Gnedenko, B. V. (Boris Vladimirovich), 1912-1995.&#160;Ushakov, I. A. (Igor&#697; Alekseevich)&#160;Falk, James.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470172421">http://dx.doi.org/10.1002/9780470172421</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley041/95009901.html">http://catdir.loc.gov/catdir/bios/wiley041/95009901.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The science of resilience : complexity, risk modeling, and systems ent://SD_ILS/0/SD_ILS:600298 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Lewis, Ted G., author<br/>Yer Numaras&#305;&#160;TA169 .L49 2026<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394354955</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and manufacturing practices for performability engineering ent://SD_ILS/0/SD_ILS:600102 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Chaturvedi, Sanjay K., editor.&#160;Gargama, Heeralal, editor.&#160;Rai, Rajiv N., editor.<br/>Yer Numaras&#305;&#160;TS171 .D47 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Architecting resilient systems ent://SD_ILS/0/SD_ILS:599418 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Jackson, Scott, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394258239</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multi-physics optimization : mechanics, fluid interaction structure, shaping, stochastic finite elements, random vibrations, fatigue ent://SD_ILS/0/SD_ILS:600124 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;El Hami, Abdelkhalak, author.&#160;Radi, Boucha&iuml;b, author.<br/>Yer Numaras&#305;&#160;TA347 .F5 E43 2025<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394401727</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis of modern power systems ent://SD_ILS/0/SD_ILS:599018 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Saket, R. K., editor.&#160;Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numaras&#305;&#160;TA169 .S234 2024<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061 ent://SD_ILS/0/SD_ILS:598269 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Tacchini, Marco, author.<br/>Yer Numaras&#305;&#160;TJ211.5 .T33 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational intelligence in sustainable reliability engineering ent://SD_ILS/0/SD_ILS:598272 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Malik, S. C., editor.<br/>Yer Numaras&#305;&#160;TA169 .C65 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598306 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Yer Numaras&#305;&#160;TA169 .A67 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for industry. 2, Experimental reliability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598326 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Yer Numaras&#305;&#160;TA169 .A67 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209750</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for industry. 3, Operational relability for the automobile, aeronautics, defense, medical, marine and space industries ent://SD_ILS/0/SD_ILS:598345 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;El Hami, Abdelkhalak, editor.&#160;Delaux, David, editor.&#160;Grzeskowiak, Henri, editor.<br/>Yer Numaras&#305;&#160;TA169 .A67 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394209781</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis using MINITAB and Python ent://SD_ILS/0/SD_ILS:597824 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Hwang, Jaejin, author.<br/>Yer Numaras&#305;&#160;TA169 .H93 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product maturity. 1, Theoretical principals and industrial applications ent://SD_ILS/0/SD_ILS:597455 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Product maturity. 2, Principles and illustrations ent://SD_ILS/0/SD_ILS:597611 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and Physics-Of-Healthy in Mechatronics. ent://SD_ILS/0/SD_ILS:598146 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;El Hami, Abdelkhalak.&#160;Delaux, David.&#160;Grzeskowiak, Henri.<br/>Yer Numaras&#305;&#160;TA169 .E515 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394186068</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability culture : how leaders build organizations that create reliable products ent://SD_ILS/0/SD_ILS:596268 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bahret, Adam P., 1973- author.<br/>Yer Numaras&#305;&#160;TS156 .B335 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119612483</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:596287 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Curtis, Peter M., author.<br/>Yer Numaras&#305;&#160;TA169 .C87 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Repairable systems reliability analysis : a comprehensive framework ent://SD_ILS/0/SD_ILS:596328 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Rai, Rajiv Nandan, author.&#160;Chaturvedi, Sanjay K., author.&#160;Bolia, Nomesh, author.<br/>Yer Numaras&#305;&#160;QA402 .R35 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Wohlgemuth, J. (John), 1946- author.<br/>Yer Numaras&#305;&#160;TK8322<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Methods for reliability improvement and risk reduction ent://SD_ILS/0/SD_ILS:594697 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Todinov, M. T., author.<br/>Yer Numaras&#305;&#160;TA169 .T649 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Improving product reliability and software quality : strategies, tools, process and implementation ent://SD_ILS/0/SD_ILS:595034 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Levin, Mark, 1959- author.&#160;Kalal, Ted T., author.&#160;Rodin, Jonathan, 1957- author.<br/>Yer Numaras&#305;&#160;TS173 .L48 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119179429</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:595289 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Xing, Liudong, author.&#160;Levitin, Gregory, author.&#160;Wang, Chaonan, 1986- author.<br/>Yer Numaras&#305;&#160;TA169 .X56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability engineering and services ent://SD_ILS/0/SD_ILS:594657 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Jin, Tongdan, author.<br/>Yer Numaras&#305;&#160;TS173 .J56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119167020</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of maintained systems subjected to wear failure mechanisms : theory and applications ent://SD_ILS/0/SD_ILS:595240 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bayle, Franck, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Structural reliability analysis and prediction ent://SD_ILS/0/SD_ILS:593807 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Melchers, R. E. (Robert E.), 1945- author.&#160;Beck, Andr&eacute; T., author.<br/>Yer Numaras&#305;&#160;TA656.5 .M45 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Production availability and reliability : use in the oil and gas industry ent://SD_ILS/0/SD_ILS:594494 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Leroy, Alain, author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119522454</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Yer Numaras&#305;&#160;TA169.5<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:341773 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE(341773.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic design for optimization and robustness for engineers ent://SD_ILS/0/SD_ILS:341796 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Dodson, Bryan, 1962- author.&#160;Hammett, Patrick C., author.&#160;Klerx, Rene, author.<br/>Yer Numaras&#305;&#160;ONLINE(341796.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118796306">Available by subscription from Safari Books Online</a> ebrary <a href="http://alltitles.ebrary.com/Doc?id=10896040">http://alltitles.ebrary.com/Doc?id=10896040</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118796245">http://dx.doi.org/10.1002/9781118796245</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118796306">http://proquest.tech.safaribooksonline.de/9781118796306</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of reliability engineering : applications in multistage interconnection networks ent://SD_ILS/0/SD_ILS:342010 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Gunawan, Indra.<br/>Yer Numaras&#305;&#160;ONLINE(342010.1)<br/>Elektronik Eri&#351;im&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079">http://public.eblib.com/choice/publicfullrecord.aspx?p=1641079</a> Ebook Library <a href="http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0">http://www.UTS.eblib.com.AU/EBLWeb/patron/?target=patron&extendedid=P_1641079_0</a> ebrary <a href="http://site.ebrary.com/id/10843879">http://site.ebrary.com/id/10843879</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fracture mechanics. 1, Analysis of reliability and quality control ent://SD_ILS/0/SD_ILS:305424 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Grous, Ammar, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118580004">http://dx.doi.org/10.1002/9781118580004</a> Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118580004">http://onlinelibrary.wiley.com/book/10.1002/9781118580004</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Importance measures in reliability, risk, and optimization principles and applications ent://SD_ILS/0/SD_ILS:299386 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Kuo, Way, 1951-&#160;Zhu, Xiaoyan.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118304174">Available by subscription from Safari Books Online</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119993445.jpg</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=912160</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118314593">http://dx.doi.org/10.1002/9781118314593</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10559415">http://site.ebrary.com/lib/alltitles/Doc?id=10559415</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design for reliability information and computer-based systems ent://SD_ILS/0/SD_ILS:249879 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bauer, Eric.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical system reliability ent://SD_ILS/0/SD_ILS:153146 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Bauer, Eric.&#160;Zhang, Xuemei.&#160;Kimber, Douglas A.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Curtis, Peter M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Assurance technologies principles and practices : a product, process, and system safety perspective ent://SD_ILS/0/SD_ILS:295628 2026-02-22T20:54:09Z 2026-02-22T20:54:09Z Yazar&#160;Raheja, Dev.&#160;Allocco, Michael.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=54979&ref=toc">http://www.myilibrary.com?id=54979&ref=toc</a> John Wiley <a href="http://dx.doi.org/10.1002/047000942X">http://dx.doi.org/10.1002/047000942X</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853">http://www3.interscience.wiley.com/cgi-bin/bookhome/112151853</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/62326785.html">http://catalog.hathitrust.org/api/volumes/oclc/62326785.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>