Arama Sonuçları X-ray diffraction imaging.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dX-ray$002bdiffraction$002bimaging.$0026ps$003d300?
2026-05-12T02:05:45Z
Properties of crystalline materials by X-ray diffraction methods and symmetry groups : a practical approach
ent://SD_ILS/0/SD_ILS:565688
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Mesa, John Fernando Zapata, 1971- author.<br/>Yer Numarası QD921<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003344438">https://www.taylorfrancis.com/books/9781003344438</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sodium-ion batteries : technologies and applications
ent://SD_ILS/0/SD_ILS:598711
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Ji, Xiaobo, editor. Hou, Hongshuai, editor. Zou, Guoqiang, editor.<br/>Yer Numarası TK2945 .S62 S63 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841684">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841684</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Clathrate hydrates : molecular science and characterization
ent://SD_ILS/0/SD_ILS:597421
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Ripmeester, John A. Alavi, Saman.<br/>Yer Numarası QD474<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527695058">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527695058</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transition metal oxides for electrochemical energy storage
ent://SD_ILS/0/SD_ILS:597510
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Nanda, Jagjit, editor. Augustyn, Veronica, editor.<br/>Yer Numarası TJ265<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527817252">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527817252</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
ent://SD_ILS/0/SD_ILS:560353
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Dong, ZhiLi, author.<br/>Yer Numarası QD131 .D66 2022<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429351662">https://www.taylorfrancis.com/books/9780429351662</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
An introduction to synchrotron radiation : techniques and applications
ent://SD_ILS/0/SD_ILS:594997
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Willmott, Phil (Phil R.), author.<br/>Yer Numarası QC793.5 .E627 W55 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119280453">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119280453</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Synchrotron radiation in materials science : light sources, techniques, and applications
ent://SD_ILS/0/SD_ILS:594310
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Fan, Chunhai, 1974- editor. Zhao, Zhentang, editor.<br/>Yer Numarası QC793.5 .E627<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697106">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697106</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Neutrons and synchrotron radiation in engineering materials science : from fundamentals to applications
ent://SD_ILS/0/SD_ILS:593277
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Staron, Peter, editor. Schreyer, Andreas, editor. Clemens, Helmut, editor. Mayer, Svea, editor.<br/>Yer Numarası QC787 .S9 N48 2017<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527684489">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527684489</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Residual Stress, Thermomechanics & Infrared Imaging, Hybrid Techniques and Inverse Problems, Volume 9 Proceedings of the 2016 Annual Conference on Experimental and Applied Mechanics 
ent://SD_ILS/0/SD_ILS:617388
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Quinn, Simon. editor. Balandraud, Xavier. editor. (orcid)0000-0002-1446-467X SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-42255-8">https://doi.org/10.1007/978-3-319-42255-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
In-situ Studies with Photons, Neutrons and Electrons Scattering II
ent://SD_ILS/0/SD_ILS:530801
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Kannengiesser, Thomas. editor. Babu, Sudarsanam Suresh. editor. Komizo, Yu-ichi. editor. Ramirez, Antonio J. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06145-0">https://doi.org/10.1007/978-3-319-06145-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Statistics of medical imaging
ent://SD_ILS/0/SD_ILS:542695
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Lei, Tianhu., author.<br/>Yer Numarası RC78.7 .D53 L45 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420088434">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hot deformation and processing of aluminum alloys
ent://SD_ILS/0/SD_ILS:546975
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar McQueen, H. J.<br/>Yer Numarası TS209.5 .H675 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420017687">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Biochemical applications of nonlinear optical spectroscopy
ent://SD_ILS/0/SD_ILS:541486
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Yakovlev, Vladislav.<br/>Yer Numarası QP519.9 .L37 B56 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420068603">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-ray metrology in semiconductor manufacturing
ent://SD_ILS/0/SD_ILS:543511
2026-05-12T02:05:45Z
2026-05-12T02:05:45Z
Yazar Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Yer Numarası TK7874.58 .B69 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>