Arama Sonuçları X-ray microanalysis - Daraltılmış: English
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Scanning electron microscopy and x-ray microanalysis
ent://SD_ILS/0/SD_ILS:96428
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Yazar Goldstein, Joseph, 1939- ort. yaz.<br/>Yer Numarası QH 212.S3 S29 2003<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~4<br/>
X-Ray microanalysis in the electron microscope
ent://SD_ILS/0/SD_ILS:54226
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Yazar Chandler, John A.<br/>Yer Numarası QH 212.E4 C4 1977 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>
X-ray m,icroscopy and X-ray microanalysis ; proc. ed. by A. Engström, V. Cosslett and H. Pattee.l
ent://SD_ILS/0/SD_ILS:67441
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Yazar International symposium on X-ray Microscopy and X-ray Microanalysis : (1960 : Stockholm) Engström, A. ed. Cosslett, V., ed. Pattee, H., ed.<br/>Yer Numarası QC 373.X2 I5 1960<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ent://SD_ILS/0/SD_ILS:167790
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Yazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Staining methods for sectined material X-ray microanalysis in the electron microscope
ent://SD_ILS/0/SD_ILS:54237
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Yazar Lewis, P. R. Knight, D. P. ort.yaz. Chandler, J. A. ort.yaz.<br/>Yer Numarası QH 212.E4 PRA 1977 C.5 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>
Mineralogical Analysis Applied to Forensics A Guidance on Mineralogical Techniques and Their Application to the Forensic Field
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Yazar Mercurio, Mariano. editor. Langella, Alessio. editor. Di Maggio, Rosa Maria. editor. Cappelletti, Piergiulio. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-08834-6">https://doi.org/10.1007/978-3-031-08834-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-ray fluorescence in biological sciences : principles, instrumentation and applications
ent://SD_ILS/0/SD_ILS:597496
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Yazar Singh, Vivek K., editor. Kawai, Jun, 1957- editor. Tripathi, Durgesh Kumar, editor.<br/>Yer Numarası QH324.9 .X2 X15 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645719">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119645719</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-Ray Fluorescence Spectroscopy for Laboratory Applications
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Yazar Flock, Jorg, author. Haller, Michael, author. Haschke, Michael, 1948- author.<br/>Yer Numarası QD96 .X2 F56 2020<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527816637">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527816637</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Archaeological soil and sediment micromorphology
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Yazar Nicosia, Cristiano, 1978- editor. Stoops, Georges, editor.<br/>Yer Numarası S593.2 .A725 2017<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118941065">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118941065</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-rays and materials
ent://SD_ILS/0/SD_ILS:305406
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Yazar Goudeau, Philippe. Guinebretière, René.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=425390">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118562888">http://dx.doi.org/10.1002/9781118562888</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Aberration-corrected analytical transmission electron microscopy
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Yazar Brydson, Rik, editor, author.<br/>Yer Numarası ONLINE(318971.1)<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=320457">Connect to MyiLibrary resource.</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-Rays in nanoscience spectroscopy, spectromicroscopy, and scattering techniques
ent://SD_ILS/0/SD_ILS:305084
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Yazar Guo, Jinghua.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527632282">http://dx.doi.org/10.1002/9783527632282</a>
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Industrial applications of electron microscopy
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Yazar Li, Zhigang R., 1958-<br/>Yer Numarası TA417.23 .I52 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135551834">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>