Arama Sonuçları diffraction. - Daraltılmış: 2006SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003ddiffraction.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092006$0025092006$0026ps$003d300?2024-09-20T17:45:36ZX-ray crystallography : an introduction to the investigation of crystals by their diffraction of monochromatic X-radiationent://SD_ILS/0/SD_ILS:328712024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar Buerger, Martin Julian, 1903-<br/>Yer Numarası QD 945 B8624 1942<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Powder Diffraction The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Dataent://SD_ILS/0/SD_ILS:1816162024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar Will, Georg. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-27986-5">http://dx.doi.org/10.1007/3-540-27986-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>X-ışını kırınımı yöntemi ile spiro,ansa,bino Ve spiro-ansa fosfazen ligandlarının kristal yapı analizleri = Crystal structure analysis of spiro,ansa,bino And spiro-ansa phosphazene ligands by X-Ray diffraction methodent://SD_ILS/0/SD_ILS:1052242024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar Çaylak, Nagihan.<br/>Yer Numarası TEZ/7816 .C385 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>X-Işını kırınımı yöntemiyle kripta-fosfazen türevlerinin kristal yapı analizi = Crystal structure analysis of crypta-phosphazane derivatives by X-Ray diffraction methodent://SD_ILS/0/SD_ILS:1048932024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar Tercan, Mustafa Barış.<br/>Yer Numarası TEZ/7635 .T315 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Acta crystallographica. Section A, foundations of crystallography.ent://SD_ILS/0/SD_ILS:2262312024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar International Union of Crystallography.<br/>Yer Numarası ALFABETİK V.23A 1967<br/>Elektronik Erişim <a href="http://onlinelibrary.wiley.com/journal/10.1111/(ISSN)1600-5724">Elektronik eri?im</a><br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~23 ~0<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432024-09-20T17:45:36Z2024-09-20T17:45:36ZYazar Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>