Arama Sonuçları diffusion. - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003ddiffusion.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300?
2024-11-02T16:20:55Z
Diffusion Processes in Advanced Technological Materials
ent://SD_ILS/0/SD_ILS:181421
2024-11-02T16:20:55Z
2024-11-02T16:20:55Z
Yazar Gupta, Devendra. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-27470-4">http://dx.doi.org/10.1007/978-3-540-27470-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
ent://SD_ILS/0/SD_ILS:175887
2024-11-02T16:20:55Z
2024-11-02T16:20:55Z
Yazar Seebauer, Edmund G. author. Kratzer, Meredith C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84882-059-3">http://dx.doi.org/10.1007/978-1-84882-059-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect
ent://SD_ILS/0/SD_ILS:401399
2024-11-02T16:20:55Z
2024-11-02T16:20:55Z
Yazar Cheng, Jie. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-6165-3">https://doi.org/10.1007/978-981-10-6165-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>