Arama Sonuçları faults. - Daraltılmış: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dfaults.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?
2025-12-13T05:16:59Z
Multi-run Memory Tests for Pattern Sensitive Faults
ent://SD_ILS/0/SD_ILS:487779
2025-12-13T05:16:59Z
2025-12-13T05:16:59Z
Yazar Mrozek, Ireneusz. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-91204-2">https://doi.org/10.1007/978-3-319-91204-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
2025-12-13T05:16:59Z
2025-12-13T05:16:59Z
Yazar Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Hybrid Fault Tolerance Techniques to Detect Transient Faults in Embedded Processors
ent://SD_ILS/0/SD_ILS:487990
2025-12-13T05:16:59Z
2025-12-13T05:16:59Z
Yazar Azambuja, José Rodrigo. author. Kastensmidt, Fernanda. author. Becker, Jürgen. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06340-9">https://doi.org/10.1007/978-3-319-06340-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Debug Automation from Pre-Silicon to Post-Silicon
ent://SD_ILS/0/SD_ILS:529988
2025-12-13T05:16:59Z
2025-12-13T05:16:59Z
Yazar Dehbashi, Mehdi. author. Fey, Görschwin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09309-3">https://doi.org/10.1007/978-3-319-09309-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>