Arama Sonuçları maximum. - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dmaximum.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300?
2026-01-23T05:03:22Z
Linear and nonlinear system modeling
ent://SD_ILS/0/SD_ILS:599408
2026-01-23T05:03:22Z
2026-01-23T05:03:22Z
Yazar Roy, Tamal, editor. Tripathi, Suman Lata, editor. Ganguli, Souvik, editor.<br/>Yer Numarası QA402.3 .L56 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119847533">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119847533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent Solutions for Smart Grids and Smart Cities Select Proceedings of IPECS 2022
ent://SD_ILS/0/SD_ILS:527449
2026-01-23T05:03:22Z
2026-01-23T05:03:22Z
Yazar Siano, Pierluigi. editor. Williamson, Sheldon. editor. Beevi, Sabeena. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0915-5">https://doi.org/10.1007/978-981-99-0915-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Introduction to fuzzy logic
ent://SD_ILS/0/SD_ILS:596643
2026-01-23T05:03:22Z
2026-01-23T05:03:22Z
Yazar Peckol, James K., author. John Wiley & Sons, publisher.<br/>Yer Numarası QA9.64 .P43 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772644">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119772644</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The ESD control program handbook
ent://SD_ILS/0/SD_ILS:595961
2026-01-23T05:03:22Z
2026-01-23T05:03:22Z
Yazar Smallwood, J. M. (Jeremy M.), author.<br/>Yer Numarası TK7870<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
ent://SD_ILS/0/SD_ILS:593728
2026-01-23T05:03:22Z
2026-01-23T05:03:22Z
Yazar Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Yer Numarası TA169.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>