Arama Sonuçları on-Chip. - Daraltılmış: 2001SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003don-Chip.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092001$0025092001$0026ps$003d300?dt=list2026-06-03T17:39:02ZAdhesion measurement of films and coatings. Volume 2ent://SD_ILS/0/SD_ILS:5475662026-06-03T17:39:02Z2026-06-03T17:39:02ZYazar Mittal, Kash L., 1945- editor. Taylor and Francis.<br/>Yer Numarası QC183<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466562233">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of silicon semiconductor metrologyent://SD_ILS/0/SD_ILS:5472442026-06-03T17:39:02Z2026-06-03T17:39:02ZYazar Diebold, A. C. (Alain C.)<br/>Yer Numarası TK7871.85 .H3337 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>