Arama Sonuçları test VLSI. - Daraltılmış: Computer engineering.
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https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dtest$002bVLSI.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-03-18T12:40:32Z
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605599
2026-03-18T12:40:32Z
2026-03-18T12:40:32Z
Yazar Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-5269-0">https://doi.org/10.1007/978-981-97-5269-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
ent://SD_ILS/0/SD_ILS:605770
2026-03-18T12:40:32Z
2026-03-18T12:40:32Z
Yazar Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-3756-7">https://doi.org/10.1007/978-981-97-3756-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618293
2026-03-18T12:40:32Z
2026-03-18T12:40:32Z
Yazar Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-46097-0">https://doi.org/10.1007/978-3-319-46097-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>